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Solve applications rather than develop underlying tools by leveraging a toolkit with a more than 25-year history of reliable performance Tackle applications with utmost confidence using field-proven tools for analyzing, classifying, locating, measuring, reading and verifying Base analysis on monochrome and color 2D images as well as 3D profiles, depth maps and point clouds Harness the full power of today's hardware through optimizations exploiting SIMD, multi-core CPU and multi-CPU technologies Support platforms ranging from smart cameras to HPCs via a single consistent and intuitive API
Only BSDL files required to get the board up and running  Set up pin states – e.g. low, high, toggling  Trace shorts, opens and other signals  Easy low-level access to device pins/busses  Clear display of the pins/balls with variable zoom levels and split screen  View JTAG chain data as waveforms  Quickly find and monitor changing pins  Program devices with SVF and STAPL files  Real-time interaction  XJIntegration (use XJAnalyser functionality from other software)
Improves your QA through configurable logging  Allows you to retain power of control on how boards are tested by third parties  User-friendly environment reduces your training costs for production operatives  Ability to test multiple boards, simultaneously, by using multiple XJLinks
Reduce your time spent debugging boards due to high precision fault isolation  Improve your time to market and reduce project risk by early design verification  Reduce your test development time by reusing tests from prototype/design in manufacturing and field support  Ongoing time savings by test reuse across projects
Repair-focused environment for XJDeveloper / XJRunner tests.  Full Connection test.  RAM, Flash and other non-JTAG device tests.  Flash, FPGA, CPLD and EEPROM programming.  Layout Viewer* to show the physical location of faulty nets, pins and components.  Schematic Viewer* to show the circuit design around faults.  Direct control of the pins/balls of JTAG devices.  View pin states graphically in real time or capture them in the Waveform Viewer.  Trace signals to identify shorts, opens and other faults.
Reduce flash programming times  SPI, QSPI, parallel NOR flash devices supported  Support for NAND flash devices available on request  Shortened development cycles  No need for additional equipment  Can be used for fast firmware upgrade  No FPGA development required
Solve machine vision applications efficiently by constructing flowcharts instead of writing program code, using field-proven tools for analyzing, classifying, locating, measuring, reading and verifying Use a single program for creating both application logic and operator interface Leverage deep learning for visual inspection through image classification and segmentation tools Rely on a common underlying vision library for the same results with an Iris GTX smart camera, vision systems or third-part computer Work with multiple cameras all within the same project or per project running concurrently and independently from one another, platform permitting
Complete laboratory database system based on ISO17025 Role-based access, MySQL system security and backup tools Self-hosted server, floating licensing for client apps Prints certificates based on MS Office, HTML and many other report templates
Automatic calibration of instruments In line with ISO17025 and other metrology standards Automated optical readout module for multimeters Unlimited custom instruments and procedures
Non-linear measurement data is often used to create a behavioral model for high frequency components. Formulations of these models have been defined in terms of traveling waves, with a desire to represent nonlinear behavior of high frequency transistors through a direct extension from linear s-parameters.
The Focus Compact Model (FCM) utility is a streamlined software package designed to be used with Focus’ AURIGA high-end Pulsed-IV system, that is used to generate Compact Models for transistors from their Pulsed-IV and wideband pulsed s-parameter data. 
Noise measurements allow the determination of the four Noise Parameters of a device (transistor).  There are four Noise Parameters which fully describe the noise behaviour of an active or passive device at a given frequency.