Probes
Products
![FormFactor - Cascade |Z| Probe – Coaxial - Excellent performance - longest lifetime FormFactor - Cascade |Z| Probe – Coaxial - Excellent performance - longest lifetime](/sites/default/files/styles/max_650x650/public/probe-z-coaxial-dual.png?itok=_2D-sSk5)
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Best price per contact – typically over one million (1,000,000) touchdowns
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RF/Microwave signal is shielded and completely air isolated in the probe body
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Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
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Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
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Probe on any pad material with minimal damage
![FormFactor - Cascade |Z| Probe® PCB - Robust RF test on PCB and ceramic FormFactor - Cascade |Z| Probe® PCB - Robust RF test on PCB and ceramic](/sites/default/files/styles/max_650x650/public/probe-zpcb.jpg?itok=kGuANpWg)
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Replace costly and inflexible test fixtures with easy-to-use probe tips
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Long lifetime – typically over 1,000,000 contacts
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GS/SG footprint up to 4 GHz and GSG up to 20 GHz
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High-power RF test: up to 30 Watts
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Test at temperatures from -60°C to 200°C
![FormFactor - Cascade |Z| Probe® Power - High power, high performance probe FormFactor - Cascade |Z| Probe® Power - High power, high performance probe](/sites/default/files/styles/max_650x650/public/probe-zprobe-power.png?itok=62nx4t5W)
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High power – 66 W at 2.4 GHz and 43 W at 5 GHz
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Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
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Excellent contact control and low contact resistance
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High performance on any pad material (Al or Au)
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Longest lifetime – typically one million (1,000,000) touchdowns
![FormFactor - Cascade ACP Probe – Coaxial Long-lasting, rugged RF and microwave on-wafer probes FormFactor - Cascade ACP Probe – Coaxial Long-lasting, rugged RF and microwave on-wafer probes](/sites/default/files/styles/max_650x650/public/probe_acp.png?itok=ZIIfWqy6)
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Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material
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DC to 110 GHz models available in single and dual line versions
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Low insertion and return loss with ultra-low-loss ( -L ) versions
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Excellent crosstalk characteristics
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Wide operating temperature -65 ° C to + 200 ° C
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Wide range of pitches available, from 50 to 1250 µm
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Individually supported contacts
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Reduced contact (RC) probe tips for small pads
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BeCu tip provides rugged, repeatable contact on gold pads
![FormFactor - Cascade ACP Probe – Cryo/Vacuum - Superior mechanical properties at cryogenic temperatures FormFactor - Cascade ACP Probe – Cryo/Vacuum - Superior mechanical properties at cryogenic temperatures](/sites/default/files/styles/max_650x650/public/probe_acp_0.png?itok=rytRd-ji)
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Functional temperature range of -263 to +150°C
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Stainless steel tip material for thermal decoupling
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Coaxial cable with TCE matched inner and outer conductors
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Consistent tip geometry even at cryogenic temperatures
![FormFactor - Cascade ACP-Q Probe - Multiple configurations for functional circuit testing FormFactor - Cascade ACP-Q Probe - Multiple configurations for functional circuit testing](/sites/default/files/styles/max_650x650/public/probe-acp-q.png?itok=OstDZbtn)
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Combination of DC and RF in a single probe module: One dual probe or a maximum of three RF; a maximum of 9 DC standard (other quantities upon request).
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Utilizes ACP tip design, GSG, GS or SG
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RF tips available from DC to 110 GHz
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Choice of BeCu or tungsten tips
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DC power needles come standard with 100 pF microwave capacitor
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Power bypass inductance: 8 nH
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Maximum DC voltage: 50 V without power bypassing (25 V with standard power bypassing, and component dependent with custom power bypassing)
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Ideal for probing the entire circuit for functional test
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Dual ACP configuration supports differential signaling applications
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DC probes can provide power or slow logic to circuit under test
![FormFactor - Cascade CSR Cal Substrates - Perfectly matched to the |Z| Probe® FormFactor - Cascade CSR Cal Substrates - Perfectly matched to the |Z| Probe®](/sites/default/files/styles/max_650x650/public/calibration-csr.jpg?itok=rRsTEkEO)
The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.
![FormFactor - Cascade DC-Q Probe - Multi-contact DC probe with flat tip needles FormFactor - Cascade DC-Q Probe - Multi-contact DC probe with flat tip needles](/sites/default/files/styles/max_650x650/public/probe-dcq.png?itok=Y_FfbrrJ)
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Power bypass inductance: 8 nH
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Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
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Supports collinear and non-standard needle configurations
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Up to 16 DC for standard; maximum of 24 DC for custom
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Ideal for probing the entire circuit for functional test
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DC probes can provide power or slow logic to circuit under test
![FormFactor - Cascade DCP 100 Series Probe - Delivers superior guarding and shielding FormFactor - Cascade DCP 100 Series Probe - Delivers superior guarding and shielding](/sites/default/files/styles/max_650x650/public/probe-dcp100.png?itok=Stq24kCj)
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High-quality construction with low-noise electrical performance
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Kelvin version for convenient 4-point measurements
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Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
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SSMC 50 connectors
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Ultra-low, fA and fF measurements from -65 º C to 150 º C