FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications
Customized Solutions for a Variety of Challenging Applications
Customization Examples

Waveguide with customized bracket

300 mm chuck with large tweezer pocket

RF positioner with micrometer screws

Double-side setup for emission microscopy

Combined microscope movement for scope and black body

mmW setup with North/South positioner platform
More Product Information

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Superior field confinement reduces unwanted couplings to nearby devices and transmission modes
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Superior measurement accuracy and repeatability
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Small scrub minimizes damage to aluminum pad
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Typical contact resistance < 0. 05 Ω on Al, <0.02Ω on Au
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Save valuable wafer space and reduce pad parasitics by being able to shrink pad geometries to 25 x 35 µ m (best case)

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Trigger over Ethernet
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Piecewise Linear HDR feature
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IEEE 1588 PTP
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Ultra-compact design
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Monochrome (G-030B) and color (G-030C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system cost
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IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
See the Customization and OEM Solutions webpage for additional options.

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Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
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Application flexibility, ideal for use in high frequency applications
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Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
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Suitable for integration with vibration isolating tables

- High dispersion for reflective surfaces and shorter working distances.
- Provides a narrower and less intense illumination area than the AL116.
- IP65 compliant washdown option is available, as are a wide spectrum of wavelengths.
- Available with polarization and diffusion light conditioning.
- This expandable compact bar light is pre-engineered for custom lengths in 2″ increments up to 40″.

The SPARTE 500 series, commonly mounted with a 4.4 reflector, is a top-of-the-line dual-axis antenna that spans dish sizes from 15 to 18 feet. This field-proven telemetry tracking antenna has been trusted by customers for their most mission-critical applications.
With a widespread presence on test ranges around the world, the SPARTE 500 series antennas excel in meeting the rigorous demands of various flight test scenarios, whether it’s for long-range aircraft, missiles or launch vehicles tests.
These antennas offer a streamlined design, ensuring easy operation and making them a perfect fit for any ground test range, working hand in hand with smaller range trackers.

The highly flexible modular GMDR system is a versatile and future-proof solution for acquisition, recording, dissemination and replay of FTI data in ground station applications.
With its high integration, incomparable range of supported video interfaces and full compatibility with global leading MDR products, the GMDR integrates seamlessly into customers‘ existing test range topologies.
With its intelligent data reduction through segmentation, pre-selection and filtering as well as the capability to freely disseminate subsets of data among several network destinations, GMDR efficiently reduces the operator‘s workload when analyzing test results.
For standard PCM/Ch7-Telemetry applications, two simplified, cost-efficient variants with integrated PCM/Ch7-Telemetry signal boards and one Data Express technology (DE50)- compatible storage media slot are available.

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Provides an effectively noise free environment around the device under test (DUT)
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World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
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Up to 4x faster flicker noise thermal testing on 30 μm pads
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Provides dark and dry environment for measuring light sensitive transistors, and devices at negative temperatures (<= -60°C) with frost free operation
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Provides fully managed and filtered AC power to the entire system – prober and instruments
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Filters harmful noise generated by external thermal control systems
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Reduced “antenna effect” injection of unwanted RF noise into the measurement path
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Provide up to 100dB attenuation (50Hz to 80Mhz) with 100mA max DC current handling
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Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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User-centered design minimizes training costs and enhances efficiency
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation

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Revolutionary technology advancement for wafer and die-level photonics probing
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Highest accuracy in test results
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New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
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Minimized coupling losses with minimal trench dimensions
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Industry standard for vertical coupling to wafer-level grating couplers
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Positioning hardware is precisely calibrated to the probe station and ready to perform die-to-die optical optimizations in minutes
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Dark, shielded and frost-free
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-40°C to +125°C
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Leveraging considerable expertise through an innovative engineering team
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Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
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Exclusive FormFactor-developed automated test methodology
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Automates manual tasks by integrating probe station machine vision capability with optical positioning and test equipment
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FormFactor-developed graphical user interface to manually control the optical positioning system
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Configurable between single fibers, fiber arrays and edge coupling holders

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Wafer temp verified <4.5 K (with 44 RF probes in contact)
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Magnetic field suppression to <200 nT
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Easy exchange of customizable probe cards
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Configurable for 150 mm, 200 mm and 300 mm wafers
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Options for fully automated wafer load or manual
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Complete software suite for manual, semi-auto, or fully automated probing
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25 wafer cassette capacity for fully automated testing
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~15 minute cooldown time per wafer

FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement

