• Low insertion loss
• Low contact resistance
• Lithographically defined probe tip  
• Nickel contacts

• Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
• Online design configuration tool helps you to specify your probe in minutes
• All designs are fully quadrant compatible
• Full solution includes probes, calibration substrates, stations, accessories and software
• Scalable architecture for future needs

• Probe loss is 3 dB typical between 140 and 200 GHz, S11/S22 15 dB typical
• Reduced unwanted couplings and transmission modes
• Able to shrink pad geometries to 25 x 35 µm (best case)
• Typical contact resistance < 0.05 Ω on Al, < 0.02 Ω on Au
• WR15, WR12, WR10, WR8, WR6, WR4, WR3, and WR2 bands available.

• Re-configurable for DC, RF, mmW, FA, WLR and more
• Thermal range: -60˚C to 300˚C available
• Upgrade path to meet your future needs
• Stable and repeatable measurements over a wide thermal range
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Advanced EMI-shielding with PureLine with AttoGuard technologies
• Best solution for low-noise and 1/f measurements
• Minimize AC and spectral noise
• Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range
• Locking roll-out stage
• Innovative microscope remote control
• Intuitive ergonomic stage controls
• Quick, safe, and comfortable wafer access
• Easy on-wafer navigation
• Fast setup and test data gathering
• Dedicated Velox version for manual probe stations
• AugmentedAlign tool with on screen markers for improved RF measurement accuracy

• DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
• Full thermal range of -60°C to +300°C
• Reliable and repeatable contact
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Enables full access to the chuck and the auxiliary sites
• Intuitive, and precise movement of chuck in X, Y, and Z-direction
• High thermal stability components
• On-axis probe-to-pad alignment
• Flexibility from hot only to full thermal range of -60°C to +300°C
• Thermally induced drift can be automatically re-aligned for 30 μm pads in a temperature range from -40°C to 150°C (the effective temperature range depends on pad size, probe card holder and probe card)
• 3 performance level configurations (fully-shielded / shielded / open)
• Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
• User-centered design minimizes training costs and enhances efficiency

The low frequency tuners are a unique product technology using MPT algorithms for low frequency wideband tuning. Three or more cascaded tuning sections use series transmission cables and parallel rotary capacitors.

The length of the cables and number of tuning sections are optimized for maximum tuning range over a given bandwidth. HLFT tuners use 6 tuning sections allowing second harmonic frequency tuning.

• Sample can be loaded or removed when the cryostat is cold
• High cooling power with sample in (He-3) liquid (400 mK with 400 microwatt cooling power)
• Sample probe and a load-lock with gate valve

• Fully isolated experiment space for true 4K temperatures during probing
• Cryogenic positioners to provide large travel ranges without warming up the device
• Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
• A soft vacuum bellows provides a compliant mounting interface for the cryocooler
• Quick release vacuum feedthroughs for easy configurability
• A large rectangular port for high signal capacity