FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
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Customizable sample space to fit the user’s application
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Long holding time: 100 hours for six (6) STP liter He-3 gas
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Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line; +/- 0.5 mK at base temperature
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Low noise
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Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
- This High Intensity Spot Light is engineered for long throw and high brightness illumination.
- Built with 12 high current LEDs focused to produce even illumination at distances beyond 300mm.
- Designed to replace our previous SL185 with 3X the brightness (110Klux @ 300mm).
- Available in a wide range of wavelengths.
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Independently cooled cold shield
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Probe positioners placed inside vacuum chamber
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Intuitive, manual drives
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Front loading capability through load door
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for chuck
See more Key Options in Specifictions & Details tab
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Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material
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DC to 110 GHz models available in single and dual line versions
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Low insertion and return loss with ultra-low-loss ( -L ) versions
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Excellent crosstalk characteristics
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Wide operating temperature -65 ° C to + 200 ° C
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Wide range of pitches available, from 50 to 1250 µm
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Individually supported contacts
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Reduced contact (RC) probe tips for small pads
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BeCu tip provides rugged, repeatable contact on gold pads
The SPARTE e100 is a hybrid antenna addressing the telemetry applications in S-Band, including hypersonic test articles.
The antenna is a combination of an Electronic Beam Steering supporting any elevation from -5° up to +95° and a single-axis mechanical rotation of the patch panel providing unlimited azimuth. The patch panel’s size enables the SPARTE e100 to achieve telemetry reception performance comparable to that of a 1.2m diameter dual-axis antenna.
This is achieved with a significantly simpler mechanical design, ensuring easier maintenance throughout the antenna’s operational lifespan.
The SPARTE e100’s rapid tracking capabilities, reaching speeds of up to 60°/s in azimuth and virtually infinite in elevation, make it an ideal “lock-on” antenna.
eZ Viewer is a data post-flight replay software for use with mission data based on IRIG-106 Chapter 10 format, recorded on ENERTEC recorder/server. This software is an easy-to-use, quick setup and intuitive tool targeted for data replay.
Key Features Comprehensive software tool for:
- Configuration of mission debriefing post-flight debriefing / mission analysis
- Data from on the media or archived
Intuitive interface:
- Pre-configuration of display
- Easy to use and quick setup
- SQUADRON mode
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Load-lock chamber: Cycle devices 10X faster in a cryogenic environment
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High-density electrical interface at cryogenic temperatures: More pins on the device enables more test structures to be probed with a single cooldown
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Base temperature of < 2K or < 4K with high cooling power: Test devices at the temperatures that matter most for pre- screening and evaluating device performance
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Low vibration: Stable contact with the device under test and enables low noise measurements
- The Narrow Linear Diffuse Light series is ideal for precision scanning of highly reflective materials.
- The DL151 is available in a wide range of wavelengths and provides up to 28kLux at a 1” (25mm) standoff.
- The extruded aluminum enclosure can be expanded in 2″ (51mm) increments from 2″ to 70″ (1778mm).
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (31 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
Scope of delivery
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Camera and IEEE 1394b cable (other configurations on request)
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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