FormFactor - Cascade InfinityQuad - A configurable fine-pitch multi-contact RF/mmW probe for mixed-signal probing up to 110 GHz
-
Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
-
Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
-
Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
-
Durable probe structure ensures more than 250,000 contacts
-
Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications
For repeatable and precise engineering tests of DC, logic, RF and mmWave RFIC devices, the InfinityQuad™ probe ensures reliable measurement results up to 110 GHz over a wide temperature range (-40 °C to 125 °C). The durable photo-lithographically defined fine-pitch tip structure enables probing of small pads down to 30 x 50 μm with minimum pad damage and consistent low contact resistance. The durable probe tips with small contact area of ~10 μm diameter ensure more than 250,000 touchdowns on Al pads, and provide accurate X, Y and Z alignment.
Pads as small as 30 μm x 50 μm become a reality in automated over-temperature probing applications. This allows the user to reduce pad sizes, saves device real estate space and lowers pad parasitics – both saving money and improving measurement accuracy.
InfinityQuad technology reduces the minimum size of the pad that can be used with a multi-contact, mixed-signal probe. And for customers already using small pads, you can repeatedly make contact with the pad – reducing the amount of time needed to manually test or eliminating the need to repeat automatic tests due to probes skating off the pads.
Use our online tool to capture your design requirements and receive a quote.
Document
Document
Use our online tool to capture your design requirements and receive a quote.
More Product Information
-
High-quality construction with low-noise electrical performance
-
Kelvin version for convenient 4-point measurements
-
Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
-
SSMC 50 connectors
-
Ultra-low, fA and fF measurements from -65 º C to 150 º C
-
High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
-
RF bandwidth to 500 MHz
-
Long probe life: > 250,000 contacts
-
Beryllium-copper tips for gold pads or tungsten for aluminum pads
-
Oscillation-free testing of wide-bandwidth analog circuits
-
Use with ACP series probes to provide functional at-speed testing for known-good-die
-
Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
-
Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)
Ultra Low Temperature
-
Pulse tube cryocooler for cryogen free 4K temperatures
-
He-3 sorption cooler for high power intercept and launch stage for ADR
-
Single stage ADR provides solid state cooling down to 25mK
-
Sample stage mounting at both 300mK and 30mK
Configurability
-
Multiple stage feedthroughs for thermally intercepting the signals
-
Two large electrical bread boards for more configurable space
-
Rapid cool options for faster cooldowns
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Ice- and condensation-free probing down to 77 K (liquid nitrogen) or below 20 K (liquid helium)
-
Probe positioners placed inside vacuum chamber
-
Joystick controller
-
Manual probe positioners with rotary feed-throughs
-
User-centered design minimizes training costs and enhances efficiency
-
Comprehensive alignment functions – from simple wafer alignment and mapping to automated alignment and test of multiple singulated chips, like IR – Focal Plane Arrays
See more Key Features on Specifications & Details tab
Impedance Standard Substrates (ISSs) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. Our ISSs offer the proven accuracy of LRRM calibrations with automatic load inductance compensation.
-
Multi-purpose SIGMA instrument integration kit
-
Shorter cabling and universal chuck connection
-
Triax probe with protected guard
-
Triax design for low-leakage measurements up to 3 kV
-
Special chuck surface coating
-
High-isolation ready
-
Arcing protection
-
Shield Enclosure with interlock
-
Advanced grounding concept
See more Key Features on Specifications & Details tab
-
Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
-
Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
-
LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
-
Automatic load inductance compensation function ensures the most repeatable calibrations
-
Easy to use Probe to ISS/CSR matching tool
-
Additional remoting methods
-
Interface with Velox™ over LAN
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
-
Low running costs, less vibration, less noise, reduced maintenance
-
Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
-
CMN calibrated thermometry on MC plate
-
Operation via touch panel controller: Remote operation via ethernet interface
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
Document
