FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
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Best price per contact – typically over one million (1,000,000) touchdowns
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RF/Microwave signal is shielded and completely air isolated in the probe body
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Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
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Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
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Probe on any pad material with minimal damage
Safran’s SEEING™ 130 Wide includes a unique medium focal length catadioptric optics, limited by diffraction only and with ultra-low distortion, offering perfect imaging over 35 mm full-frame image format. It is fitted with a 10megapixel sensor.
SEEING™ 130 Wide enables high Signal to Noise Ratio for multispectral (MS), hyperspectral (HS) and low light level imaging. SEEING™ 130 Wide includes a spectral filter with 23 bands covering Blue, Green, Red, Near InfraRed and Red Edge MS, for a broad spectral range between 475 and 900nm. SEEING™ 130 Wide has a large Field of View of 6.3° x 4.3° / 54 x 36 km2 from a 500km/310 miles orbit.
In addition to its a thermal design within a robust structure, SEEING™ 130 Wide has a low SWaP, saving launch and operational costs.
The Broadband sleeve antenna was developed to efficiently perform proximity radiation immunity testing.
The international standards ISO11451-3/ISO11452-9 stipulate proximity radiation immunity testing methods that assume electromagnetic interference when wireless transmitters such as smartphones and Wi-Fi devices are placed in close proximity to other electronic devices.
This product is a small, lightweight, high-gain antenna used in these standards that covers a wide bandwidth and has good radiation characteristics. Since it can be used in the wide band from 5GHz to 8GHz, it can be used to perform proximity radiation immunity testing assuming wireless LAN in the 6GHz band (up to 7.125GHz).
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Sub-sampling
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (48 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
Scope of delivery
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Camera and IEEE 1394b cable (other configurations on request)
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Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material
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DC to 110 GHz models available in single and dual line versions
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Low insertion and return loss with ultra-low-loss ( -L ) versions
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Excellent crosstalk characteristics
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Wide operating temperature -65 ° C to + 200 ° C
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Wide range of pitches available, from 50 to 1250 µm
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Individually supported contacts
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Reduced contact (RC) probe tips for small pads
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BeCu tip provides rugged, repeatable contact on gold pads
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Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
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Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
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Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
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Calibration Monitor and Re-calibration – System will continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.
Non-ATEX certified optocouplers provide effective electrical isolation between input and output circuits using light-based signal transmission. Ideal for environments where explosive atmosphere certification is not required, these components offer dependable performance in signal switching, noise reduction, and circuit protection across a wide range of standard applications.
- Our EuroBrite™ lineup outdoes the competition in so many ways. With more features at a competitive price point, there’s no better value in machine vision lighting:
- Complete built-in control for continuous and strobe modes.
- Adaptive Power™, a feature of the EuroBrite™ lighting controller, utilizes an onboard thermistor to maximize light output in continuous mode.
- Adaptive Overdrive,™ another feature of the EuroBrite™ lighting controller, provides a maximal output pulse in strobe mode regardless of the exposure period.
- IP67 sealed enclosure suitable for washdown environments.
- Rugged construction that has been tested to withstand over 1000lb.
- Industrial grade LEDs providing high-intensity illumination of 85klux (working distance of 100mm).
- Daisy chain up to 4 for a combined length of 24”.
With the powerful modular LUMIMAX® LED Bar Lights test areas can be uniformly illuminated even from distances of more than 1 meter. The Bar Lights with integrated controller technology are available in different configurations for incident and backlight applications.
The modular bar lights expand the portfolio and include now bar lights of up to 4 meters for even larger test areas. Thanks to the modular concept, specific sizes can be realized quickly and without additional development costs. You can select standard versions using our product configurator. Please contact our sales team for special enquiries about customised lengths.
FormFactor, Inc.
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FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
