10/100 base-T Ethernet connectivity  Digital control loop technology  IVI compliant drivers  Web browser control  Controls up to 95 assets  Supports VXI II Discovery  Modular

Spin mode is a dynamic mode intended to provide a simulation of a spinning satellite.  Enhanced Eclipse mode is a dynamic mode that allows the user to easily program and initiate an eclipse event with total control over all of the V-I curve parameters and dwell times.  Operates with Sequential Shunt Regulators and Maximum Power Point Trackers  Multiple redundant OVP/OIP layers

See "Specifications & Details" tab for more information. 

See "Specifications & Details" tab for more information. 

Fluke 5075603,  FLK-II900 Sonic Industrial Imager Includes Hard Shell Carrying Case and Neck Strap

Best price per contact – typically over one million (1,000,000) touchdowns RF/Microwave signal is shielded and completely air isolated in the probe body Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C

Replace costly and inflexible test fixtures with easy-to-use probe tips Long lifetime – typically over 1,000,000 contacts GS/SG footprint up to 4 GHz and GSG up to 20 GHz High-power RF test: up to 30 Watts

High power – 66 W at 2.4 GHz and 43 W at 5 GHz Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz Excellent contact control and low contact resistance High performance on any pad material (Al or Au)

Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material DC to 110 GHz models available in single and dual line versions Low insertion and return loss with ultra-low-loss ( -L ) versions Excellent crosstalk characteristics

Functional temperature range of -263 to +150°C Stainless steel tip material for thermal decoupling Coaxial cable with TCE matched inner and outer conductors Consistent tip geometry even at cryogenic temperatures

Combination of DC and RF in a single probe module: One dual probe or a maximum of three RF; a maximum of 9 DC standard (other quantities upon request). Utilizes ACP tip design, GSG, GS or SG RF tips available from DC to 110 GHz Choice of BeCu or tungsten tips

Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system. Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.