FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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- Redundant design with multiple signal paths built in for high-availability.
- 12 expansion slots in the 2U version and 5 expansion slots in the 1U variant.
- Industry-first GPS integrity checking
- Unique optical crosslink architecture for either Master-Slave hierarchical setups or Master-Master crosschecking and failover
- 2U version is operated by an intuitive touch-screen interface, a first for any master clock system.
- All components are hot-swappable and are dual redundant.
- The Output Signal modules are hot-swappable from the front and minimize the need to disconnect cables.
The TEM horn antenna is an antenna used for conducting close proximity radiation immunity evaluation test (near electromagnetic field immunity test) of electromagnetic waves radiated from various wireless transmitters such as mobile devices.
In the future, close proximity radiation immunity evaluation test using the TEM horn antenna is expected to expand to various product standards such as medical equipment (IEC 60601-1-2) and multimedia equipment (CISPR 35). NoiseKen's TEM horn antenna has a wide band, low VSWR, and wide electric field uniformity offering an ideal solution for an efficient close proximity radiation immunity test.
- A TEM horn antenna compliant with IEC 61000-4-39 Ed.1.
- Test without changing the antenna in the frequency range of 380MHz to 6GHz.
- Low VSWR and high GAIN enable efficient electromagnetic wave radiation.
- Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT.
- Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.
The D19-GT/-GTS Download Station ensures a secure and high-speed data download (via 40 Gbit Ethernet) from MDR or MDR-GT/-GTS storage media. Specifically designed for flight testing applications with demanding data rates and storage needs, the D19-GTS, when paired with MDR-GTS, incorporates advanced cybersecurity features like Data-At-Rest (DAR) protection and firmware updates. Configuration changes are facilitated through a Removable Secure Operational Disk (RSOD).
- Part of the MicroBrite™ family of high performance, compact machine vision lights.
- This line light series utilizes a fresnel lens for a compact form factor.
- Provides an intensity level of 189kLux (working distance of 75mm)
- Expandable in 50mm increments up to 750mm
Alvium 1800 U is a small and powerful industrial camera. Benefit from high image quality at a great price-performance ratio!
- Various sensors: Select between CMOS sensors from ON Semi and Sony, including NIR (near infrared), for your individual applications.
- Image reproduction quality: Get the best out of your lens-to-sensor combination by high-precision Alvium Sensor Alignment.
- Intelligent power management: Design low-power or even battery-powered systems.
- USB 3.1 Gen 1: Install our VIMBA Suite and get your first images easily.
- Industrial-grade hardware: Design reliable applications by the Micro-B USB 3.1 Gen 1 connector with screw locks.
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features
- Part of the MicroBrite™ family of high performance, compact machine vision lights.
- Our DF196 Series delivers direct illumination at a low angle to cast shadows used to identify surface defects, embossed text, etc.
- This dark field ring light is more directional and less diffuse than the DF198.
- Available in 4 sizes with an intesity of 72kLux (working distance of 25mm with DF196-100)
KapCOM (EWC33) is a new generation of transceivers with high performance Telemetry, Tracking & Command (TT&C) service. It is used on OneWeb constellation & is based on the heritage of EWC15 used in key space missions like ROSETTA, DEEP IMPACT, …
High-voltage/current Probes
- On-wafer power device characterization up to 10,000 V DC / 600 A
- Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
- Increased isolation resistance and dielectric strength to provide full triaxial capability at high voltage (3,000 V) for low-leakage measurement
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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