FormFactor - Cascade High Voltage Probe - Accurate and precise measurement of device parameters up to 10,000 V
- Coaxial and triaxial measurements up to 10,000 V
- High-quality construction with low-noise electrical performance
- Replaceable probe tips in a variety of tip sizes
- Temperature range of of -60°C to 300°C
- Triaxial measurement ensures a much better understanding of device leakage in the off state
- Highly reliable, stable and repeatable measurements
- Integrally designed as part of a complete measurement solution
To ensure precision measurements of today’s high-voltage devices, FormFactor’s High-Voltage Probes (HVP) provide increased isolation resistance and dielectric strength by incorporating advanced internal isolation materials, as well as custom cabling and connectors.
When used with a , the HVP assures low-noise electrical performance and full triaxial capability at high voltage without any breakdowns.
More Product Information
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Functional temperature range of -263 to +150°C
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Stainless steel tip material for thermal decoupling
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Coaxial cable with TCE matched inner and outer conductors
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Consistent tip geometry even at cryogenic temperatures
- The fourth generation of Ai’s popular Inline Control System.
- High Output Power: Capable of delivering 2.1 amps of continuous output and up to 8 amps in overdrive strobe at 24V, outperforming all other inline controllers on the market.
- Compact & Rugged: Sleek enough to fit through wiring conduit with its compact anodized aluminum housing and sealed to IP68 standards for prolonged liquid immersion and complete dust protection.
- Plug-and-Play Functionality: Enabled with SignaTech™, allowing for simplicity when overdriving, without risk of damage to the lighthead. For more information, please refer to the Product Manual
All-in-One BERT and Sampling Oscilloscope
- Customized built-in 4ch sampling oscilloscope and 4ch BERT
- Fast measurement and high performance shorten test times, improve yields, and cut capital infrastructure costs
- Sampling Oscilloscope
- Fast: 250 ksamples/s to measure 1 Msamples in about 5 s
- High Sensitivity: –15 dBm (typ., SMF)
- Wide bandwidth: 35 GHz (optical, SMF), 25 GHz (optical, MMF), 40 GHz (electrical)
- Low Jitter: 200 fs rms (typ.)
- Both NRZ and PAM4 signal analysis, Supports 53-Gbaud analysis with PAM4
- Built-in 26/53 Gbaud Clock Recovery Unit (CRU) for both NRZ and PAM4
- NRZ Jitter component analysis
- BERT
- Low-Jitter PPG: 600 fs rms (typ.)
- High-sensitivity ED: 25 mV (typ.)
- Sampling Oscilloscope
- Built-in PC for stable fast performance
- DC-40 GHz bandwidth
- 10 ps rise time
- Low insertion and return loss
- 2 mils of tip-to-tip compliance
- High probing angle and clearance
PureLine 3 Technology
- Provides an effectively noise free environment around the device under test (DUT)
- First automated probe station to achieve -190dB spectral noise*
- Up to 32x lower noise (1kHz), for improved device characterization and modelling at the 7/5/2 nm technology nodes targeted for 5G and beyond applications
- Eliminates over 97% of the environmental noise experienced in previous probe systems
- Extensive collection of FormFactor patents, electrical design knowledge, and measurement system IP
Plug In and Go
- World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
- Eliminates all ground-loop induced TestCell noise
- Low field emissions
- Provides fully managed and filtered AC power to the entire system, prober and instruments
See "Specifications & Details" tab for more key features
- Extremely high resolution down to 3.5µm pixel size
- Image circle: 62.5 mm - 82 mm
- Optimized for specific magnifications
- 11 magnifications available: 0.07x - 2.0x
- Version with Beamsplitter available
- Best azimuth marking
- V70-Mount for easy installation
- Leverage dual-camera single-laser design to deliver exceptionally high 3D reproduction fidelity
- Scan scenes quickly with profiling rates of up to 11,000 per second
- Gain from unique embedded algorithms to generate consistent profiles, depth maps, or point clouds
- Benefit from truly standard GigE Vision® interface to work directly with Zebra Imaging and third-party vision software
- Simplify cabling with Power-over-Ethernet (PoE) support
- Deploy confidently in tough industrial settings thanks to a solid IP67-rated2 aluminum housing and M12 connectors
- Benefit from several fastening points to facilitate fixing one or more sensors to gantries and robots
- Streamline sensor setup and verification via the Aurora Capture Works utility for Windows® and Linux®
This model is for carrying out a high pressure noise test of individual automotive manufacturers' demands. It simulates representative high voltage noise of HV and EV.
- Single-phase 3 wire
- AC85 - 240V16A
- 50/60Hz
- DC125V16A
- Pulse: ~ 500V 50kHz (option)
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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