FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
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Flexibility
- DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
- Full thermal range of -60°C to +300°C
- Compatible with TopHat or IceShield
- Usage of manual and motorized positioners, probe cards within EMI-shielded environment
- Upgrade path to meet your future needs
- Stable and repeatable measurements over a wide thermal range
High accuracy and repeatability
- Reliable and repeatable contact
- Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
- Advanced EMI-shielding with PureLine and AttoGuard technologies available
- Superior low-leakage and low-noise measurements
- Safe and accurate hands-off testing
- Minimizes settling times for efficient measurements over full thermal range
See "Specifications & Details" tab for more key features
- Our Standard Intensity Linear Backlights provide rugged construction for demanding environments.
- Standard intensity illumination with low power input requirements.
- Multiple wavelengths available with very consistent illumination over the entire active area.
- Available in 1” (25mm) increments with lengths up to 80.5” (2044mm).
- The SL112 is characterized as a Medium Intensity Spot/Coaxial Light and is designed primarily to replace fiber optic light sources in coaxial lensing applications.
- Optional couplers are available for use with Dolan-Jenner, Fostec, and Moritex fiber bundles.
- The spot light is designed with sufficient thermal management to provide 22kLux at a working distance of 4” (100mm).
- A range of visible wavelengths are available
- Tests and validates performance directly on silicon without post-dicing packaging
- Dramatically reduces time to data and shortens development cycles
- Enables high scalability for high volume manufacturing
- Offers flexibility in chip design with full grid probing
- The LL158 Series produces an oblique (30°) line of illumination for line scan applications in a passively cooled design.
- When oriented across a moving web or conveyor line, unlike standard line lights, this linear light’s unique geometry highlights engraved or raised lines that run parallel to the material travel.
- Provides an intensity level of 53kLux (working distance of 75mm).
- Pre-engineered for expandability in 6” (152mm) increments up to 90” (2.28m).
- Available intensity control provides illuminance adjustability for every 6″ increment via a 0 – 10v input.
- Power bypass inductance: 8 nH
- Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
- Supports collinear and non-standard needle configurations
- Up to 16 DC for standard; maximum of 24 DC for custom
- Ideal for probing the entire circuit for functional test
- DC probes can provide power or slow logic to circuit under test
More than a calibration tool
- Calibration
- Validation
- Measurement
- Analysis
No one supports more VNA’s
- Support of more than 24 of the most common VNA’s
Tool for the novice
- Guided wizards and multimedia tutorials integrated
- Intelligence in setups
See "Specifications & Details" tab for more key features
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (31 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
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Camera and IEEE 1394b cable (other configurations on request)
The FX2 is the edge-lit flat diffuse light built for reflective surface inspection.
Unlike back-lit diffuse designs, the FX2 positions its LEDs in the frame rather than behind the emitting window. This side-lit geometry allows for a thin housing and a scalable planar design with uniform output at longer working distances.
The FX2 is available in sizes from 50 mm x 50 mm up to 600 mm x 600 mm in 25 mm increments. It is offered in 11 wavelengths, with optional polarization to help reduce glare on reflective surfaces, and can be specified with a central viewport for select front lighting applications.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.