FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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- High Power Density: Up to 15 kW in 3U, 30 kW in a 6U chassis
- Wide Voltage Range: 0-10V up to 0-1000V, from 4 to 30 kW
- Fast Load Transient Response: Protection from undesired voltage excursions
- Low Ripple and Noise
- Intuitive Touch Screen Display
- Parallelable up to 150 kW
- Sequencing: Free system controller & speed up test
- Low audible noise: Temperature controlled variable speed fans
The D19-GT/-GTS Download Station ensures a secure and high-speed data download (via 40 Gbit Ethernet) from MDR or MDR-GT/-GTS storage media. Specifically designed for flight testing applications with demanding data rates and storage needs, the D19-GTS, when paired with MDR-GTS, incorporates advanced cybersecurity features like Data-At-Rest (DAR) protection and firmware updates. Configuration changes are facilitated through a Removable Secure Operational Disk (RSOD).
- Built to Endure: Engineered with military-grade durability, IntelliShield is designed to withstand extreme temperatures, humidity, dust, and vibration. This high-temperature UPS ensures your critical systems continue to operate in the most harsh environments.
- Mission-Critical Reliability: Trusted in military and industrial applications, IntelliShield provides uninterrupted power backup to safeguard against power disruptions that could affect your operations.
- Seamless Integration: The IntelliShield can be easily and seamlessly integrated into your existing infrastructure with minimal downtime. Our units are designed for easy installation and compatibility with a wide range of equipment, it ensures power stability and smooth transitions.
- Extended Power Backup: With extended battery backup options, IntelliShield ensures your operations stay online during prolonged power outages, giving you the time needed to safely shut down systems or maintain productivity until power is restored.
- Peace of Mind Support: Our dedicated customer support team is available to assist from installation to End-of-Life, ensuring your Rugged UPS performs when you need it most.
- Smart Stage: Embedded controller, no separate electronics
- Operate directly using I2C or SPI ASCII commands -or-
- Evaluate with Pathway™ PC Software and USB adapter
- Cost-effective, long-life: For high-volume production
- Small size: 32 x 32 x 10 mm
- High resolution: 0.5 μm with absolute encoding
- High speed: 35 mm/s
- Long stroke: 8 mm
- Power: 5 V DC input, ~ 3.2 W peak when moving
- High repeatability: (± 2 μm typical)
Three Probe Technologies
- Infinity Probe: best for Al (Si)
- ACP Probe: best for AU (III-Vs)
- |Z| Probe: robust solution (long lifetime)
- Precision contact on a wide variety of materials from 26 GHz to 67 GHz
- Accurate results with excellent crosstalk
- Matching cables and substrates included
Precise Contact Solution
- RF chuck ±3 μm surface planarity
- Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
- Precision probe alignment
- Consistent contact force and overtravel
- Stable contact performance
WinCal Calibration Software
- Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
- Automated calibration monitoring
- Unique measurement & analysis methods
- Accurate S-parameter measurements
- Automatic calibration setup for higher efficiency
- Fast and easy data interpretation and reporting
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Fast Camera Link InGaAs SWIR camera
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VGA resolution
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Compact industrial design, no fan
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Simple camera configuration via GenCP
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Compact industrial design
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Up to 301 fps at full resolution
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Camera Link interface with GenCP support
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Comprehensive I/O control options
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Automated on-board image correction
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Stabilized sensor cooling, no fan
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Extended operating temperature range
- 4 Independent Channels, 1 Output Connector
- Includes built-in pre-programmed sequencing.
- Provides control for computational imaging, including photometric stereo, extended depth of field, combined bright field + dark field, high dynamic range, and high resolution color.
- Ideal for multi-channel lights and multi-light stations. Due to power output constraints, some configurable light lengths may be limited.
- Housed within a compact enclosure with DIN rail mounting.
- Driven with SignaTech™ for improved safety and easy operation.
NOTE: NOT COMPATIBLE WITH C1 CONNECTORS
The broadband horn antenna BBHA 9120 J is a linear polarized high gain antenna. The gain increases from 11 dBi at 1GHz up to more than 20 dBi at higher frequencies.
- 800 MHz to 6.2 GHz
- N (optional 7/16)
- Gain 11 dBi - 20 dBi
SCANFLEX II CUBE is the new generation modular JTAG/Boundary Scan controller. Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new ways for the Embedded JTAG Solutions. The multifunctional architecture of the SCANFLEX II CUBE allows users to combine numerous technologies flexibly and with high performance on a single platform.
- 8 independent and parallel Test Access Ports (TAP) for up to 100 MHz
- Synchronized operation of embedded test, debugging and programming
- Programmable multifunctional 64 channel I/O signal unit
- Programmable TAP protocols for numerous processor debug interfaces
- Support of up to 31 parallel controlled SCANFLEX I/O modules
- Controllable via USB 3.0 and GBit LAN
FormFactor, Inc.
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FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
