FormFactor - HPD JDry-250 - Cryogen-free Dilution Refrigerator
-
Low running costs, less vibration, less noise, reduced maintenance
-
Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
-
CMN calibrated thermometry on MC plate
-
Operation via touch panel controller: Remote operation via ethernet interface
FormFactor’s JDry cryogen-free dilution refrigerators enable easy and cost-effective cooling to temperatures below 10 mK. The JDry models have been optimized for quantum computing applications and can accommodate up to 270 semirigid cables. General-purpose configurations and astronomy/detector cooling are also provided.
The JDry cryogen-free dilution refrigerator series includes multiple standard models. All are available with easy push-button cooling using the robust and fully-automated NI LabVIEW™-based “JACoB” gas-handling system (GHS).
The JDry-250 model is fitted with a cold-plate of 305 mm (12″) diameter, and provides a cooling power of more than 250 µW at 100 mK.
Document
More Product Information
-
Multi-purpose SIGMA instrument integration kit
-
Shorter cabling and universal chuck connection
-
Triax probe with protected guard
-
Triax design for low-leakage measurements up to 3 kV
-
Special chuck surface coating
-
High-isolation ready
-
Arcing protection
-
Shield Enclosure with interlock
-
Advanced grounding concept
See more Key Features on Specifications & Details tab
Impedance Standard Substrates (ISSs) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. Our ISSs offer the proven accuracy of LRRM calibrations with automatic load inductance compensation.
-
Coaxial and triaxial measurements up to 10,000 V
-
High-quality construction with low-noise electrical performance
-
Replaceable probe tips in a variety of tip sizes
-
Temperature range of -60°C to 300°C
-
Triaxial measurement ensures a much better understanding of device leakage in the off state
-
Highly reliable, stable and repeatable measurements
-
Integrally designed as part of a complete measurement solution
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
Ultra Low Temperature
-
Pulse tube cryocooler for cryogen free 4K temperatures
-
Two stage ADR provides solid state cooling down to 30mK
-
Sample stage mounting at both 1K and 50mK
Configurability
-
Multiple stage feedthroughs for thermally intercepting the signals
-
Two large electrical bread boards for more configurable space
-
Rapid cool options for faster cooldowns
-
Full-radius, nickel-plated tungsten needles
-
Power bypass inductance: 16 nH
-
Supports collinear and non-standard needle configurations
-
Support up to a maximum of 12 ceramic blades DC needles / contacts
-
Ideal for probing the entire circuit for functional test
-
DC probes can provide power or slow logic to circuit under test
-
Re-configurable for DC, RF, mmW, FA, WLR and more
-
Thermal range: -60˚C to 300˚C available
-
Upgrade path to meet your future needs
-
Stable and repeatable measurements over a wide thermal range
-
Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
-
Advanced EMI-shielding with PureLine with AttoGuard technologies
-
Best solution for low-noise and 1/f measurements
-
Minimize AC and spectral noise
-
Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range
-
Locking roll-out stage
-
Innovative microscope remote control
-
Intuitive ergonomic stage controls
-
Quick, safe, and comfortable wafer access
-
Easy on-wafer navigation
-
Fast setup and test data gathering
-
Dedicated Velox version for manual probe stations
-
AugmentedAlign tool with on screen markers for improved RF measurement accuracy
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Probe positioners placed inside vacuum chamber
-
Short and stable probe arms
-
Intuitive, manual drives
-
Front loading capability through load door
-
Software control of chuck for fast step-and-repeat testing of the entire wafer
-
Fast step-and-repeat testing of the whole wafer
See more Key Features on Specifications & Details tab
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Probe positioners placed inside vacuum chamber
-
Short and stable probe arms
-
Joystick controller
-
Manual probe positioners with rotary feed-throughs
-
Software control of chuck for fast step-and-repeat testing of the entire wafer
-
Fast step-and-repeat testing of the whole wafer
-
User-centered design minimizes training costs and enhances efficiency
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
