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Pre-Engineered Scalability Enables Customized Emitting Lengths in 2″ Increments to 20″
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Intense, Diffuse Lighting with 226 kLux at Emitting Surface
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Multiple Available Wavelengths, Including Visible Monochromatics, Infrared, and White
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Available Washdown Option for Difficult Environments
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Can be Applied in Backlighting or Diffuse Front Lighting Geometries
FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
More Product Information
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Highly stable granite base
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Independent, coarse movement of X and Y axes, combined with easy fine adjustments
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Re-configurable for DC, RF, mmW, FA, WLR and more
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Full thermal range of -60°C to +300°C
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Low-profile, straightforward design
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Spacious top chambers for up to 12 positioners
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Reduces electrical noise by providing a fully electromagnetically shielded, ultra-low-noise, light-tight environment
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Enables accurate low-noise measurements of atto amperes, femtofarads and microvolts at temperatures down to -60°C
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Multi-purpose SIGMA instrument integration kit
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Shorter cabling and universal chuck connection
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Triax probe with protected guard
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Triax design for low-leakage measurements up to 3 kV
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Special chuck surface coating
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High-isolation ready
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Arcing protection
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Shield Enclosure with interlock
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Advanced grounding concept
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- This Large Area Diffuse Light provides extremely diffuse illumination over an area of 18” square (457mm).
- Available in a wide array of wavelengths, providing up to 7kLux at a 1” (25mm) standoff.
- At 13.6 pounds (6.2 kilograms), the DL071 is both rugged and lightweight.
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- 4 Independent Channels, 1 Output Connector
- Includes built-in pre-programmed sequencing.
- Provides control for computational imaging, including photometric stereo, extended depth of field, combined bright field + dark field, high dynamic range, and high resolution color.
- Ideal for multi-channel lights and multi-light stations. Due to power output constraints, some configurable light lengths may be limited.
- Housed within a compact enclosure with DIN rail mounting.
- Driven with SignaTech™ for improved safety and easy operation.
NOTE: NOT COMPATIBLE WITH C1 CONNECTORS
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Provides an effectively noise free environment around the device under test (DUT)
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World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
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Up to 4x faster flicker noise thermal testing on 30 μm pads
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Provides dark and dry environment for measuring light sensitive transistors, and devices at negative temperatures (<= -60°C) with frost free operation
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Provides fully managed and filtered AC power to the entire system – prober and instruments
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Filters harmful noise generated by external thermal control systems
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Reduced “antenna effect” injection of unwanted RF noise into the measurement path
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Provide up to 100dB attenuation (50Hz to 80Mhz) with 100mA max DC current handling
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Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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User-centered design minimizes training costs and enhances efficiency
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
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- Our classic LL163 Line Lights are suitable for low intensity, low speed line scan applications.
- These line lights are well established and have proven reliability.
- Provides a intensity level of 24kLux (working distance of 25mm).
- Available in 7 wavelengths including 395nm (UV) and 880nm (IR).
- Pre-engineered for expandability in 1.5” (38.1mm) increments up to 81” (2.06m).
- LL163 derivatives include LL2912 (3”), LL3024 (6”) and LL3148 (12”) (which represent legacy part numbers)
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EMC test equipment to evaluate the resistibility of electronic devices and components when energy charged on a human body or object is discharged to the electronic devices and components. NoiseKen brand ESD simulator is available to see malfunctions or function declines of electronic equipment for appropriate evaluations compliant with IEC 61000-4-2 Ed.2 Test Standard, ISO 10605 Ed.2 Test Standard & ISO 10605 Ed.3 Test Standard.
The ESS-S3011A features a function which enables the user to pre-program test settings to minimize setup errors as well as having the unit be incorporated into a remote or autonomous testing setup. Another feature that sets apart NoiseKen ESD guns to that of competitors is the discharging gun separation design which helps achieve the lightweight.
For conventional ESD guns, that have generators that are inseparable from the gun, you may experience having to replace the whole unit even only when certain parts of the unit are broken. However, with the NoiseKen’s separation design, replacement parts can be minimized to lower the running cost.
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- Small, lightweight, portable design: ideal for lab and field work
- Self-contained licence so you can use the XJTAG system on multiple PCs
- Re-configurable unit for multiple UUTs saving costs
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FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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