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Our High Intensity Linear Backlights offer 510 kLux output, perfect for back-lit, line-scanning applications.
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Available in pre-engineered sizes from 6” (152mm) to 96” (2438mm) in 6″ increments.
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A 3″ (75mm) length option is also available. Available intensity control provides illuminance adjustability for every 6″ increment via a 0 – 10v input
FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
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Enables wafer probing up to 100 A pulsed and 10A DC
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Innovative multi-fingertip design provides even distribution of current
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Supports up to 500 V
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Replaceable Tungsten probe tips
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Temperature range of -60°C to 300°C
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Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
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Prevents against thermal runaway
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Measure devices on wafer at higher currents than ever before
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Small scrub minimizes damage to aluminum pad
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Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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More Product Information
- Tiny “all-in-one” solution: no external control board needed
- Superior image quality: sub-micron lens movement with very low tilt. Now with higher dynamic stability
- Low voltage & power: 3.3 VDC input, zero power position hold
- Simple system integration: accepts high-level motion commands over standard serial interface (I2C or SPI)
- Flexible, production-ready system: compatible with M8 to M16 lenses and with typical image formats from 1/3” to 1/1.8”
- Lowest cost, fastest time to market: Fully-engineered “plug and play” solution
- S-parameters DC to 40 GHz, single-ended and mixed-mode
- Impedance Profile with <1 mm resolution, differential and common-mode
- Internal, automatic OSLT calibration
- USB-connected, small, lightweight
- Flexible display of the measurements
- Remove effects from fixtures, connectors and cables
- Emulate eye diagrams with CTLE, DFE and FFE equalization
- Advanced jitter analysis
The new, next-generation FOX platform allows the company to exceed the high quality standards that its customers have come to expect. Minimal leakage current means that FRIWO's power supply units are also ideally suited for use with measurement technologies, because they prevent unwanted influences that distort measured values. The FOX product family already meets the U.S. Department of Energy's stringent 2016 DOE energy-efficiency standards, which include stricter requirements regarding the efficiency and standby loss of power supply units. The harmonization of European thresholds with the U.S. standard in 2017 is currently under discussion. As a result, FRIWO already offers devices that exceed future statutory requirements, ensuring the worldwide use of your application. Choosing FOX today is an investment in the future, offering security tomorrow and beyond.
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
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Fast Camera Link InGaAs SWIR camera
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VGA resolution
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Compact industrial design, no fan
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Simple camera configuration via GenCP
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Compact industrial design Up to 303 fps at full resolution Camera Link interface with GenCP support Comprehensive I/O control options Automated on-boa
Alvium G1 provides the highest image quality in a future-proof package.
Benefit from a rich feature set and a highly flexible platform!
- Reliability: Established GigE Vision standard
- Future-proof design: Based on latest technology standards ensuring long-term availability
- Extraordinarily small size: 41 mm × 29 mm × 29 mm (Closed Housing)
- Various sensors: Select between CMOS sensors from ON Semi and Sony
- Industrial-grade hardware: With its compact housing and industrial standard hardware, it can easily be integrated into any vision system.
- Easy upgrade: If your application ever needs a performance boost, you can simply upgrade it with an Alvium G5 camera.
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DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
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Full thermal range of -60°C to +300°C
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Reliable and repeatable contact
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Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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High thermal stability components
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On-axis probe-to-pad alignment
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Flexibility from hot only to full thermal range of -60°C to +300°C
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Thermally induced drift can be automatically re-aligned for 30 μm pads in a temperature range from -40°C to 150°C (the effective temperature range depends on pad size, probe card holder and probe card)
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3 performance level configurations (fully-shielded / shielded / open)
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
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User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
Our EuroBrite™ lineup outdoes the competition in so many ways. With more features at a competitive price point, there’s no better value in machine vision lighting:
- Complete built-in control for continuous and strobe modes.
- Adaptive Power™, a feature of the EuroBrite™ lighting controller, utilizes an onboard thermistor to maximize light output in continuous mode.
- Adaptive Overdrive,™ another feature of the EuroBrite™ lighting controller, provides a maximal output pulse in strobe mode regardless of the exposure period.
- IP67 sealed enclosure suitable for washdown environments.
- Rugged construction that has been tested to withstand over 1000lb.
- Industrial grade LEDs providing high-intensity surface illumination of 38klux.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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