FormFactor - Cascade High Voltage Probe - Accurate and precise measurement of device parameters up to 10,000 V
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Coaxial and triaxial measurements up to 10,000 V
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High-quality construction with low-noise electrical performance
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Replaceable probe tips in a variety of tip sizes
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Temperature range of -60°C to 300°C
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Triaxial measurement ensures a much better understanding of device leakage in the off state
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Highly reliable, stable and repeatable measurements
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Integrally designed as part of a complete measurement solution
To ensure precision measurements of today’s high-voltage devices, FormFactor’s High-Voltage Probes (HVP) provide increased isolation resistance and dielectric strength by incorporating advanced internal isolation materials, as well as custom cabling and connectors.
When used with a , the HVP assures low-noise electrical performance and full triaxial capability at high voltage without any breakdowns.
More Product Information
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Smear reduction
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24 dB)
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Auto exposure (636 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation, color correction
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Reverse X
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count)
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Storable user sets
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Infinity Probe: best for Al (Si)
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ACP Probe: best for AU (III-Vs)
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|Z| Probe: robust solution (long lifetime)
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RF chuck ±3 μm surface planarity
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Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
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Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
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Automated calibration monitoring
See more Key Features on Specifications & Details tab
- With an intensity of over 150 klx at 300 mm WD in continuous operation, the SL316 UltraSeal Spot Light delivers industry-leading intensity with consistent uniformity.
- Available with narrow, medium, and wide lensing options as well as a non-lensed configuration for high dispersion.
- Configurable in eleven wavelength options.
- Compatible with all Ai inline and discreet control systems. The SL316 can be operated in continuous, gated continuous, pulsed, and adaptive pulsed modes with dimming options for brightness control.
- The Linear Coaxial Light provides a type of diffuse illumination; diffuse light from an internal source is folded downwards along the camera’s imaging axis and onto the imaging plane.
- High speed machine vision line scan applications receive greater image contrast with a Linear Coaxial Light.
- The DL110 includes a high efficiency, coated, easy to clean dust cover to protect the beamsplitter.
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Revolutionary technology advancement for wafer and die-level photonics probing
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Real-time in-situ calibrations
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Highest accuracy in test results
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Lowest coupling loss
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New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
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Minimized coupling losses with minimal trench dimensions
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Industry standard for vertical coupling to wafer-level grating couplers
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Dark, shielded and frost-free
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-40°C to +125°C
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Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
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Exclusive FormFactor-developed automated test methodology
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FormFactor-developed graphical user interface to manually control the optical positioning system
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Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab
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10 kΩ - 100.0 GΩ, short function
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Hot-switching up to 6 kVdc limit
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Test voltage and current indication
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Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
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Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
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Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
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Durable probe structure ensures more than 250,000 contacts
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Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications
- High power density DC power supply in a 1U chassis (up to 5 kW) or a 2U chassis (up to 10 kW)
- Intuitive touch panel control
- Available in either Fixed or Autoranging output
- Multi-language display for global operation
- Auto paralleling for higher power
- Full remote control via Virtual Panels™
DC, RF and Optical Probe Positioning for Highest Accuracy Measurements
FormFactor offers a wide variety of manual and motorized probe positioners for any application from DC to terahertz measurements and beyond.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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