An extensive range of optical, electrical and mechanical accessories for LUMIMAX® LED Lights simplify both adaptation to customer-specific requirements and the connection to the machine environment. The innovative solutions allow for compact, fast and easy integration of LUMIMAX® LED Lights. This saves additional design and mounting work, which means that significant cost savings can be achieved.

• Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
• Guarantees fully-guarded measurements to fA and fF levels
• Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
• Allows probing of different pad materials and sizes
• Fast replacement of worn probes without the need for tools

• Tackle demanding imaging applications using an eighth-generation Intel Core processor
• Capture directly from GigE Vision® and USB3 Vision® cameras
• Broaden support for Camera Link® , CoaXPress® , DisplayPort, HDMI, and SDI video interfaces using Zebra frame grabbers
• Customize I/O capabilities through four PCIe slots accepting full-height, half-length cards
• Install in space-limited industrial environments given its small footprint and rugged design
• Streamline application development using the Aurora Design Assistant flowchart-based IDE or the Aurora Imaging Library SDK
• Tackle machine vision applications with utmost confidence using field-proven tools for analyzing, locating, classifying, measuring, reading, and verifying
• Leverage machine learning including deep learning to categorize image content
• Ready for deep learning training with suitably equipped and configured model

Flexibility

• Different substrate carriers for wafers up to 100 mm or single dies
• Up to six positioners
• Use with liquid nitrogen or helium, depending on the target temperature
• Probing with an open chamber lid possible under atmospheric condition
• Specially designed for laboratory environments
• Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)

See "Specifications & Details" tab for more key features

• High Intensity: up to 9x brighter than the existing SL191 Pattern Projecting Spot Light and more than 3x brighter than the leading competitive structured light projector. 
• Projection patterns are easily configured with available reticles, including line, grid, cross, multiple lines, and half sphere, with custom reticles available. 
• Customizable: available in multiple wavelengths, including white. 
• Constructed with a large heat sink for improved LED thermal management to facilitate increased brightness while maintaining safe operating temperatures. 
• Ideal solution for machine vision inspection applications requiring structured illumination, including edge detection, locating offsets, and assessing topography. 
• Requires a reticle and lens (sold separately); see available reticles here.

• Probe loss is 3 dB typical between 140 and 200 GHz, S11/S22 15 dB typical
• Reduced unwanted couplings and transmission modes
• Able to shrink pad geometries to 25 x 35 µm (best case)
• Typical contact resistance < 0.05 Ω on Al, < 0.02 Ω on Au
• WR15, WR12, WR10, WR8, WR6, WR4, WR3, and WR2 bands available.

The LSProbe 1.2 Variant E Field Probe is a high-speed, high-accuracy, and high-dynamic range electric-Field probe.

• Its standard frequency range of 10 kHz – 8.2 GHz. 1,000 V/m
• Best-in-class compensation of linearity, frequency, and temperature guarantees accurate measurements from less than 0.1 to at least 1,000 V/m.
• A dynamic range of 100 dB is achieved for many frequencies, enabling Field measurements at more than 10,000 V/m.
• Customized high Field-strength „X“-variants, supporting up to 30,000 V/m and a damage level of 100,000 V/m, are available upon request.

Flexibility

• Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL
• Re-configurable and upgradable as requirements grow
• Minimizes setup times with no loss in performance or accuracy
• Seamless integration of various measurement instruments

Stability

• Solid station frame
• Built-in vibration-isolation solution for superior vibration attenuation
• Rigid microscope bridge
• Compact and rigid mechanical design
• Highly accurate measurement results
• Incorporates best-known methods

Ease of Use

• Ergonomic and straightforward design for comfortable and easy operation
• Low-profile design
• Simple microscope operation
• Quick and ergonomic change of DUT through pull-out stage
• Minimize training efforts
• Fast time to data
• Convenient operation