High-voltage/current Probes

• On-wafer power device characterization up to 10,000 V DC / 600 A
• Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
• Increased isolation resistance and dielectric strength to provide full triaxial capability at high voltage (3,000 V) for low-leakage measurement

The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.

Linea SWIR features a cutting-edge InGaAs sensor in a compact package that is suitable for a wide variety of applications. With exceptional responsivity and low noise, this camera allows customers to see their products like never before. Linea SWIR is available as a 1k resolution camera with highly responsive 12.5 µm pixels, or a 512 resolution camera with larger 25 µm pixels.

• Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
• Even distribution of high current with innovative multi-fingertip design
• Compatible with TESLA 200/300 mm power device characterization system
• Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
• Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
• Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)

High Intensity Bar Lights with a large degree of available customization: 

• 16 available wavelengths 
• Expandable in 6″ (150mm) increments up to 84″ (2.13m) 
• Optional heat sink for higher performance and/or high ambient temperatures 
• Optional light conditioning including polarization and diffusion 
• Optional IP65 rated sealing for washdown environments
• – 3 lens options for narrow, medium and wide beam spreads 

• Custom electrical testing available upon request
• Wide package variety with custom configurations
• NC100 & 200 series for audio and RF applications
• NC300 & 400 series for microwave application

Noise diodes are the fundamental building blocks for analog noise systems. They are categorized for performance characteristics that enhance their broadband noise output and flat spectral response. All Maury noise diodes can deliver symmetrical white Gaussian noise and flat output power versus frequency*.

* Flatness and output power are dependent upon peripheral circuit characteristics

Flexibility

• Different substrate carriers for wafers up to 200 mm or single dies
• Probe cards and/or up to eight positioners
• Use with liquid nitrogen or helium, depending on the target temperature. Or use of cryo-cooler for dry-cooling option.
• Accessories available, such as black bodies and optical motion analysis tools
• Optional upgrade for 300 mm wafer
• Designed for industrial environments
• Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
• Ideal for small structures

See "Specifications & Details" tab for more key features

9 ppm AC/DC multifunction calibrator for multimeters , power meters and generally all kinds of electric meters. Implementing modular design, 9010+ can be further customized to calibrate oscilloscopes, insulation testers, sources and transducers.

• 9 ppm accuracy
• 400 MHz and 1.1 GHz scope options
• Power quality functions, voltage from current