FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
Customization Examples

Waveguide with customized bracket

300 mm chuck with large tweezer pocket

RF positioner with micrometer screws

Double-side setup for emission microscopy

Combined microscope movement for scope and black body

mmW setup with North/South positioner platform
More Product Information
High-voltage/current Probes
- On-wafer power device characterization up to 10,000 V DC / 600 A
- Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
- Increased isolation resistance and dielectric strength to provide full triaxial capability at high voltage (3,000 V) for low-leakage measurement
Flexibility
- Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL
- Re-configurable and upgradable as requirements grow
- Minimizes setup times with no loss in performance or accuracy
- Seamless integration of various measurement instruments
Stability
- Solid station frame
- Built-in vibration-isolation solution for superior vibration attenuation
- Rigid microscope bridge
- Compact and rigid mechanical design
- Highly accurate measurement results
- Incorporates best-known methods
Ease of Use
- Ergonomic and straightforward design for comfortable and easy operation
- Low-profile design
- Simple microscope operation
- Quick and ergonomic change of DUT through pull-out stage
- Minimize training efforts
- Fast time to data
- Convenient operation
Resistance decade box with 100 mΩ - 22 MΩ range and 5W load capacity. Best resolution 1 μΩ, RTD temperature sensor simulation feature.
- Real resistors switched by relays
- 14 decade range, resolution from 1 μΩ
- Custom units and time sequences
- No residual resistance
- 5 W load capacity
- Six different languages
With the powerful modular LUMIMAX® LED Bar Lights test areas can be uniformly illuminated even from distances of more than 1 meter. The Bar Lights with integrated controller technology are available in different configurations for incident and backlight applications.
The modular bar lights expand the portfolio and include now bar lights of up to 4 meters for even larger test areas. Thanks to the modular concept, specific sizes can be realized quickly and without additional development costs. You can select standard versions using our product configurator. Please contact our sales team for special enquiries about customised lengths.
- Support for the highest speeds available in CoaXPress 2.0
- Connect to and capture from up to four cameras or combine connections for even higher data rates
- Simplify cabling with PoCXP support between cameras and vision computer
- Offload host computer of custom image processing using a field-programmable gate array (FPGA) device
- Distribute image processing workload across multiple computers through data forwarding capability
- Synchronize with sensors, encoders, and controllers with ample auxiliary I/Os for each CoaXPress connection
- Use license fingerprint for Aurora Imaging Library and avoid the need for a separate hardware key
- Monitor and troubleshoot acquisition performance in detail using Aurora Gecho event-logging tool
- DC-40 GHz bandwidth
- 10 ps rise time
- Low insertion and return loss
- 2 mils of tip-to-tip compliance
- High probing angle and clearance
- Accommodates a combination of up to four Cascade Microtech probes
- Configurable for mixed-signal RF/mmW testing
- Quick and easy repairs to be performed in the field, by simply replacing individual probes
- Adaptable to new device layouts by exchanging individual probes
Next Generation Wafer Probing
- Continues the Infinity family’s Industry leading electrical performance
- High temperature capability (175° C +) for automotive device characterization and other applications
- Better tip visibility for enhanced placement accuracy and repeatability
- Improved tip life/durability with solid rhodium contacts
- New tip architecture enables support for narrower pitches (e.g. 25um)
- Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness
- Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
- Application flexibility, ideal for use in high frequency applications
- Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
- Suitable for integration with vibration isolating tables
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.