FormFactor - Cascade Multiline TRL Cal Substrates - Multiline TRL substrates for T-Wave probes
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Substrate material: High-resistivity silicon
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Substrate thickness: 275 µm
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Dielectric constant: 11.8
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Nominal Z0: 50 Ω
Millimeter- and submillimeter-wave calibration substrates, optimized for T-Wave™ probes. The multiline TRL calibration substrates offer CPW standards including reflect (short), thru and two lines and are recommended to use with WinCal XE™ calibration software. Some off-set short and off-set open structures are included for additional measurements.
Impedance Standard Substrate Maps
Part Number | Description | Pitch (μm) |
Multi-line TRL Substrate, WR1.0, WR2.2, WR3.4, WR4.3, WR5.1 |
25 | |
Multi-line TRL Substrate, WR2.2, WR3.4, WR4.3, WR5.1 | 50 | |
Multi-line TRL Substrate, WR3.4, WR4.3, WR5.1 | 75 and 100 |
More Product Information
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Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
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Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
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LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
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Automatic load inductance compensation function ensures the most repeatable calibrations
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Easy to use Probe to ISS/CSR matching tool
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Additional remoting methods
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Interface with Velox™ over LAN
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Pulse tube cryocooler for cryogen free 4K temperatures
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He-3 sorption cooler for high power intercept and launch stage for ADR
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Single stage ADR provides solid state cooling down to 25mK
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Sample stage mounting at both 300mK and 30mK
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Multiple stage feedthroughs for thermally intercepting the signals
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Two large electrical bread boards for more configurable space
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Rapid cool options for faster cooldowns
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![FormFactor - Kilimanjaro 125 - Chip-scale semi-automated 4K probe station with vibration isolation FormFactor - Kilimanjaro 125 - Chip-scale semi-automated 4K probe station with vibration isolation](/sites/default/files/styles/max_325x325/public/hpd-kilimanjaro125_top.png?itok=h_xvnKcb)
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Fully isolated experiment space for true 4K temperatures during probing
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Cryogenic positioners to provide large travel ranges without warming up the device
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Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
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A soft vacuum bellows provides a compliant mounting interface for the cryocooler
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Quick release vacuum feedthroughs for easy configurability
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A large rectangular port for high signal capacity
![FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads](/sites/default/files/styles/max_325x325/public/probe-hcp.png?itok=BUBTX-HZ)
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Enables wafer probing up to 100 A pulsed and 10A DC
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Innovative multi-fingertip design provides even distribution of current
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Supports up to 500 V
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Replaceable Tungsten probe tips
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Temperature range of -60°C to 300°C
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Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
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Prevents against thermal runaway
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Measure devices on wafer at higher currents than ever before
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Small scrub minimizes damage to aluminum pad
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Small footprint – tip fits on a 1 mm pad
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Best price per contact – typically over one million (1,000,000) touchdowns
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RF/Microwave signal is shielded and completely air isolated in the probe body
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Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
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Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
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Probe on any pad material with minimal damage
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32GTps, PCIe 5.0 data rate operation. Fully compatible with other PCIe data rates of 2.5, 5.0, 8.0 and 16 GTps
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Link widths to 16-lanes, including 1-, 2-, 4-, 8-lanes
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256GB memory (128GB upstream and 128GB downstream)
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Memory segmentation for capture of multiple traces
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Host-Client connection for remote debugging using Ethernet or local debugging using USB
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SMB capture and trigger for NVMe Management Interface (NVMe-MI) observability
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Simultaneous capture of multiple links is allowed with multiple simultaneous users
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Decodes all PCIe, NVMe and CXL traffic at all layers of the stack including the TLP, DLLP, and PHY layer packets
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Flexible trigger events include training sequences, ordered sets, queue pairs, PRPs, SGL, SMB, etc.
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Cascade captures from up to four Xgig chassis into a single trace view
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Full support of PCI Express LTSSM analysis
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Field replaceable power supply
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LEDs give quick indicators of power and link status
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Includes one-year hardware and three-year software warranties
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Works with the VIAVI Xgig software tool suite: Trace Control, Trace View, Expert™, Serialytics™
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Supported by a wide variety of Interposers (CEM, U.3, etc.)
![FormFactor - Cascade DC-Q Probe - Multi-contact DC probe with flat tip needles FormFactor - Cascade DC-Q Probe - Multi-contact DC probe with flat tip needles](/sites/default/files/styles/max_325x325/public/probe-dcq.png?itok=YlQWOMIe)
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Power bypass inductance: 8 nH
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Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
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Supports collinear and non-standard needle configurations
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Up to 16 DC for standard; maximum of 24 DC for custom
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Ideal for probing the entire circuit for functional test
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DC probes can provide power or slow logic to circuit under test
![FormFactor - Cascade DCP 100 Series Probe - Delivers superior guarding and shielding FormFactor - Cascade DCP 100 Series Probe - Delivers superior guarding and shielding](/sites/default/files/styles/max_325x325/public/probe-dcp100.png?itok=vnMVO9A2)
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High-quality construction with low-noise electrical performance
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Kelvin version for convenient 4-point measurements
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Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
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SSMC 50 connectors
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Ultra-low, fA and fF measurements from -65 º C to 150 º C
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FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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