FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
Customization Examples

Waveguide with customized bracket

300 mm chuck with large tweezer pocket

RF positioner with micrometer screws

Double-side setup for emission microscopy

Combined microscope movement for scope and black body

mmW setup with North/South positioner platform
More Product Information
When a catalog product cannot completely satisfy a requirement, AMETEK Programmable Power's Solutions Business provides custom power supply systems and integrations. The solutions range from OEM integration for medical and semiconductor industries to modular avionics ATE power subsystems to turnkey solar array simulators for satellites. We also can modify power supplies to meet your application requirements.
- Custom electrical testing available upon request
- Wide package variety with custom configurations
- NC100 & 200 series for audio and RF applications
- NC300 & 400 series for microwave application
Noise diodes are the fundamental building blocks for analog noise systems. They are categorized for performance characteristics that enhance their broadband noise output and flat spectral response. All Maury noise diodes can deliver symmetrical white Gaussian noise and flat output power versus frequency*.
* Flatness and output power are dependent upon peripheral circuit characteristics
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
Superior Mechanics
- Highly stable granite base
- Independent, coarse movement of X and Y axes, combined with easy fine adjustments down to submicron ranges
- 1 µm repeatable separation stroke
- Excellent measurement accuracy and repeatability
- Fast navigation and high-precision probe positioning
See "Specifications & Details" tab for more key features
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
Our patented miniaturized L/S/C Tri-Band Feed delivers top-notch performance and unmatched flexibility.
Equipped with a common L/S/C radiating front end, it’s complemented by a modular set of active RF modules, enabling simultaneous reception and tracking across various frequency bands. Its compact, lightweight design allows it to be mounted on any dishes ranging from 6 to 24 feet.
Available in single, dual, or tri-band configurations, this feed offers the best value for customers looking to meet current requirements while staying future-ready.
It’s also field-upgradable to add any missing bands with straightforward RF module additions, ensuring scalability while keeping costs in check.
Flexibility
- Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided
- Temperatures range from -60°C to +300°C
- Surfaces are nickel or gold-plated
- Hybrid chuck design – operation with and without cooling unit
- Field-upgradeable: On-site cold upgrades for all main prober platforms
Highest Efficiency for Reduced Cost of Test
- Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
- Up to 15% faster transition times than other systems on the market
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Use with liquid nitrogen or helium, depending on the target temperature
- Accessories available, such as black bodies and optical motion analysis tools
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
See "Specifications & Details" tab for more key features
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.