FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
More Product Information
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Functional temperature range of -263 to +150°C
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Stainless steel tip material for thermal decoupling
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Coaxial cable with TCE matched inner and outer conductors
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Consistent tip geometry even at cryogenic temperatures
A family of fanless, durable, SWaP-C optimized small form factor mission computers providing maximum ruggedization, processing, storage, and security at the edge across the modern, multidomain battlespace.
- Ready for Extremes - Lightweight, sealed, and designed to operate between -40°C and +70°C in harsh environments
- Military-grade Connectors - Protect against dust, dirt, debris, and water as well as electromagnetic interference
- Zero-trust Architected - Hardware-based security measures encrypt and isolate data as it is being processed.
- Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
- Guarantees fully-guarded measurements to fA and fF levels
- Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
- Allows probing of different pad materials and sizes
- Fast replacement of worn probes without the need for tools
- Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
- Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
- Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
- Durable probe structure ensures more than 250,000 contacts
- Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications
Our patented miniaturized L/S/C Tri-Band Feed delivers top-notch performance and unmatched flexibility.
Equipped with a common L/S/C radiating front end, it’s complemented by a modular set of active RF modules, enabling simultaneous reception and tracking across various frequency bands. Its compact, lightweight design allows it to be mounted on any dishes ranging from 6 to 24 feet.
Available in single, dual, or tri-band configurations, this feed offers the best value for customers looking to meet current requirements while staying future-ready.
It’s also field-upgradable to add any missing bands with straightforward RF module additions, ensuring scalability while keeping costs in check.
- The LL158 Series produces an oblique (30°) line of illumination for line scan applications in a passively cooled design.
- When oriented across a moving web or conveyor line, unlike standard line lights, this linear light’s unique geometry highlights engraved or raised lines that run parallel to the material travel.
- Provides an intensity level of 53kLux (working distance of 75mm).
- Pre-engineered for expandability in 6” (152mm) increments up to 90” (2.28m).
- Available intensity control provides illuminance adjustability for every 6″ increment via a 0 – 10v input.
Flexibility
- Different substrate carriers for wafers up to 150 mm or single dies
- Up to six positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Probing with an open chamber lid possible under atmospheric condition
- Specially designed for laboratory environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
See "Specifications & Details" tab for more key features
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (25 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
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Camera and IEEE 1394b cable (other configurations on request)
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement