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FormFactor - Cascade Autonomous DC wafer probing featuring Contact Intelligence

FormFactor - Cascade Autonomous DC wafer probing featuring Contact Intelligence

Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system...
FormFactor - Cascade Autonomous RF wafer probing featuring Contact Intelligence

FormFactor - Cascade Autonomous RF wafer probing featuring Contact Intelligence

Ease of use –  Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full...
FormFactor - Cascade Autonomous Silicon Photonics wafer probing featuring Contact Intelligence

FormFactor - Cascade Autonomous Silicon Photonics wafer probing featuring Contact Intelligence

Revolutionary technology advancement for wafer and die-level photonics probing Highest accuracy in test results New innovative combination of...
FormFactor - Cascade Chucks - Non-thermal and thermal chucks

FormFactor - Cascade Chucks - Non-thermal and thermal chucks

Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided Temperatures range from -60°C to +300°C Up to 25% lower air...
FormFactor - Cascade CM300xi - 300 mm semi-/ fully-automated probe system

FormFactor - Cascade CM300xi - 300 mm semi-/ fully-automated probe system

DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug Full thermal range of -60°C to +300°C Reliable and...
FormFactor - Cascade CM300xi-SiPh - 300 mm semi-/ fully-automated probe system with Autonomous Silicon Photonics Measurement Assistant

FormFactor - Cascade CM300xi-SiPh - 300 mm semi-/ fully-automated probe system with Autonomous Silicon Photonics Measurement Assistant

Revolutionary technology advancement for wafer and die-level photonics probing Real-time in-situ calibrations Highest accuracy in test results...
FormFactor - Cascade CM300xi-ULN - 300 mm semi-/ fully-automated probe system for Ultra Low Noise measurements

FormFactor - Cascade CM300xi-ULN - 300 mm semi-/ fully-automated probe system for Ultra Low Noise measurements

Provides an effectively noise free environment around the device under test (DUT) World’s first probe station with integrated TestCell Power Management (a...
FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications

FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications

Customized Solutions for a Variety of Challenging Applications We are your partner for challenging applications. Our comprehensive technical and application know-how over all...
FormFactor - Cascade EPS150TESLA - 150 mm manual on-wafer power device characterization system

FormFactor - Cascade EPS150TESLA - 150 mm manual on-wafer power device characterization system

Multi-purpose SIGMA instrument integration kit Shorter cabling and universal chuck connection Triax probe with protected guard...
FormFactor - Cascade EPS200MMW - mmW probing up to THz and load-pull

FormFactor - Cascade EPS200MMW - mmW probing up to THz and load-pull

Combined eye-pieces and CCD camera mount 3x zoom and quick lens exchange Engraved guides on mmW platen Supports broadband, load...
FormFactor - Cascade EPS200RF - 200 mm manual probe system for RF test up to 67 GHz

FormFactor - Cascade EPS200RF - 200 mm manual probe system for RF test up to 67 GHz

Infinity Probe: best for Al (Si) ACP Probe: best for AU (III-Vs) |Z| Probe: robust solution (long lifetime) RF chuck ±3...
FormFactor - Cascade eVue Microscope - Digital imaging system

FormFactor - Cascade eVue Microscope - Digital imaging system

Quick and easy probe tip navigation Z drive can work in the same range as the chuck Enables higher separation gap while the DUT stays in focus...
FormFactor - Cascade Genius Education Kits - Turn-key S-parameter probe station for RF and microwave test

FormFactor - Cascade Genius Education Kits - Turn-key S-parameter probe station for RF and microwave test

Probe station Keysight Streamline Vector Network Analyzer (option up to 53 GHz) Choice of probes Known measurement accuracy...
FormFactor - Cascade IMS-K-DC - Integrated system with Keysight SPA for DC parametric measurements

FormFactor - Cascade IMS-K-DC - Integrated system with Keysight SPA for DC parametric measurements

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements  
FormFactor - Cascade IMS-K-LFN - Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements

FormFactor - Cascade IMS-K-LFN - Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements  
FormFactor - Cascade IMS-K-mmW/THz - Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz

FormFactor - Cascade IMS-K-mmW/THz - Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz  
FormFactor - Cascade IMS-K-Power - Integrated system with Keysight PDA for power semiconductor device characterization

FormFactor - Cascade IMS-K-Power - Integrated system with Keysight PDA for power semiconductor device characterization

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements  
FormFactor - Cascade IMS-K-SiPh - Integrated system with Keysight Photonics Application Suite hardware and software

FormFactor - Cascade IMS-K-SiPh - Integrated system with Keysight Photonics Application Suite hardware and software

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight Photonics Application    
FormFactor - Cascade MPS150 Modular Probe Station

FormFactor - Cascade MPS150 Modular Probe Station

Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL Re-configurable and upgradable...
FormFactor - Cascade PA200 BlueRay - 200 mm semi-/ fully-automated production probe system

FormFactor - Cascade PA200 BlueRay - 200 mm semi-/ fully-automated production probe system

Die-to-die stepping time of under 100 ms Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology Even extreme variations in height...
FormFactor - Cascade PAC200 - 200 mm semi-automated cryogenic probe system

FormFactor - Cascade PAC200 - 200 mm semi-automated cryogenic probe system

Different substrate carriers for wafers up to 200 mm or single dies Probe cards and/or up to eight positioners Ice- and...
FormFactor - Cascade PAP200 - 200 mm semi-automated vacuum and pressure probe system

FormFactor - Cascade PAP200 - 200 mm semi-automated vacuum and pressure probe system

Different substrate carriers for wafers up to 200 mm or single dies Probe cards and/or up to eight positioners Probe positioners placed inside...
FormFactor - Cascade PAV200 - 200 mm semi-automated vacuum probe system

FormFactor - Cascade PAV200 - 200 mm semi-automated vacuum probe system

Different substrate carriers for wafers up to 200 mm or single dies Probe cards and/or up to eight positioners Probe positioners placed inside...
FormFactor - Cascade PLC50 - 100 mm manual cryogenic probe system

FormFactor - Cascade PLC50 - 100 mm manual cryogenic probe system

Different substrate carriers for wafers up to 100 mm or single dies Up to six positioners Independently cooled cold shield...
FormFactor - Cascade PLV50 - 150 mm manual vacuum probe system

FormFactor - Cascade PLV50 - 150 mm manual vacuum probe system

Different substrate carriers for wafers up to 150 mm or single dies Up to six positioners Probe positioners placed inside vacuum chamber...
FormFactor - Cascade PM300 - 300 mm manual probe system

FormFactor - Cascade PM300 - 300 mm manual probe system

Highly stable granite base Independent, coarse movement of X and Y axes, combined with easy fine adjustments Re-configurable for DC, RF, mmW, FA...
FormFactor - Cascade PM8 - 200 mm manual open probe system

FormFactor - Cascade PM8 - 200 mm manual open probe system

Highly stable granite base Independent, coarse movement of X and Y axes, combined with easy fine adjustments down to submicron ranges Re-...
FormFactor - Cascade PMC200 - 200 mm manual cryogenic probe system

FormFactor - Cascade PMC200 - 200 mm manual cryogenic probe system

Different substrate carriers for wafers up to 200 mm or single dies Probe cards and/or up to eight positioners Independently cooled cold shield...
FormFactor - Cascade PMV200 - 200 mm manual vacuum probe system

FormFactor - Cascade PMV200 - 200 mm manual vacuum probe system

Different substrate carriers for wafers up to 200 mm or single dies Probe cards and/or up to eight positioners Probe positioners placed inside...
FormFactor - Cascade Positioners - DC, RF and optical probe positioning for highest accuracy measurements

FormFactor - Cascade Positioners - DC, RF and optical probe positioning for highest accuracy measurements

DC, RF and Optical Probe Positioning for Highest Accuracy Measurements FormFactor offers a wide variety of manual and motorized probe positioners for any application from DC to terahertz...

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