FormFactor - Cascade DC-Q Probe - Multi-contact DC probe with flat tip needles
- Power bypass inductance: 8 nH
- Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
- Supports collinear and non-standard needle configurations
- Up to 16 DC for standard; maximum of 24 DC for custom
- Ideal for probing the entire circuit for functional test
- DC probes can provide power or slow logic to circuit under test
The DCQ probes use controlled impedance, ceramic blade needles for low noise and high performance. This needle style allows the placement of high-quality bypass capacitors with very little series inductance due to their close proximity to the probe tip. All of the needles are connected to a common ground plane but individual needles can be easily (ground) isolated for additional low noise performance. A maximum of 16 needles are available for standard configurations and a maximum of 24 needles for custom configurations.
More Product Information
With the ProBus interface, the ZD500, 1000, and 1500 becomes an integral part of the oscilloscope. All probe gain and offset controls are transparent to the user, making it easier to probe the circuit without concern for which gain setting to choose. When used with a LeCroy digital oscilloscope, no external power supply is required.
- Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
- Guarantees fully-guarded measurements to fA and fF levels
- Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
- Allows probing of different pad materials and sizes
- Fast replacement of worn probes without the need for tools
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High power – 66 W at 2.4 GHz and 43 W at 5 GHz
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Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
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Excellent contact control and low contact resistance
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High performance on any pad material (Al or Au)
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Longest lifetime – typically one million (1,000,000) touchdowns
- Ideal probe for up to 48 V power conversion
- 250, 500 MHz and 1 GHz bandwidth
- 80 V dynamic range
- 60 V common mode
- Highest accuracy
- 0.5% gain accuracy
- Precision gain calibration
- Best LF flatness (0.1 dB)
- Lowest noise and highest rejection
- Wide variety of tips
- High performance solder-in
- Browser
- Single pins and header
- Mini and micro grabbers
- Socketed connections
- High temp solder-in
- Y-banana adaptor
- ProBus active probe interface
High voltage differential probes provide high CMRR over a broad frequency range (up to 400 MHz) to simplify the measurement challenges found in noisy, high common-mode power electronics environments. The probe’s design is easy-to-use and enables safe, precise high voltage floating measurements.
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
- IEC 61000-4-4 Ed.3 standard compliance.
- Pre-check function is installed. Inspection before testing is now easy.
- Normal mode test support. Taking account of field troubles is possible. (option)
- Utilize an outlet box that simplifies EUT connection. (option)
- Compared with conventional products, the size has become compact. (Approximately 67% by volume)
- Easy to understand Panel display reduces mistakes in connecting power cables.
- Software control with Windows. (option)
- Next calibration date can be notified. (Windows software only)
- Employ LCD screen with multi-language support and enhanced operability.
- Maximum output voltage of 5 kV and maximum pulse frequency of 2 MHz allow you to test above the standard test level.
- CDN capacity is increased to single phase type AC 240 V 20 A, single and three phase type to AC 600 V 63 A, supporting wider range of EUT.
- Large capacity CDN (100 A or 150 A) option available for Injection test on various EUT.
- Using coupling clamps, EMS probe kits, you can test the signal lines and evaluate the noise immunity on the PCB. (option)
Flexibility
- Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided
- Temperatures range from -60°C to +300°C
- Surfaces are nickel or gold-plated
- Hybrid chuck design – operation with and without cooling unit
- Field-upgradeable: On-site cold upgrades for all main prober platforms
Highest Efficiency for Reduced Cost of Test
- Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
- Up to 15% faster transition times than other systems on the market
- Coaxial and triaxial measurements up to 10,000 V
- High-quality construction with low-noise electrical performance
- Replaceable probe tips in a variety of tip sizes
- Temperature range of of -60°C to 300°C
- Triaxial measurement ensures a much better understanding of device leakage in the off state
- Highly reliable, stable and repeatable measurements
- Integrally designed as part of a complete measurement solution
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement