FormFactor - Cascade High Voltage Probe - Accurate and precise measurement of device parameters up to 10,000 V
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Coaxial and triaxial measurements up to 10,000 V
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High-quality construction with low-noise electrical performance
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Replaceable probe tips in a variety of tip sizes
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Temperature range of -60°C to 300°C
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Triaxial measurement ensures a much better understanding of device leakage in the off state
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Highly reliable, stable and repeatable measurements
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Integrally designed as part of a complete measurement solution
To ensure precision measurements of today’s high-voltage devices, FormFactor’s High-Voltage Probes (HVP) provide increased isolation resistance and dielectric strength by incorporating advanced internal isolation materials, as well as custom cabling and connectors.
When used with a , the HVP assures low-noise electrical performance and full triaxial capability at high voltage without any breakdowns.
More Product Information
- Low noise
- Excellent line⁄load regulation
- Coarse and fine voltage controls
- Constant voltage or constant current operation with automatic crossover and mode indication
- Individual ON⁄Off switch per output (not including fixed output)
- Switchable 3.3V⁄5V output on triple output model
- Switchable remote sense (XPH 1810 and XPH 4210 models)
10 ppm AC/DC multifunction calibrator for multimeters , power meters and generally all kinds of electric meters. Implementing modular design, 9010+ can be further customized to calibrate oscilloscopes, insulation testers, sources and transducers.
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10 ppm accuracy
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400 MHz and 1.1 GHz scope options
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Power quality functions, voltage from current
Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
- Global shutter and rolling shutter CMOS sensors available
- USB3 Vision
- High sensitivity with both front and back illuminated sensors (BSI)
- Side mounted USB connectors for ease of use in OEM solutions
- High sensitivity with pixel sizes from 2 µm to 3.45 µm
- Windows operating system and Linux SDKs (for embedded vision systems)
- 3-Year Warranty
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Highly stable granite base
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Independent, coarse movement of X and Y axes, combined with easy fine adjustments
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Re-configurable for DC, RF, mmW, FA, WLR and more
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Full thermal range of -60°C to +300°C
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Low-profile, straightforward design
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Spacious top chambers for up to 12 positioners
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Reduces electrical noise by providing a fully electromagnetically shielded, ultra-low-noise, light-tight environment
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Enables accurate low-noise measurements of atto amperes, femtofarads and microvolts at temperatures down to -60°C
See more Key Features on Specifications & Details tab
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Different substrate carriers for wafers up to 150 mm or single dies
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Up to six positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Ergonomic and straightforward design
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Intuitive, manual operation
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for probe platen
See more Key Features on Specifications & Details tab
- Highest resolution – 12 bits all the time
- More capability – integrates multiple instruments into one
- Comprehensive probe support – supports over 30 probes in 9 categories
- MAUI with OneTouch user interface for intuitive and efficient operation
- DigRF v4 Decodes
- Low-speed (26 Mb/s)
- Medium-speed (1248 Mb/s)
- High-speed (1456 Mb/s)
- DigRF v3 Decodes
- Low-speed (6.5 Mb/s)
- Medium-speed (26 Mb/s)
- High-speed (312 Mb/s)
- Convert DigRF 3G and v4 I and Q digital data to corresponding analog waveforms
- Correlate analog waveforms with protocol decode on one screen
- View decoded data in hexadecimal format
- Decode information expands as the time base is adjusted or zoomed
- Convenient table display with quick “Zoom to byte” capability
- Quick search capability for specific message packets
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High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
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RF bandwidth to 500 MHz
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Long probe life: > 250,000 contacts
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Beryllium-copper tips for gold pads or tungsten for aluminum pads
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Oscillation-free testing of wide-bandwidth analog circuits
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Use with ACP series probes to provide functional at-speed testing for known-good-die
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Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
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Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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