The PHD1200 and PHD2000, with advanced pulser-circuit technology, offer unmatched speed, accuracy, and resolution for precise dynamic on-resistance measurement of transistors. Paired with the AU-5 Pulsed IV/RF System, this compact solution delivers exceptional performance.

Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.

3 Measurement States; Quiescent (OFF-State), Non Quiescent (ON-State), and Pre-State The Pre State is a short high voltage state used to activate the traps in the semiconductor. Adjustable delay (Δt) between the Pre state and Non Quiescent state down to 0s. Independently adjustable timing settings for the Three-state gate pulser and drain pulser Easy Integration into existing mainframes

Empower your semiconductor device characterization with MPIV. Ideal for high power current and voltage measurements, it offers precise pulsing capabilities with adjustable parameters and customizable solutions for your specific needs.