FormFactor - Cascade Impedance Standard Substrates for ACP, Infinity, and FPC Probes
Impedance Standard Substrates (ISSs) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. Our ISSs offer the proven accuracy of LRRM calibrations with automatic load inductance compensation.
| GSG | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 50 to 75 | 162-641 | <td left"="" valign="middle" nowrap="nowrap align=" class="rtecenter">325 GHz* | Verification Lines [0.5, 1, 1.1, 1.4, 1.9, 2.3, 2.7, 3, 3.2, 3.8, 4.5,7,14,27,40] ps |
| 50 to 75 | 138-356 | 325 GHz* | |
| 50 to 150 | 104-909 | 67 GHz | Mix of GSG & GS/SG |
| 75 to 150 | 104-783 | 145 GHz* | |
| 100 to 150 | 114-456 | 67 GHz | For probes with contact widths < 30 um |
| 100 to 150 | 138-357 | 325 GHz* | |
| 100 to 250 | 143-033 | 145 GHz* | |
| 100 to 250 | 101-190 | 67 GHz | |
| 100 to 500 | 109-531 | 67 GHz | Right Angle standards; N-E, N-W, E-W |
| 250 to 1250 | 106-682 | 67 GHz | |
| 150 to 3000 | 108-010 | 67 GHz | Recommended > 1250 um pitch |
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1 Recommended upper frequency * Supports Probe for full range coaxial ranges up to 145 GHz and banded Waveguides to 145 GHz or 325 GHz |
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| GS/SG | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 50 to 150 | 104-909 | 67 GHz | Mix of GSG & GS/SG |
| 100 to 250 | 103-726 | 67 GHz | |
| 250 to 1250 | 106-683 | 67 GHz | |
| 150 to 3000 | 108-011 | 67 GHz | Recommended > 1250 um pitch |
| 1 Recommended upper frequency | |||
| GSGSG / THRU | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 100 to 125 | 129-239 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 150 | 126-102 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 150 to 225 | 129-240 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 250 | 129-241 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 300 to 650 | 129-248 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
| 700 to 1250 | 129-249 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
| 1 Recommended upper frequency | |||
| GSSG / THRU | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 100 to 150 | 129-246 | 67 GHz | Also supports SSG, GSS configurations |
| 175 to 250 | 129-247 | 67 GHz | Also supports SSG, GSS configurations |
| 300 to 950 | 129-248 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
| 1000 to 1250 | 129-249 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
|
1 Recommended upper frequency Wide Pitch: (> 250 um) differential / multiport calibration, additionally use the wide pitch, single-ended ISS (106-682 or 106-683) Narrow Pitch: For dual probe with pitches <100um, please use the matching singled-ended (GSG or GS / SG) ISS |
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| Multiple Config | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| Variable | 005-016 | Variable | General Purpose |
| 80 to 3000 | 106-686 | 67 GHz | General Purpose Membrane |
| 1 Recommended upper frequency | |||
More Product Information
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Intuitive, manual drives
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Front loading capability through load door
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Software control of chuck for fast step-and-repeat testing of the entire wafer
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Fast step-and-repeat testing of the whole wafer
See more Key Features on Specifications & Details tab
An impedance tuner is an apparatus, which generates controllable reflection factor (Impedance) over a certain frequency range. Focus uses two basic technologies:
a) For frequencies from 100MHz to 110GHz (and above) we use the slide screw technique (models Multi Harmonic MPT, wideband (fundamental) CCMT, harmonic rejection PHT), in which a reflective probe (slug) is inserted into the slot of a low loss slotted transmission line (slabline or waveguide).
b) For frequencies from below 10MHz to 170MHz we use a lumped element technology (models LFT), whereby variable capacitors are connected with optimized lengths of coaxial cable.
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
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Easy and fast setup of camera views
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Go to Light and Image Settings of the selected camera view with only one mouse click
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Guided workflows for wafer setups, alignment tools and Autonomous Assistants
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Workflow wizard shows task-relevant settings and options only
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Visualizes the progress of setup, alignment and measurement tasks
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Status information always at hand
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Informs the user about events, for example “Successful Alignment”
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Interacts with the user and helps with intelligent solutions
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For very complex wafer structures
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Enables automatic test of multiple devices in each die location before stepping to the next die
See more Key Features on Specifications & Details tab
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Combined eye-pieces and CCD camera mount
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3x zoom and quick lens exchange
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Engraved guides on mmW platen
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Supports broadband, load pull, coax RF and banded waveguide configuration
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Rock-solid mechanical design
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Submicron stage accuracy
See more Key Features on Specifications & Details tab
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Wafer temp verified <4.5 K (with 44 RF probes in contact)
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Magnetic field suppression to <200 nT
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Easy exchange of customizable probe cards
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Configurable for 150 mm, 200 mm and 300 mm wafers
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Options for fully automated wafer load or manual
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Complete software suite for manual, semi-auto, or fully automated probing
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25 wafer cassette capacity for fully automated testing
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~15 minute cooldown time per wafer
See more Key Features in Specifications & Details tab
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Low running costs, less vibration, less noise, reduced maintenance
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Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
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CMN calibrated thermometry on MC plate
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Operation via touch panel controller: Remote operation via ethernet interface
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Traceable, accurate and stable
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Low time constant
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Low temperature coefficient
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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