Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.

High power capability: +/- 200V, 17A. Minimum pulse width: 200ns. Modular design which enables multiple configurations.

3 Measurement States; Quiescent (OFF-State), Non Quiescent (ON-State), and Pre-State The Pre State is a short high voltage state used to activate