FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
For more information please contact your local sales representative.
Customization Examples
Waveguide with customized bracket
300 mm chuck with large tweezer pocket
RF positioner with micrometer screws
Double-side setup for emission microscopy
Combined microscope movement for scope and black body
mmW setup with North/South positioner platform
More Product Information
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Real resistors switched by relays
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Custom temperature scales
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No residual resistance
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0.01°C accuracy
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Six different languages
- Boost performance by up to 3x over its precursor thanks to an Intel x6000 series embedded processor
- Capture high-resolution images at high speed through a choice of CMOS sensors from two to 16 Megapixels
- Deploy in dirty, humid, or harsh industrial environments by way of a compact IP67-rated design
- Communicate actions and results to other automation and enterprise equipment via real-time digital I/Os, and Ethernet (TCP/IP, CC-Link IE Field Basic, EtherNet/IP™2, Modbus® , PROFINET® , and native robot interfaces)
- Handle Human-Machine Interface (HMI) function by way of VGA and USB connectivity
- Simplify vision setup and upkeep via integrated lens focusing and illumination intensity control
- Synchronize to the manufacturing line through the support for incremental rotary encoders
- Solve machine vision applications efficiently with Aurora Design Assistant by constructing flowcharts instead of writing program code
- Maintain control and independence through the ability to code custom flowchart steps
- Tackle machine vision applications with utmost confidence using field-proven tools for analyzing, locating, classifying, measuring, reading, and verifying
- Leverage deep learning for visual inspection through image classification and segmentation tools
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Can help to stabilize oscillations in high-gain devices
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Impedance match to low dynamic resistance laser diodes
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Custom configured for your application
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Load-lock chamber: Cycle devices 10X faster in a cryogenic environment
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High-density electrical interface at cryogenic temperatures: More pins on the device enables more test structures to be probed with a single cooldown
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Base temperature of < 2K or < 4K with high cooling power: Test devices at the temperatures that matter most for pre- screening and evaluating device performance
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Low vibration: Stable contact with the device under test and enables low noise measurements
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Substrate material: High-resistivity silicon
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Substrate thickness: 275 µm
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Dielectric constant: 11.8
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Nominal Z0: 50 Ω
- Support for the highest speeds available in CoaXPress 2.0
- Connect to and capture from up to four cameras or combine connections for even higher data rates
- Simplify cabling with PoCXP support between cameras and vision computer
- Offload host computer of custom image processing using a field-programmable gate array (FPGA) device
- Distribute image processing workload across multiple computers through data forwarding capability
- Synchronize with sensors, encoders, and controllers with ample auxiliary I/Os for each CoaXPress connection
- Use license fingerprint for Aurora Imaging Library and avoid the need for a separate hardware key
- Monitor and troubleshoot acquisition performance in detail using Aurora Gecho event-logging tool
- A real-time diagnostic tool supports EMC/EMI debugging.
- Fast visualize EMC/EMI problems.
- Enables easy comparison of countermeasures before and after.
- Capable of measurement from entire products to single components.
- Factor-editor function provides correction of antenna characteristics, cable loss and preamplifier.
- User friendly compact design.
- Customer supplied spectrum and probes acceptable (Please consult)
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Continues the Infinity family’s Industry leading electrical performance
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High temperature capability (175° C +) for automotive device characterization and other applications
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Better tip visibility for enhanced placement accuracy and repeatability
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Improved tip life/durability with solid rhodium contacts
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New tip architecture enables support for narrower pitches (e.g. 25um)
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Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness
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Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
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Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
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Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
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Calibration Monitor and Re-calibration – System will
continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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