Anritsu
Since its founding in 1895, Anritsu has been a pioneer in the telecommunications field, marking its 120 years of growth with achievements that include creating the world’ s first practical wireless telephone, which paved the way for today’s smartphones. We would like to express our sincere gratitude to our customers and everyone else who has made this possible.
With its measurement business as the pillar supporting the further advancement of its mobile broadband services, Anritsu offers solutions that are indispensable for building a safer and more secure society in a broad range of fields including quality assurance inspection equipment for foods and pharmaceutical products, remote monitoring and control systems, traffic shapers, and high-speed electronic devices.
Contact Details
US Headquarters Anritsu Corporation
490 Jarvis Drive, Morgan Hill, CA 95037-2809
Phone (Toll-free/All locations): 1-800-Anritsu (1-800-267-4878) for Sales, Technical and Service
Test & Measurement
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Products
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Integrated solution for Electromagnetic Field Strength measurements for health and safety
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Wide dynamic range
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Fast switching time
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Automatic download of antenna factors
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Various demodulation options available
Integrating NEON’s capability to automatically collect geo-referenced test data with Anritsu handheld spectrum analyzer products saves valuable time and money by
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Eliminating the need to manually perform "check-ins" at each test point by automatically calculating indoor location
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Providing vastly more data than is possible with manual processes by recording data with every step
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Removing typical data recording errors caused by "guesstimating" locations in large buildings through automatic indoor location and path estimation
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Delivering actionable data in areas not easily analyzed such as stairways and elevators by recording and referencing measurements in 3D
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Enabling quick analysis of signal coverage and faster problem resolution by delivering the industry’s only geo-referenced 3D visualization
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Providing color-graded measurement results in 2D and 3D views. Measurement values can be seen by clicking on each point. A .csv file of all measurements is also provided
The VectorStar ME7838 Series broadband VNA offers the widest available single frequency sweep from 70 kHz to 110, 125, and 145 GHz with mmWave bands to 1.1 THz.
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The ME7838A or E version can easily be upgraded to 145 GHz
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All versions may be configured to include banded millimeter-wave modules up to 1.1 THz
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Industry-best calibration and measurement stability: 0.1 dB vs 0.6 dB over 24 hrs.
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All versions support the 3744x-Rx receiver for noise figure measurements, including the ability to characterize differential noise figure, to 125 GHz
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Compact, lightweight mmWave modules (0.6 lb vs 7+ lbs and 1/50 the volume) offer low cost installation on smaller probe stations.
The VectorStar ME7838E4, ME7838A4, and ME7838D4 Series broadband VNA offers the widest available 4-port single sweep measurements from 70 kHz to 110, 125, 145, and 150 GHz with mmWave bands up to 1.1 THz
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The ME7838E4 4-port system sweeps from 70 kHz to 110 GHz
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The ME7838A4 4-port system sweeps from 70 kHz to 110/125 GHz
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The ME7838D4 4-port system sweeps from 70 kHz to 145/150 GHz
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All systems may be configured to include banded millimeter-wave modules up to 1.1 THz
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Industry-best calibration and measurement stability: 0.1 dB vs 0.6 dB over 24 hrs
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All systems also supports the 3744x-Rx receiver for noise figure measurements to 125 GHz
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Compact, lightweight mmWave modules offer low cost installation with industry-best performance
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Fast and accurate opto-electronic measurements — The VectorStar ME7848A 200 series ONA enables error-corrected transfer function, group delay, and return loss measurements of E/O and O/E components and subsystems.
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MN4765B O/E calibration module — The O/E calibration module is a thermally stabilized photodiode reference standard detector that can eliminate drift over temperature. Accurate bias voltage to the photodiode is maintained internally.
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MN4775A E/O converter — The E/O converter includes a lithium niobate (LiNbO3) modulator stabilized by a fully automatic bias controller and a tunable or fixed wavelength laser source. Excellent converter stability ensures characteristics remain consistent during measurement of opto-electronic DUT detectors and receivers.
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National Institute of Standards and Technology (NIST) derived characterization — Magnitude and phase characterization of the O/E calibration module is obtained using a primary standard characterized by NIST and held in the Anritsu Calibration Lab.
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Internal VNA de-embedding for simplified calibration — The built-in application menus provide instructions that guide the user through the set-up and calibrations required for making E/O, O/O, and O/E measurements.
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Excellent stability and repeatability — Use of full 12-term calibration with de-embedding results in stable and repeatable measurements of opto-electronic devices using the VectorStar VNA.
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Modularity and upgradeability — The VectorStar ME7848A ONA can be easily modified to a different wavelength by adding the appropriate MN4775A E/O converter and MN4765B O/E calibration detector. The VectorStar ME7838A 100 series can be upgraded to a 200 series by including the appropriate MN4775A E/O converter.
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2-port VNA with frequency options from 1 MHz to 8 GHz / 20 GHz / 43.5 GHz
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Extend remote ports 100+ meters apart with PhaseLync synchronization
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Small and lightweight ports enable direct connection to DUT eliminating long cable runs
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Guaranteed performance to 43.5 GHz with Extended-K™ ports
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PC control takes advantage of external computer processing power and functionality
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No on-board data storage makes use in secure applications more convenient
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Common ShockLine control software delivers powerful debug and test capabilities
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Highly expandable, plug-in, modular design bit error rate tester (BERT)
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Bit Error Rate test from 0.1 Gbit/s to 32.1 Gbit/s; 64.2 Gbit/s with external MUX/DeMUX
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Supports signal integrity analysis for a variety of 100G+ applications
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High speed backplane and interconnect
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High speed chip/device
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Active optical cable
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Optical transceiver modules
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High-quality (12 ps rise/fall time) and low-jitter (8 ps p-p) PPG waveform, up to 3.5 Vp-p
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Jitter tolerance test up to 32.1 Gbit/s
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SJ up to 2000 UI. High modulation frequency SJ up to 1 UI at 250 MHz
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Support generation of dual tone SJ, RJ, BUJ, and SSC
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Half Period Jitter (Even/Odd Jitter)
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Ultra high sensitivity Error Detector (10 mV typical) with embedded clock recovery
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32.1 Gbit/s 4Tap Emphasis with external MP1825B
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Crosstalk test and skew tolerance test using synchronized multi-channel PPG
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Passive Linear Equalizers for improved EYE opening
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Comprehensive signal analysis including Burst measurement for PON and EDFA loop circuit testing, Bathtub Measurement (TJ, DJ, RJ), Eye Diagram and Eye Margin Measurement
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32.1 Gbaud 4PAM/8PAM generators and accurate 4PAM BER measurement
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1 Tbit/s Next Gen. High-Speed Transmission Testing (32G x 32ch)
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32.1Gbps 4-tap emphasis
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Jitter transparent for the jitter tolerance test
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Compact remote head to minimize cable loss and ISI
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Can be used as a front head with any Pulse Pattern Generator
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Compensate or inject ISI and DDPWS