FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
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High flexibility
- Re-configurable for DC, RF, mmW, FA, WLR and more
- Thermal range: -60˚C to 300˚C available
- Upgrade path to meet your future needs
- Stable and repeatable measurements over a wide thermal range
See "Specifications & Details" tab for more key features
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The BL2 Series provides a highly uniform and high intensity, diffuse backlight source, primarily used for creating object silhouettes of high contrast or imaging through semi-translucent materials.
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BL2 Backlights are pre-engineered for scalability, allowing for size configurations in 1″ increments up to 46″ in length and width.
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This Backlight series is offered in 5 wavelength options and can be configured with either a polarization or collimation film.
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As with all Advanced illumination products, this series is built for tailorability while still maintaining a standard lead time of one to three weeks.
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Each side of a BL2 is equiped with M6 nut channels, allowing for quick and easy mounting. This series comes with our LB111 Mounting Brackets.
The MDR-GT / GTS is the ultra-fast on-board flight test (16 Gbps) instrumentation solution. The MDR family is technically based on a common mainframe with many high-end built-in interfaces and functions. The MDR-GT / GTS is highly customizable: functions and requirements can be addressed by adding dedicated interface modules, offering a variety of configuration options for all applications and requirements (MDR modules compatibility). Because Cybersecurity is key, the MDR-GTS has been built with secure functions: Data-At-Rest (FIPS 140-2), Key Access Management, Removable Non-Volatile Memory.
- The Wide Linear Diffuse Light series is ideal for the inspection of elongated or cylindrical objects.
- Perfect for inspections requiring a multi-camera setup.
- Can be provided with up to 4 viewing ports.
- Expandable lengths from 6” – 36” (152 – 194mm) in 6” increments.
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Die-to-die stepping time of under 100 ms
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Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology
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Even extreme variations in height, such as the case with warped wafers, can be compensated
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Interfaces to all major analysis instrumentation, optics software and testers
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Access to top side and bottom side of device under test (DUT)
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Highly accurate light measurement
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Test automation out-of-cassette for 24/7 operation
OptoVue
- Revolutionary technology advancement for wafer and die-level photonics probing
- Real-time in-situ calibrations
- Singulated die testing
- True die-level edge coupling
- In-situ power measurements
- Advanced calibration technologies
- Enables autonomous measurements
Horizontal Die-Level Edge Coupling
- Highest accuracy in test results
- Lowest coupling loss
- Repeatable measurement results due to exclusive automated fiber-to-facet alignment technology
- Reduced risk of damaging fibers with collision avoidance technology
- Ease of use for less experienced users
- Enables close simulation of real-world conditions with device performance closest to the final application
See "Specifications & Details" tab for more key features
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
SlimVue Microscope
- Combined eye-pieces and CCD camera mount
- 3x zoom and quick lens exchange
- Quick lens exchange
- 1 um optical resolution
- Minimized scope footprint
- Fast change from navigation optics to high-resolution optics
- Resolving ‹ 50 μm pads
- Simple integration with any mmW modules
Application Specific Sigma Kits
- Engraved guides on mmW platen
- Supports broadband, load pull, coax RF and banded waveguide configuration
- Optical feedback on platen position (gauge)
- Adaptable to any mmW/sub-THz applications
- Seamless integration with any mmW modules and tuners
- Fast mounting and setup change
THz measurement capability
- Rock-solid mechanical design
- Submicron stage accuracy
- Optical feedback on platen and probe position (gauge)
- Motorized positioner
- <+-1 um separation repeatability
- Micrometer-accurate and repeatable probe placement and overtravel
- Highly-precise and stable THz measurements
- High dispersion for reflective surfaces and shorter working distances.
- Provides a narrower and less intense illumination area than the AL116.
- IP65 compliant washdown option is available, as are a wide spectrum of wavelengths.
- Available with polarization and diffusion light conditioning.
- This expandable compact bar light is pre-engineered for custom lengths in 2″ increments up to 40″.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.