FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads

  • Enables wafer probing up to 100 A pulsed and 10A DC
  • Innovative multi-fingertip design provides even distribution of current
  • Supports up to 500 V
  • Replaceable Tungsten probe tips
  • Temperature range of -60°C to 300°C
  • Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
  • Prevents against thermal runaway
  • Measure devices on wafer at higher currents than ever before
  • Small scrub minimizes damage to aluminum pad
  • Small footprint – tip fits on a 1 mm pad

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