• Compliant with IEC 61000-4-5 Ed.3 standard：ECE R10 is regulated at Ed.2, possible to switch to Ed.2
• AC500V/200A DC600V/200A built-in coupling decoupling network.
• Built-in EV relay welding protection diode in DC line. You can evaluate the lightning surge resistance when charging EV / PHV vehicles, which is required by ECE R10-04 / 05. (EV Fast Charging applicable)
• Maximum output voltage 15kV: In the reliability evaluation test of the lightning surge test, the evaluation including the destructive test can be performed.
• Adopt a large LCD screen operation panel: A large LCD panel screen has been adopted for the operation unit to improve visibility and operability.
• Employs MPU control that simplifies continuous testing: Surge output / waveform switching / polarity switching / sequence operation can be performed automatically.
• Equipped with manual and program modes. Manual mode for standard tests and single condition tests, and Program mode for continuous tests under different conditions. You can easily set test conditions according to your application.
• Excellent safety functions including interlock
• Equipped with waveform check terminal as standard
• You can check the output waveform with your oscilloscope and BNC cable.
• Isolation transformer required to protect the power supply for EUT is available. (option)
• Possible to switch the constant of the decoupling circuit in order to prevent resonance with the power supply.
• Possible to switch to a circuit not including 18uF in the surge output of IEC61000-4-5 Edition 2.0 2005 version).

* This product is a custom product. Please contact us for details.

Customization up to DC1000V is available.

Superior Mechanics

• Highly stable granite base
• Independent, coarse movement of X and Y axes, combined with easy fine adjustments
• Excellent measurement accuracy and repeatability
• Fast navigation and high-precision probe positioning

See "Specifications & Details" tab for more key features

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements

• Enables wafer probing up to 100 A pulsed and 10A DC
• Innovative multi-fingertip design provides even distribution of current
• Supports up to 500 V
• Replaceable Tungsten probe tips
• Temperature range of -60°C to 300°C
• Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
• Prevents against thermal runaway
• Measure devices on wafer at higher currents than ever before
• Small scrub minimizes damage to aluminum pad
• Small footprint – tip fits on a 1 mm pad

The LSProbe 1.2 Variant E Field Probe is a high-speed, high-accuracy, and high-dynamic range electric-Field probe.

• Its standard frequency range of 10 kHz – 8.2 GHz. 1,000 V/m
• Best-in-class compensation of linearity, frequency, and temperature guarantees accurate measurements from less than 0.1 to at least 1,000 V/m.
• A dynamic range of 100 dB is achieved for many frequencies, enabling Field measurements at more than 10,000 V/m.
• Customized high Field-strength „X“-variants, supporting up to 30,000 V/m and a damage level of 100,000 V/m, are available upon request.

High Intensity Bar Lights with a large degree of available customization: 

• 16 available wavelengths 
• Expandable in 6″ (150mm) increments up to 84″ (2.13m) 
• Optional heat sink for higher performance and/or high ambient temperatures 
• Optional light conditioning including polarization and diffusion 
• Optional IP65 rated sealing for washdown environments
• – 3 lens options for narrow, medium and wide beam spreads 

With the powerful modular LUMIMAX® LED Bar Lights test areas can be uniformly illuminated even from distances of more than 1 meter. The Bar Lights with integrated controller technology are available in different configurations for incident and backlight applications.

The modular bar lights expand the portfolio and include now bar lights of up to 4 meters for even larger test areas. Thanks to the modular concept, specific sizes can be realized quickly and without additional development costs. You can select standard versions using our product configurator. Please contact our sales team for special enquiries about customised lengths.

Flexibility

• DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
• Full thermal range of -60°C to +300°C
• Compatible with TopHat or IceShield
• Usage of manual and motorized positioners, probe cards within EMI-shielded environment
• Upgrade path to meet your future needs
• Stable and repeatable measurements over a wide thermal range

High accuracy and repeatability

• Reliable and repeatable contact
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Advanced EMI-shielding with PureLine and AttoGuard technologies available
• Superior low-leakage and low-noise measurements
• Safe and accurate hands-off testing
• Minimizes settling times for efficient measurements over full thermal range

See "Specifications & Details" tab for more key features

• Power bypass inductance: 8 nH
• Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
• Supports collinear and non-standard needle configurations
• Up to 16 DC for standard; maximum of 24 DC for custom
• Ideal for probing the entire circuit for functional test
• DC probes can provide power or slow logic to circuit under test