FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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- Combine up to 16 SPDT or 8 multiport, high-performance relays in a 2U footprint
- Latching/Terminated options (EX7204L)
- LXI/LAN and USB command and control options
- Embedded web interface provides interactive utility to monitor and control relays from anywhere in the world
- Flexible API supports IVI and Linux development environments minimizing software investment
- LXI trigger event implementation provides seamless test synchronization with external devices
- Store up to 128 relay configurations for quick recall, including automatic power-up state
The highly flexible modular GMDR system is a versatile and future-proof solution for acquisition, recording, dissemination and replay of FTI data in ground station applications.
With its high integration, incomparable range of supported video interfaces and full compatibility with global leading MDR products, the GMDR integrates seamlessly into customers‘ existing test range topologies.
With its intelligent data reduction through segmentation, pre-selection and filtering as well as the capability to freely disseminate subsets of data among several network destinations, GMDR efficiently reduces the operator‘s workload when analyzing test results.
For standard PCM/Ch7-Telemetry applications, two simplified, cost-efficient variants with integrated PCM/Ch7-Telemetry signal boards and one Data Express technology (DE50)- compatible storage media slot are available.
- High speed 60 kHz x3 (Color) or 120 kHz (Mono), and high resolution 28 μm or 900 dpi
- No missing or interpolated pixels
- Exposure control
- RGB colors (Color) or Mono/HDR mode
- Precalibrated pixel size for metrology applications
- Camera Link HS fibre interface
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (31 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
Scope of delivery
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Camera and IEEE 1394b cable (other configurations on request)
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High spatial resolution
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IEEE 1588 PTP
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Power over Ethernet
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Defect pixel masking
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Monochrome (GT6400) and color (GT6400C) models
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
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Comprehensive I/O functionality for simplified system integration
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Planarity adjusted (PA) EF Lens Mount (option -18) for electronic control of aperture and autofocus
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Easy camera mounting via standard M3 threads at all sides and 1/4-20 tripod mounting hole
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
Floating Action Buttons
- Easy and fast setup of camera views
- Go to Light and Image Settings of the selected camera view with only one mouse click
Workflow Wizard
- Guided workflows for wafer setups, alignment tools and Autonomous Assistants
- Workflow wizard shows task-relevant settings and options only
- Wizard settings can be corrected anytime – no need to restart the wizard
- Wizard helps with intelligent solutions in case of error
See "Specifications & Details" tab for more key features
- Easy to Use
- No need to break the circuit or insert a shunt
- Small form factors for use on crowded boards
- Variety of Applications
- Bandwidths up to 100 MHz
- Peak currents up to 700 A
- Sensitivities down to 1mA/div
- High Precision Measurements
- Low frequency accuracy of 1%
- Integrated autozero capability
- Fully Integrated with Teledyne LeCroy Oscilloscope
- No additonal hardware is required
- Power is supplied from oscilloscope ProBus connection
- Automatic display of waveforms in Amps and calculated power traces scaled correctly in Watts
- Degauss and Autozero directly from oscilloscope user interface
- DCS025 Deskew Calibration Source
- Provides ability to precisely deskew most voltage probes along with 30, 150 and 500A current probes
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Affordable GigE Vision InGaAs SWIR camera
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QVGA resolution
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Power over Ethernet
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Compact industrial design, no fan
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Up to 344 fps at full resolution
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GigE Vision interface with PoE+
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Comprehensive I/O control options
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Automated on-board image correction
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Stabilized sensor-cooling, no fan
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Extended operating temperature range
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-Noise Binning Mode
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Smear reduction
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Shading correction
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Area of interest (AOI), separate AOI for auto features
-
Binning
-
Decimation
-
Auto gain (manual gain control: 0 to 32 dB)
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Auto exposure (39 µs to 67 s)
-
Auto white balance
-
Look-up table (LUT)
-
Hue, saturation, color correction
-
Reverse X
-
Deferred image transport
-
Trigger programmable, level, single, bulk, programmable delay
-
Sequence mode (changes the camera settings on the fly)
-
SIS (secure image signature, time stamp for trigger, frame count)
-
Storable user sets
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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