Product Finder
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 FormFactor - Cascade Autonomous DC wafer probing featuring Contact Intelligence
Ease of use – Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system... |
 FormFactor - Cascade Autonomous RF wafer probing featuring Contact Intelligence
Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full... |
 FormFactor - Cascade Autonomous Silicon Photonics wafer probing featuring Contact Intelligence
Revolutionary technology advancement for wafer and die-level photonics probing
Highest accuracy in test results
New innovative combination of... |
 FormFactor - Cascade Chucks - Non-thermal and thermal chucks
Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided
Temperatures range from -60°C to +300°C
Up to 25% lower air... |
 FormFactor - Cascade CM300xi - 300 mm semi-/ fully-automated probe system
DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
Full thermal range of -60°C to +300°C
Reliable and... |
 FormFactor - Cascade CM300xi-SiPh - 300 mm semi-/ fully-automated probe system with Autonomous Silicon Photonics Measurement Assistant
Revolutionary technology advancement for wafer and die-level photonics probing
Real-time in-situ calibrations
Highest accuracy in test results... |
 FormFactor - Cascade CM300xi-ULN - 300 mm semi-/ fully-automated probe system for Ultra Low Noise measurements
Provides an effectively noise free environment around the device under test (DUT)
World’s first probe station with integrated TestCell Power Management (a... |
 FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all... |
 FormFactor - Cascade EPS150TESLA - 150 mm manual on-wafer power device characterization system
Multi-purpose SIGMA instrument integration kit
Shorter cabling and universal chuck connection
Triax probe with protected guard... |
 FormFactor - Cascade EPS200MMW - mmW probing up to THz and load-pull
Combined eye-pieces and CCD camera mount
3x zoom and quick lens exchange
Engraved guides on mmW platen
Supports broadband, load... |
 FormFactor - Cascade EPS200RF - 200 mm manual probe system for RF test up to 67 GHz
Infinity Probe: best for Al (Si)
ACP Probe: best for AU (III-Vs)
|Z| Probe: robust solution (long lifetime)
RF chuck ±3... |
 FormFactor - Cascade eVue Microscope - Digital imaging system
Quick and easy probe tip navigation
Z drive can work in the same range as the chuck
Enables higher separation gap while the DUT stays in focus... |
 FormFactor - Cascade Genius Education Kits - Turn-key S-parameter probe station for RF and microwave test
Probe station
Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
Choice of probes
Known measurement accuracy... |
 FormFactor - Cascade IMS-K-DC - Integrated system with Keysight SPA for DC parametric measurements
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
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 FormFactor - Cascade IMS-K-LFN - Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements
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 FormFactor - Cascade IMS-K-mmW/THz - Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz
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 FormFactor - Cascade IMS-K-Power - Integrated system with Keysight PDA for power semiconductor device characterization
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements
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 FormFactor - Cascade IMS-K-SiPh - Integrated system with Keysight Photonics Application Suite hardware and software
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight Photonics Application
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 FormFactor - Cascade MPS150 Modular Probe Station
Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL
Re-configurable and upgradable... |
 FormFactor - Cascade PA200 BlueRay - 200 mm semi-/ fully-automated production probe system
Die-to-die stepping time of under 100 ms
Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology
Even extreme variations in height... |
 FormFactor - Cascade PAC200 - 200 mm semi-automated cryogenic probe system
Different substrate carriers for wafers up to 200 mm or single dies
Probe cards and/or up to eight positioners
Ice- and... |
 FormFactor - Cascade PAP200 - 200 mm semi-automated vacuum and pressure probe system
Different substrate carriers for wafers up to 200 mm or single dies
Probe cards and/or up to eight positioners
Probe positioners placed inside... |
 FormFactor - Cascade PAV200 - 200 mm semi-automated vacuum probe system
Different substrate carriers for wafers up to 200 mm or single dies
Probe cards and/or up to eight positioners
Probe positioners placed inside... |
 FormFactor - Cascade PLC50 - 100 mm manual cryogenic probe system
Different substrate carriers for wafers up to 100 mm or single dies
Up to six positioners
Independently cooled cold shield... |
 FormFactor - Cascade PLV50 - 150 mm manual vacuum probe system
Different substrate carriers for wafers up to 150 mm or single dies
Up to six positioners
Probe positioners placed inside vacuum chamber... |
 FormFactor - Cascade PM300 - 300 mm manual probe system
Highly stable granite base
Independent, coarse movement of X and Y axes, combined with easy fine adjustments
Re-configurable for DC, RF, mmW, FA... |
 FormFactor - Cascade PM8 - 200 mm manual open probe system
Highly stable granite base
Independent, coarse movement of X and Y axes, combined with easy fine adjustments down to submicron ranges
Re-... |
 FormFactor - Cascade PMC200 - 200 mm manual cryogenic probe system
Different substrate carriers for wafers up to 200 mm or single dies
Probe cards and/or up to eight positioners
Independently cooled cold shield... |
 FormFactor - Cascade PMV200 - 200 mm manual vacuum probe system
Different substrate carriers for wafers up to 200 mm or single dies
Probe cards and/or up to eight positioners
Probe positioners placed inside... |
 FormFactor - Cascade Positioners - DC, RF and optical probe positioning for highest accuracy measurements
DC, RF and Optical Probe Positioning for Highest Accuracy Measurements
FormFactor offers a wide variety of manual and motorized probe positioners for any application from DC to terahertz... |
