FormFactor - Cascade EPS150TESLA - 150 mm manual on-wafer power device characterization system
More Product Information
-
Low insertion loss
-
Low contact resistance
-
Lithographically defined probe tip
-
Nickel contacts
See more Key Features on Specifications & Details tab
-
Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
-
Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
-
Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
-
Durable probe structure ensures more than 250,000 contacts
-
Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications
-
Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
-
Online design configuration tool helps you to specify your probe in minutes
-
All designs are fully quadrant compatible
-
Full solution includes probes, calibration substrates, stations, accessories and software
-
Scalable architecture for future needs
-
DC-40 GHz bandwidth
-
10 ps rise time
-
Low insertion and return loss
-
2 mils of tip-to-tip compliance
-
High probing angle and clearance
-
Functional temperature range of -263 to +150°C
-
Stainless steel tip material for thermal decoupling
-
Coaxial cable with TCE matched inner and outer conductors
-
Consistent tip geometry even at cryogenic temperatures
-
Re-configurable for DC, RF, mmW, FA, WLR and more
-
Thermal range: -60˚C to 300˚C available
-
Upgrade path to meet your future needs
-
Stable and repeatable measurements over a wide thermal range
-
Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
-
Advanced EMI-shielding with PureLine with AttoGuard technologies
-
Best solution for low-noise and 1/f measurements
-
Minimize AC and spectral noise
-
Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range
-
Locking roll-out stage
-
Innovative microscope remote control
-
Intuitive ergonomic stage controls
-
Quick, safe, and comfortable wafer access
-
Easy on-wafer navigation
-
Fast setup and test data gathering
-
Dedicated Velox version for manual probe stations
-
AugmentedAlign tool with on screen markers for improved RF measurement accuracy
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
For more information please contact your local sales representative.
-
On-wafer power device characterization up to 10,000 V DC / 600 A
-
Safe and convenient integration kits to support T.I.P.S. “LuPo” High Voltage / High Power Probe Cards
-
Prevent thin wafers from curling and breaking
-
Safety interlock system with clear enclosure for operator safety during device measurements
-
Convenient connection kits for easy and safe system integration with power device analyzers from Keysight Technologies and major suppliers
-
Up to 25% lower air consumption (CDA) than other systems in the market (300l/min) with no compromise in transition times
-
Windows 10 compatibility enables highest performance and safe operation with state-of-the-art hardware
See more Key Features on Specifications & Details tab
-
Multi-purpose SIGMA instrument integration kit
-
Shorter cabling and universal chuck connection
-
Triax probe with protected guard
-
Triax design for low-leakage measurements up to 3 kV
-
Special chuck surface coating
-
High-isolation ready
-
Arcing protection
-
Shield Enclosure with interlock
-
Advanced grounding concept
See more Key Features on Specifications & Details tab
slide 1 of 1
