The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.

• Cryogen-free option available
• Flexible sample space
• Low noise, low vibration
• Long holding time
• Stable He-3 pot temperature

• Sample can be loaded or removed when the cryostat is cold
• High cooling power with sample in (He-3) liquid (400 mK with 400 microwatt cooling power)
• Sample probe and a load-lock with gate valve

• Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
• Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
• Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.

• Combination of DC and RF in a single probe module: One dual probe or a maximum of three RF; a maximum of 9 DC standard (other quantities upon request).
• Utilizes ACP tip design, GSG, GS or SG
• RF tips available from DC to 110 GHz
• Choice of BeCu or tungsten tips
• DC power needles come standard with 100 pF microwave capacitor
• Power bypass inductance: 8 nH
• Maximum DC voltage: 50 V without power bypassing (25 V with standard power bypassing, and component dependent with custom power bypassing)
• Ideal for probing the entire circuit for functional test
• Dual ACP configuration supports differential signaling applications
• DC probes can provide power or slow logic to circuit under test

• On-wafer power device characterization up to 10,000 V DC / 600 A
• Safe and convenient integration kits to support T.I.P.S. “LuPo” High Voltage / High Power Probe Cards
• Prevent thin wafers from curling and breaking
• Safety interlock system with clear enclosure for operator safety during device measurements
• Convenient connection kits for easy and safe system integration with power device analyzers from Keysight Technologies and major suppliers
• Up to 25% lower air consumption (CDA) than other systems in the market (300l/min) with no compromise in transition times
• Windows 10 compatibility enables highest performance and safe operation with state-of-the-art hardware

• Fully isolated experiment space for true 4K temperatures during probing
• Cryogenic positioners to provide large travel ranges without warming up the device
• Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
• A soft vacuum bellows provides a compliant mounting interface for the cryocooler
• Quick release vacuum feedthroughs for easy configurability
• A large rectangular port for high signal capacity

• Highly stable granite base
• Independent, coarse movement of X and Y axes, combined with easy fine adjustments
• Re-configurable for DC, RF, mmW, FA, WLR and more
• Full thermal range of -60°C to +300°C
• Low-profile, straightforward design
• Spacious top chambers for up to 12 positioners
• Reduces electrical noise by providing a fully electromagnetically shielded, ultra-low-noise, light-tight environment
• Enables accurate low-noise measurements of atto amperes, femtofarads and microvolts at temperatures down to -60°C