FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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N-XONOS is a X-band transmitter dedicated to small satellites and designed to answer to an increasing demand of high data rate transmission. It is a new generation of transmitters on an innovative design.
The EH1840 EMC horn combines stable gain performance and low VSWR with wide band frequency operation. The horn is single linearly polarized with excellent cross-polar discrimination. The unique horn design suppresses any possible excitation of higher order modes in the aperture and maintains a well-defined smooth radiation pattern in the direction of the boresight axis throughout the operational bandwidth.
- High power density in 4U/14U chassis up to 36 kVA.
- Intuitive touch panel control.
- iX2™ current doubling technology.
- Multi-language user interface for global operation.
- Auto paralleling for higher power.
- Combine units for multi-phase configurations
- Complete optional avionic test suites.
- ATE version available
- Low output capacitance
- High bandwidth up to 30kHz
- High resolution I-V curve simulates static and dynamic conditions
- Designed for high speed Maximum Power Point Tracking (MPPT)
- Can be integrated into a multi-channel system for higher power testing
- Low voltage, high bandwidth version for DC Power Optimizers
- EN50530 support
- Bilateral telecentric design
- Very high resolution down to 2.4µm pixel size
- 2/3" (11 mm) max. sensor size
- C-Mount lens
- 5 magnifications: 0.2x - 1x
Safran’s SEEING™ 130 Wide includes a unique medium focal length catadioptric optics, limited by diffraction only and with ultra-low distortion, offering perfect imaging over 35 mm full-frame image format. It is fitted with a 10megapixel sensor.
SEEING™ 130 Wide enables high Signal to Noise Ratio for multispectral (MS), hyperspectral (HS) and low light level imaging. SEEING™ 130 Wide includes a spectral filter with 23 bands covering Blue, Green, Red, Near InfraRed and Red Edge MS, for a broad spectral range between 475 and 900nm. SEEING™ 130 Wide has a large Field of View of 6.3° x 4.3° / 54 x 36 km2 from a 500km/310 miles orbit.
In addition to its a thermal design within a robust structure, SEEING™ 130 Wide has a low SWaP, saving launch and operational costs.
- Extremely high resolution down to 3.5µm pixel size
- Image circle: 62.5 mm - 82 mm
- Optimized for specific magnifications
- 5 magnifications available: 2.6x - 5.2x
- Versions with beamsplitter available
- Best azimuth marking
- V-Mount for easy installation
- 2" (32 mm) max. Sensor size
- 3 focal lengths: 35 mm, 50 mm and 75 mm
- Very high resolution down to 2.4µm pixel size
- Initial aperture: F2.8
- M42 lens and TFL-Mount lens available
- Covering a wide working distance range
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (49 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
Scope of delivery
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Camera and IEEE 1394b cable (other configurations on request)
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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