FormFactor - Cascade Impedance Standard Substrates for ACP, Infinity, and FPC Probes
Impedance Standard Substrates (ISSs) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. Our ISSs offer the proven accuracy of LRRM calibrations with automatic load inductance compensation.
| GSG | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 50 to 75 | 162-641 | <td left"="" valign="middle" nowrap="nowrap align=" class="rtecenter">325 GHz* | Verification Lines [0.5, 1, 1.1, 1.4, 1.9, 2.3, 2.7, 3, 3.2, 3.8, 4.5,7,14,27,40] ps |
| 50 to 75 | 138-356 | 325 GHz* | |
| 50 to 150 | 104-909 | 67 GHz | Mix of GSG & GS/SG |
| 75 to 150 | 104-783 | 145 GHz* | |
| 100 to 150 | 114-456 | 67 GHz | For probes with contact widths < 30 um |
| 100 to 150 | 138-357 | 325 GHz* | |
| 100 to 250 | 143-033 | 145 GHz* | |
| 100 to 250 | 101-190 | 67 GHz | |
| 100 to 500 | 109-531 | 67 GHz | Right Angle standards; N-E, N-W, E-W |
| 250 to 1250 | 106-682 | 67 GHz | |
| 150 to 3000 | 108-010 | 67 GHz | Recommended > 1250 um pitch |
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1 Recommended upper frequency * Supports Probe for full range coaxial ranges up to 145 GHz and banded Waveguides to 145 GHz or 325 GHz |
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| GS/SG | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 50 to 150 | 104-909 | 67 GHz | Mix of GSG & GS/SG |
| 100 to 250 | 103-726 | 67 GHz | |
| 250 to 1250 | 106-683 | 67 GHz | |
| 150 to 3000 | 108-011 | 67 GHz | Recommended > 1250 um pitch |
| 1 Recommended upper frequency | |||
| GSGSG / THRU | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 100 to 125 | 129-239 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 150 | 126-102 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 150 to 225 | 129-240 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 250 | 129-241 | 67 GHz | Also supports SGS, SGSG, GSGS configurations |
| 300 to 650 | 129-248 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
| 700 to 1250 | 129-249 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
| 1 Recommended upper frequency | |||
| GSSG / THRU | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| 100 to 150 | 129-246 | 67 GHz | Also supports SSG, GSS configurations |
| 175 to 250 | 129-247 | 67 GHz | Also supports SSG, GSS configurations |
| 300 to 950 | 129-248 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
| 1000 to 1250 | 129-249 | 67 GHz | General Purpose THRU substrate (Straight, Loop Back, Cross) |
|
1 Recommended upper frequency Wide Pitch: (> 250 um) differential / multiport calibration, additionally use the wide pitch, single-ended ISS (106-682 or 106-683) Narrow Pitch: For dual probe with pitches <100um, please use the matching singled-ended (GSG or GS / SG) ISS |
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| Multiple Config | |||
| Pitch (µm) | P/N | Frequency (GHz)1 | Note |
| Variable | 005-016 | Variable | General Purpose |
| 80 to 3000 | 106-686 | 67 GHz | General Purpose Membrane |
| 1 Recommended upper frequency | |||
More Product Information
Ultra Low Temperature
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Pulse tube cryocooler for cryogen free 4K temperatures
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Two stage ADR provides solid state cooling down to 30mK
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Sample stage mounting at both 1K and 50mK
Configurability
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Multiple stage feedthroughs for thermally intercepting the signals
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Two large electrical bread boards for more configurable space
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Rapid cool options for faster cooldowns
Built to Southwest Microwave’s rigorous performance and quality standards, the 1.0mm connectors are rugged and durable, featuring a 360° raised grounding ring and operational temperature rating of -55°C to +165°C. 1.0mm connectors provide mode-free operation through 110 GHz, offering well-matched impedance, excellent repeatability, and the industry’s lowest VSWR (1.2:1), insertion loss (0.6 dB), and RF leakage (≤ -100 dB).
Transmission line probes are a special type of passive probe designed for use at very high frequencies. They replace the high impedance probe cable found in a traditional passive probe with a precision transmission line, with a characteristic impedance that matches the oscilloscope input (50 Ohm). This greatly reduces the input capacitance to a fraction of a picofarad, minimizing the loading of high frequency signals. A matching network at the tip increases the DC input resistance. While they have lower DC input resistance than a traditional passive probe (usually 500 Ohm) to 1kOhm), the input impedance of these probes remains nearly constant over their entire frequency range. A traditional /10 passive probe will have a 10 MOhm) input impedance at DC, however this impedance drops rapidly with frequency, passing below the input impedance of a transmission line probe at less than 100 MHz.
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Revolutionary technology advancement for wafer and die-level photonics probing
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Real-time in-situ calibrations
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Highest accuracy in test results
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Lowest coupling loss
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New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
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Minimized coupling losses with minimal trench dimensions
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Industry standard for vertical coupling to wafer-level grating couplers
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Dark, shielded and frost-free
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-40°C to +125°C
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Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
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Exclusive FormFactor-developed automated test methodology
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FormFactor-developed graphical user interface to manually control the optical positioning system
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Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab
The low frequency tuners are a unique product technology using MPT algorithms for low frequency wideband tuning. Three or more cascaded tuning sections use series transmission cables and parallel rotary capacitors.
The length of the cables and number of tuning sections are optimized for maximum tuning range over a given bandwidth. HLFT tuners use 6 tuning sections allowing second harmonic frequency tuning.
The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.
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Low insertion loss
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Low contact resistance
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Lithographically defined probe tip
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Nickel contacts
See more Key Features on Specifications & Details tab
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Different substrate carriers for wafers up to 150 mm or single dies
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Up to six positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Ergonomic and straightforward design
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Intuitive, manual operation
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for probe platen
See more Key Features on Specifications & Details tab
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Continues the Infinity family’s Industry leading electrical performance
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High temperature capability (175° C +) for automotive device characterization and other applications
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Better tip visibility for enhanced placement accuracy and repeatability
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Improved tip life/durability with solid rhodium contacts
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New tip architecture enables support for narrower pitches (e.g. 25um)
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Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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