FormFactor - Cascade Impedance Standard Substrates for ACP, Infinity, and FPC Probes
Impedance Standard Substrates (ISSs) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. Our ISSs offer the proven accuracy of LRRM calibrations with automatic load inductance compensation.
| GSG | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 50 to 75 | 162-641 | <td left"="" valign="middle" nowrap="nowrap align=" class="rtecenter">325 GHz* | Verification Lines [0.5, 1, 1.1, 1.4, 1.9, 2.3, 2.7, 3, 3.2, 3.8, 4.5,7,14,27,40] ps |
| 50 to 75 | 138-356 | 325 GHz* | |
| 50 to 150 | 104-909 | 67 GHz | Mix of GSG & GS/SG |
| 75 to 150 | 104-783 | 145 GHz* | |
| 100 to 150 | 114-456 | 67 GHz | For probes with contact widths < 30 um |
| 100 to 150 | 138-357 | 325 GHz* | |
| 100 to 250 | 143-033 | 145 GHz* | |
| 100 to 250 | 101-190 | 67 GHz | |
| 100 to 500 | 109-531 | 67 GHz | Right Angle standards; N-E, N-W, E-W |
| 250 to 1250 | 106-682 | 67 GHz | |
| 150 to 3000 | 108-010 | 67 GHz | Recommended > 1250 um pitch |
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1 Recommended upper frequency * Supports Probe for full range coaxial ranges up to 145 GHz and banded Waveguides to 145 GHz or 325 GHz |
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| GS/SG | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 50 to 150 | 104-909 | 67 GHz | Mix of GSG & GS/SG |
| 100 to 250 | 103-726 | 67 GHz | |
| 250 to 1250 | 106-683 | 67 GHz | |
| 150 to 3000 | 108-011 | 67 GHz | Recommended > 1250 um pitch |
| 1 Recommended upper frequency | |||
| GSGSG / THRU | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 100 to 125 | 129-239 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 150 | 126-102 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 150 to 225 | 129-240 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 250 | 129-241 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 300 to 650 | 129-248 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
| 700 to 1250 | 129-249 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
| 1 Recommended upper frequency | |||
| GSSG / THRU | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 100 to 150 | 129-246 | 67 GHz | Also supports SSG, GSS configurations |
| 175 to 250 | 129-247 | 67 GHz | Also supports SSG, GSS configurations |
| 300 to 950 | 129-248 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
| 1000 to 1250 | 129-249 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
|
1 Recommended upper frequency Wide Pitch: (> 250 um) differential / multiport calibration, additionally use the wide pitch, single-ended ISS (106-682 or 106-683) Narrow Pitch: For dual probe with pitches <100um, please use the matching singled-ended (GSG or GS / SG) ISS |
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| Multiple Config | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| Variable | 005-016 | Variable | General Purpose |
| 80 to 3000 | 106-686 | 67 GHz | General Purpose Membrane |
| 1 Recommended upper frequency | |||
More Product Information
The low frequency tuners are a unique product technology using MPT algorithms for low frequency wideband tuning. Three or more cascaded tuning sections use series transmission cables and parallel rotary capacitors.
The length of the cables and number of tuning sections are optimized for maximum tuning range over a given bandwidth. HLFT tuners use 6 tuning sections allowing second harmonic frequency tuning.
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Full-radius, nickel-plated tungsten needles
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Power bypass inductance: 16 nH
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Supports collinear and non-standard needle configurations
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Support up to a maximum of 12 ceramic blades DC needles / contacts
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Ideal for probing the entire circuit for functional test
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DC probes can provide power or slow logic to circuit under test
An impedance tuner is an apparatus, which generates controllable reflection factor (Impedance) over a certain frequency range. Focus uses two basic technologies:
a) For frequencies from 100MHz to 110GHz (and above) we use the slide screw technique (models Multi Harmonic MPT, wideband (fundamental) CCMT, harmonic rejection PHT), in which a reflective probe (slug) is inserted into the slot of a low loss slotted transmission line (slabline or waveguide).
b) For frequencies from below 10MHz to 170MHz we use a lumped element technology (models LFT), whereby variable capacitors are connected with optimized lengths of coaxial cable.
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
Transmission line probes are a special type of passive probe designed for use at very high frequencies. They replace the high impedance probe cable found in a traditional passive probe with a precision transmission line, with a characteristic impedance that matches the oscilloscope input (50 Ohm). This greatly reduces the input capacitance to a fraction of a picofarad, minimizing the loading of high frequency signals. A matching network at the tip increases the DC input resistance. While they have lower DC input resistance than a traditional passive probe (usually 500 Ohm) to 5 kOhm), the input impedance of these probes remains nearly constant over their entire frequency range. A traditional /10 passive probe will have a 10 MOhm) input impedance at DC, however this impedance drops rapidly with frequency, passing below the input impedance of a transmission line probe at less than 100 MHz.
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Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
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Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
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Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
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Calibration Monitor and Re-calibration – System will
continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.
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Best price per contact – typically over one million (1,000,000) touchdowns
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RF/Microwave signal is shielded and completely air isolated in the probe body
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Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
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Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
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Probe on any pad material with minimal damage
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Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
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Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
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Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
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Durable probe structure ensures more than 250,000 contacts
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Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications
Impedance Standard Substrates (ISSs) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. Our ISSs offer the proven accuracy of LRRM calibrations with automatic load inductance compensation.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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