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Our White High Intensity Linear Backlights offer 540 kLux output, perfect for back-lit, line-scanning applications.
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Available in pre-engineered sizes from 6” (152mm) to 96” (2438mm) in 6″ increments.
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A 3″ (75mm) length option is also available. Available intensity control provides illuminance adjustability for every 6″ increment via a 0 – 10v input.
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Available in white only. For additional wavelengths please refer to our BL138 series.
FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
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DC, RF and Optical Probe Positioning for Highest Accuracy Measurements
FormFactor offers a wide variety of manual and motorized probe positioners for any application from DC to terahertz measurements and beyond.
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The BL2 Series provides a highly uniform and high intensity, diffuse backlight source, primarily used for creating object silhouettes of high contrast or imaging through semi-translucent materials.
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BL2 Backlights are pre-engineered for scalability, allowing for size configurations in 1″ increments up to 46″ in length and width.
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This Backlight series is offered in 5 wavelength options and can be configured with either a polarization or collimation film.
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As with all Advanced illumination products, this series is built for tailorability while still maintaining a standard lead time of one to three weeks.
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Each side of a BL2 is equiped with M6 nut channels, allowing for quick and easy mounting. This series comes with our LB111 Mounting Brackets.
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Replace costly and inflexible test fixtures with easy-to-use probe tips
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Long lifetime – typically over 1,000,000 contacts
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GS/SG footprint up to 4 GHz and GSG up to 20 GHz
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High-power RF test: up to 30 Watts
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Test at temperatures from -60°C to 200°C
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features
- The AL143, 2×3 Spot Light is available in a wide range of wavelengths with multiple lens options.
- Ideal Illumination for medium working distances.
- Convenient mounting with an M4 nut channel.
- Washdown version is available
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Ease of use – Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
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Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
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Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
- 8 Independent Channels, 2 Output Connectors
- Includes built-in pre-programmed sequencing.
- Provides control for computational imaging, including photometric stereo, extended depth of field, combined bright field + dark field, high dynamic range, and high resolution color.
- Ideal for multi-channel lights and multi-light stations. Due to power output constraints, some configurable light lengths may be limited.
- Housed within a compact enclosure with DIN rail mounting.
- Driven with SignaTech™ for improved safety and easy operation.
NOTE: NOT COMPATIBLE WITH C1 CONNECTORS
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (49 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
Scope of delivery
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Camera and IEEE 1394b cable (other configurations on request)
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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