FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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More Product Information
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-Noise Binning Mode
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Smear reduction
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Shading correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 32 dB)
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Auto exposure (39 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation, color correction
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Reverse X
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count)
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Storable user sets
Southwest Microwave offers an array of field replaceable cable connectors, direct solder cable connectors and direct solder flange mount cable terminations. Contact us for high-performance .047, .086 and .141 flex cable assemblies or harnesses up to 110 GHz, delivering the industry’s lowest VSWR and insertion loss.
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
-
Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (74 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
Scope of delivery
- Camera and IEEE 1394b cable (other configurations on request)
- Substrate material: High-resistivity silicon
- Substrate thickness: 275 µm
- Dielectric constant: 11.8
- Nominal Z0: 50 Ω
KapCOM (EWC33) is a new generation of transceivers with high performance Telemetry, Tracking & Command (TT&C) service. It is used on OneWeb constellation & is based on the heritage of EWC15 used in key space missions like ROSETTA, DEEP IMPACT, …
The laboratory and research industry faces unique challenges including long-standing, legacy pain points and frequently evolving needs. These include paramount safety and regulatory requirements for lab workers and patients alike, the need for high containment and sterility, and the integration of cutting-edge technologies. Complex and sensitive facilities require specialized testing solutions to ensure compliance, safety, and reliability. Effective planning and laboratory design and construction are crucial to creating environments that support advanced research and manufacturing processes, especially in the pharmaceutical and medical device sectors.
- Accurate & reliable time data from a trusted source
- Remote configuration and status via web browser, remote monitoring with SNMP
- Synchronization between users – eradicates discrepancies
- System time stamping, such as e-commerce transactions, e-mail sent & received, is highly accurate
- Automatic systems procedures such as backups occur at the correct time and in the correct order
- Additional time signal outputs can feed to other systems
- Multiple time source fall back and priority configuration can ensure high synchronization availability
- Various oscillator choices allow for long holdover to maintain time accuracy when synchronization signals are absent
- Supports the latest 5G FR1 and IEEE 802.11ax standards
- Up to 1GHz active load pull bandwidth capability
- Test the latest high bandwidth and high modulation cellular standards such as 1024QAM 802.11ax
- This system can be used in all parts of the design cycle
- Initial device characterisation
- MMIC or PA design
- Design verification testing
- Product testing in the factory.
- HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s
- Up to 5 Gpts of acquisition memory enables detailed viewing of long events
- 15.6" 1900 x 1080 Full HD capacitive touchscreen
- New ProBus2 input supports up to 8 GHz bandwidth and direct compatibility with a wide variety of existing ProBus probes - 50Ω and 1MΩ coupling modes support all input types on a single connector
- MAUI with OneTouch user interface for intuitive and efficient operation
- Deep toolbox enables and simplifies complex analysis
- Intuitive navigation to quickly find important features in long waveforms
- Zone Trigger – Simple Triggering for Complex Signals
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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