FormFactor - Cascade InfinityXT Probe - Next-generation, high-frequency performance with advanced features
-
Continues the Infinity family’s Industry leading electrical performance
-
High temperature capability (175° C +) for automotive device characterization and other applications
-
Better tip visibility for enhanced placement accuracy and repeatability
-
Improved tip life/durability with solid rhodium contacts
-
New tip architecture enables support for narrower pitches (e.g. 25um)
-
Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness
Introducing the InfinityXT probe series. InfinityXT enhances and extends FormFactor’s industry-leading Infinity probe family, which has set the benchmark for accuracy and repeatability in the device characterization and modeling community for more than a decade. The new InfinityXT series advances the industry standard with higher temperature range, better tip visibility and durability, and support for narrower pitches as the market evolves.
Recently, the industry has experienced explosive growth in the RF and microwave devices, driven by the automotive, mobile communications/5G and IoT device markets. The development of the new InfinityXT probe has been guided by the requirements of these high-growth markets. The requirements include ultra-wide bandwidth and wide temperature ranges for device modeling and characterization. Device measurements for modeling is one of the most demanding on-wafer measurement applications, requiring extremely high measurement accuracy and repeatability, since extracted parameters are highly sensitive to very slight differences.
Document
Document
More Product Information
-
Sample can be loaded or removed when the cryostat is cold
-
High cooling power with sample in (He-3) liquid (400 mK with 400 microwatt cooling power)
-
Sample probe and a load-lock with gate valve
-
Best price per contact – typically over one million (1,000,000) touchdowns
-
RF/Microwave signal is shielded and completely air isolated in the probe body
-
Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
-
Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
-
Probe on any pad material with minimal damage
-
Load-lock chamber: Cycle devices 10X faster in a cryogenic environment
-
High-density electrical interface at cryogenic temperatures: More pins on the device enables more test structures to be probed with a single cooldown
-
Base temperature of < 2K or < 4K with high cooling power: Test devices at the temperatures that matter most for pre- screening and evaluating device performance
-
Low vibration: Stable contact with the device under test and enables low noise measurements
-
Ease of use – Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
-
Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
-
Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
-
Full-radius, nickel-plated tungsten needles
-
Power bypass inductance: 16 nH
-
Supports collinear and non-standard needle configurations
-
Support up to a maximum of 12 ceramic blades DC needles / contacts
-
Ideal for probing the entire circuit for functional test
-
DC probes can provide power or slow logic to circuit under test
-
Provides an effectively noise free environment around the device under test (DUT)
-
World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
-
Up to 4x faster flicker noise thermal testing on 30 μm pads
-
Provides dark and dry environment for measuring light sensitive transistors, and devices at negative temperatures (<= -60°C) with frost free operation
-
Provides fully managed and filtered AC power to the entire system – prober and instruments
-
Filters harmful noise generated by external thermal control systems
-
Reduced “antenna effect” injection of unwanted RF noise into the measurement path
-
Provide up to 100dB attenuation (50Hz to 80Mhz) with 100mA max DC current handling
-
Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
-
Enables full access to the chuck and the auxiliary sites
-
Intuitive, and precise movement of chuck in X, Y, and Z-direction
-
User-centered design minimizes training costs and enhances efficiency
-
Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
See more Key Features on Specifications & Details tab
-
Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material
-
DC to 110 GHz models available in single and dual line versions
-
Low insertion and return loss with ultra-low-loss ( -L ) versions
-
Excellent crosstalk characteristics
-
Wide operating temperature -65 ° C to + 200 ° C
-
Wide range of pitches available, from 50 to 1250 µm
-
Individually supported contacts
-
Reduced contact (RC) probe tips for small pads
-
BeCu tip provides rugged, repeatable contact on gold pads
-
Revolutionary technology advancement for wafer and die-level photonics probing
-
Real-time in-situ calibrations
-
Highest accuracy in test results
-
Lowest coupling loss
-
New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
-
Minimized coupling losses with minimal trench dimensions
-
Industry standard for vertical coupling to wafer-level grating couplers
-
Dark, shielded and frost-free
-
-40°C to +125°C
-
Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
-
Exclusive FormFactor-developed automated test methodology
-
FormFactor-developed graphical user interface to manually control the optical positioning system
-
Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab
-
Accommodates a combination of up to four Cascade Microtech probes
-
Configurable for mixed-signal RF/mmW testing
-
Quick and easy repairs to be performed in the field, by simply replacing individual probes
-
Adaptable to new device layouts by exchanging individual probes
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
Document
