FormFactor - HPD Kilimanjaro 1260 - Chip-scale semi-automated 4K probe station with large experiment space and vibration isolation
-
Fully isolated experiment space for true 4K temperatures during probing
-
Cryogenic positioners to provide large travel ranges without warming up the device
-
Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
-
A soft vacuum bellows provides a compliant mounting interface for the cryocooler
-
Quick release vacuum feedthroughs for easy configurability
-
A large rectangular port for high signal capacity
See more Key Features in Specifications & Details tab
Large Ultra Low Vibration Chip-scale Probe Station for Conducting High-Accuracy Measurements at True 4K Cryogenic Temperatures
The HPD Kilimanjaro 1260 is a superior 4K solution to meet all your probing needs in an ergonomic low vibration system. Like the Kilimanjaro 125, this system addresses problems such as long turnaround times, high noise, and low signal capabilities. FormFactor’s superior knowledge of probing solutions and cryogenic systems puts us in the best position to help you meet your goals.
In addition to the applications that the Kilimanjaro 125 supports. The larger experimental volume enables larger 4K applications like scanning microscopy. The Kilimanjaro 1260 was used to deploy the Scanning SQUID Microscope (SSM).
This system employs a range of thermal isolation techniques to take full advantage of all the cooling power available. Using the same design as the Kilimanjaro 122 we achieve a true 4K system with a temperature stability 5mK.
Mechanical vibration is also a major issue for probing applications. Large displacements can cause damage to the sample and induce noise into the measurement. Triboelectric noise is also induced into the signals when mechanical vibrations travel through the cables. Utilizing the same methods of the Kilimanjaro 125, this system achieves a probe to DUT displacement of less than 50nm RMS.
Designed with customization in mind and with a larger stage design, the Kilimanjaro 1260 provides more configurable ports to get your signals to your sample. There are multiple easily accessible vacuum feedthroughs, and many light blocking ports in each stage plate. This approach makes it simple to address whatever signal (DC, RF, FO) capabilities you may need.
The HPD Kilimanjaro 1260 offers true 4K measurement during all probing operations in an ultra low vibe system. It is a robust and reliable system, which offers a broad array of optional features. Multiple upgrade paths ensure this system will fulfill many future needs.
Applications: Photonic QC, Spin QC, Cryo-CMOS, Scanning Microscopy
Cryogenic Temperatures
- Fully isolated experiment space for true 4K temperatures during probing
- Cryogenic positioners to provide large travel ranges without warming up the device
- Integrated helium pot for high temperature stability of the device under test
- Fully dry cryogen-free cooler eliminates the need for expensive helium circulation systems
- Rapid cool liquid nitrogen option for faster cool down times
Low Vibration
- Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
- A soft vacuum bellows provides a compliant mounting interface for the cryocooler
- Rigid support tube to direct vibrations from the cryocooler away from the sample
Configurability
- Quick release vacuum feedthroughs for easy configurability
- A large rectangular port for high signal capacity
- Multiple stage feedthroughs for thermally intercepting the signals
- Large experimental space provides more workroom and configurable ports
- Many available system options and add ons to choose from
More Product Information
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements
-
Continues the Infinity family’s Industry leading electrical performance
-
High temperature capability (175° C +) for automotive device characterization and other applications
-
Better tip visibility for enhanced placement accuracy and repeatability
-
Improved tip life/durability with solid rhodium contacts
-
New tip architecture enables support for narrower pitches (e.g. 25um)
-
Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness
-
Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
-
Application flexibility, ideal for use in high frequency applications
-
Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
-
Suitable for integration with vibration isolating tables
-
Fully isolated experiment space for true 4K temperatures during probing
-
Cryogenic positioners to provide large travel ranges without warming up the device
-
Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
-
A soft vacuum bellows provides a compliant mounting interface for the cryocooler
-
Quick release vacuum feedthroughs for easy configurability
-
A large rectangular port for high signal capacity
See more Key Features in Specifications & Details tab
-
Low running costs, less vibration, less noise, reduced maintenance
-
Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
-
CMN calibrated thermometry on MC plate
-
Operation via touch panel controller: Remote operation via ethernet interface
-
Accommodates a combination of up to four Cascade Microtech probes
-
Configurable for mixed-signal RF/mmW testing
-
Quick and easy repairs to be performed in the field, by simply replacing individual probes
-
Adaptable to new device layouts by exchanging individual probes
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
-
Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
-
Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
-
LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
-
Automatic load inductance compensation function ensures the most repeatable calibrations
-
Easy to use Probe to ISS/CSR matching tool
-
Additional remoting methods
-
Interface with Velox™ over LAN
-
Revolutionary technology advancement for wafer and die-level photonics probing
-
Highest accuracy in test results
-
New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
-
Minimized coupling losses with minimal trench dimensions
-
Industry standard for vertical coupling to wafer-level grating couplers
-
Positioning hardware is precisely calibrated to the probe station and ready to perform die-to-die optical optimizations in minutes
-
Dark, shielded and frost-free
-
-40°C to +125°C
-
Leveraging considerable expertise through an innovative engineering team
-
Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
-
Exclusive FormFactor-developed automated test methodology
-
Automates manual tasks by integrating probe station machine vision capability with optical positioning and test equipment
-
FormFactor-developed graphical user interface to manually control the optical positioning system
-
Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
Document
