FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
Customization Examples
Waveguide with customized bracket
300 mm chuck with large tweezer pocket
RF positioner with micrometer screws
Double-side setup for emission microscopy
Combined microscope movement for scope and black body
mmW setup with North/South positioner platform
More Product Information
Xena3918 provides an easy-to-use port configuration panel that lets you add and remove ports, and assign IP addresses and port roles. Ports from multiple XenaBay and XenaCompact chassis can be freely mixed.
- Makes it easy to create, edit and execute all test-types specified in RFC 3918
- Support for IPv4 and IPv6
- Multiple protocols supported per UNI (Ethernet, Customer and Service VLANs, MPLS, IPv4, IPv6, and UDP)
- Support for all IGMP/MLD versions
- Works seamlessly with multiple XenaBay and XenaCompact test chassis
- Ability to flexibly define protocol layers supported by the test incl. Ethernet VLANs, IP and UDP
- Extensive configuration options for fine-tuning tests
- Capture from legacy to the latest video sources through support for SD analog to UHD digital formats
- Connect and switch between different video sources via Mini DisplayPort, HD-BNC, HDMI, and custom analog DVI1 connectivity
- Handle multiple video sources with the simultaneous capture of up to eight HD or two UHD streams2
- Optimize video transmission and storage through onboard multi-stream H.264 encoding
- Minimize system footprint by way of a single-slot PCIe card design
- Simplify application development using the Aurora Imaging Library, formerly Matrox Imaging Library (MIL), software development kit (SDK)
- Deploy on a current platform of choice with support for 64-bit Windows® 7/10 and Linux
The SPARTE 500 series, commonly mounted with a 4.4 reflector, is a top-of-the-line dual-axis antenna that spans dish sizes from 15 to 18 feet. This field-proven telemetry tracking antenna has been trusted by customers for their most mission-critical applications.
With a widespread presence on test ranges around the world, the SPARTE 500 series antennas excel in meeting the rigorous demands of various flight test scenarios, whether it’s for long-range aircraft, missiles or launch vehicles tests.
These antennas offer a streamlined design, ensuring easy operation and making them a perfect fit for any ground test range, working hand in hand with smaller range trackers.
High flexibility
- Re-configurable for DC, RF, mmW, FA, WLR and more
- Thermal range: -60˚C to 300˚C available
- Upgrade path to meet your future needs
- Stable and repeatable measurements over a wide thermal range
See "Specifications & Details" tab for more key features
Gold-plated TESLA High-power MicroVac™ Chucks
- Prevent thin wafers from curling and breaking
- Advanced MicroVac chuck surface for minimum contact resistance between wafer and chuck
- Accurate Rds(on) measurement at high current
- Accurate UIS measurements at high temperature
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Customers can leverage our multi-tier approach to customization to reduce engineering costs.
- Our adaptable Build-to-Order (BTO) system provides for very short lead times and allows a product to be configured from a large set of predetermined parameters, with hundreds of thousands of BTO combinations available. BTO products are indicated in the product data-sheet and are shipped within 1-3 weeks, depending on the product.
- Our Semi-Custom products require some additional design and documentation effort but can be a smart choice when more flexibility is required.
- Lastly, a full Custom product can be developed when your budget and time frame allows. This option supplies you with a fully custom-designed and built lighting solution that will be engineered to fit your exact machine vision needs.
- Designed for use with specific Probe Systems
- Tables to suit all facility requirements and applications
- Stable probing, even in submicron range
- Granite platen ensures rigidity and temperature stability
- Can be combined with the Shield Enclosures
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High power – 66 W at 2.4 GHz and 43 W at 5 GHz
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Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
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Excellent contact control and low contact resistance
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High performance on any pad material (Al or Au)
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Longest lifetime – typically one million (1,000,000) touchdowns
FormFactor, Inc.
Website
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
