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The APEX Turbine Data System (DS) is the next generation of data acquisition, control, setup, and online analysis. It reliably acquires time-synchronized data from a network of digitizers, regardless of sample rate or sensor type.
- 4-Channel, 204.8 Ksa/s per channel, 24-Bit DACs
- -115 dB spurious free dynamic range
- Integrated 2-Channel 64-bit tachometer
- Integrated 4-Channel DIO
- Tight synchronization with DSA analyzers
- Ideal for rotational measurement, and stimulus-response applications such as vibration test
- Output modes including Sine, Burst Sine, Chirp, Burst-random and continuous random
The EMX-4xxx product family contains high-performance breakout boxes (EMX-4008 and EMX-4016), smart high density dynamic signal analyzers (EMX-4250 and EMX-4251), smart PXIe 625 KSA/s 4-channel digizers (EMX-4350), and charge and IEPE PXIe 625 KSA/s 4-channel digitizers (EMX-4380).
- High Current - 300 mA Sink
- High Density - 64 Channels / Card
- Isolation - 1000 V
- Multiple Digital Logic Levels - LV TTL - TTL - 60 V Max, User Defined
- Flexible Configurations - Dedicated Input - Dedicated Output - Eight, 8-Bit Ports
- Flexible Software - Embedded Soft Front Panel - Common IVI Software Drivers
- 4 Independent Channels
- 1Ω Resistance Increments
- Precision Sensor Simulation Capability
- Low Thermal Offset
- Independent Sense Feedback
- Parallel and Series Operation
- Dynamic Soft Front Panel
- IVI-COM, IVI-C, LabVIEW™ Drivers
- Monitoring the Set Values Without Disconnecting Channels Connections
- 3-Year Warranty
- High-density, compact (1U) precision data acquisition instruments
- LXI™ LAN connectivity
- Fully integrated signal conditioning maximizes performance and accuracy
- Easily integrate thermocouples, voltages, RTDs, thermistors, frequency, strain and pressure on an per-channel basis
- Distributed, synchronized measurements over the wire
- Scalable architecture easily expands from tens to thousands of channels
- DC version available for test cells requiring closer proximity to test article
- End-to-end self-calibration ensures optimum runtime performance
- Web-based access for monitoring and control
- Exlab turnkey software for simplified setup, control and data display
- Up to 96 differential channels per full rack mainframe
- Constantly monitor input signals for fault conditions
- Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths
- Inputs can be masked, inverted, and combined to produce interrupts
- Can be used as a time stamp module and as a digital I/O
- Programmable debounce circuitry prevents erroneous readings
- 10 V and 100 V input ranges
- On-board memory stores events with IEEE 1588 timestamps
- Synchronize reading of input states with other scanned analog channels
- 8 frequency counter channels, 16 isolated digital I/O channels, 2 isolated DAC channels in a single card
- Single frequency measurement range that works from 0.05 Hz to 1 MHz
- Very stable TCXO base clock, 50 MHz ±1 ppm
- 195 kΩ Input impedance with selectable coupling (AC/DC)
- Wide differential input voltage range (±48 V) with up to 250 V working common mode voltage
- Programmable threshold and hysteresis levels with 1 mV resolution
- Support for quadrature encoder
- Isolated DIO channels with up to 60 V compliance
- Isolated and independent 16-bit DAC channels, configurable for voltage or current output