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FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
More Product Information
- With an intensity of over 150 klx at 300 mm WD in continuous operation, the SL316 UltraSeal Spot Light delivers industry-leading intensity with consistent uniformity.
- Available with narrow, medium, and wide lensing options as well as a non-lensed configuration for high dispersion.
- Configurable in eleven wavelength options.
- Compatible with all Ai inline and discreet control systems. The SL316 can be operated in continuous, gated continuous, pulsed, and adaptive pulsed modes with dimming options for brightness control.
- True Differential and Calibrated TDR for Maximum Impedance Measurement Accuracy
- Compact, Battery-Powered Design for true portability
- 30 ps Typical Rise Time, S-Parameter support up to 15 GHz (15D and 15D-XR models)
- 260 ps Typical Rise Time, S-Parameter support up to 1.25 GHz (01D model)
- 50,000-point memory supporting DUT lengths up to 30 m (15D), 50 m (15D-XR) and 1 km (01D)
- Automatic Ohmic Loss Compensation for enhanced accuracy
- Built-in Skew Analysis (Inter-Pair and Intra-Pair) for differential signal integrity
- XR Series: Engineered for Speed, Optimized for Continuous Cable Production
- 01D model: Engineered for High-Dynamic Range, Optimized for 10Base-T1, 100Base-T1 and MIL-Spec RF Cables.
- Outstanding stability
- Fast switching speed
- Ripple-free response over standard waveguide bands
The NC5000A Series AWGN noise sources feature outstanding stability, switching speed, and ripple-free response over standard waveguide bands. The high stability of the NC5000A Series allows these units to be used in place of cumbersome gas tube noise sources.
Ripple in the output of noise sources has a direct effect on measurement accuracy, so Noisecom has tailored the response of the NC5000A Series so that ripple is minimized throughout the specified frequency range.
High-voltage/current Probes
- On-wafer power device characterization up to 10,000 V DC / 600 A
- Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
- Increased isolation resistance and dielectric strength to provide full triaxial capability at high voltage (3,000 V) for low-leakage measurement
- Excellent temperature and voltage stability
- Units for noise figure meters feature 15.5-dB ± 0.75 dB ENR output
- High-output units for radar and satellite communications system testing feature output between 26 and 35 dB ± 1 dB ENR
The NC3000 Series calibrated coaxial AWGN sources are well suited for receiver testing, noise figure measurements, or applications that require broadband noise and fast switching times. Several models include output isolators, and voltage regulators that provide excellent stability over varying temperature and voltage ranges. The NC3000 Series includes the NC3100 units with 15 dB ENR output for noise-figure meters, and the NC3200 Series high-output noise sources with outputs between 26 and 35 dB ENR for radar and satellite communications system testing.
- Support the most high-performance Camera Link cameras with available support for Full and 80-bit mode at up to 85 MHz
- Perform deterministic image acquisition by way of the jitter-free Camera Link 2.1 interface
- Maximize system compatibility with the choice of PCIe® 2.1 x1, x4 or x8 connectivity
- Eliminate missed frames with ample onboard buffering and PCIe bandwidth
- Optimize multi-camera applications via support for up to four Base or two Full/80-bit Camera Link cameras per board
- Minimize space requirements and maximize PC compatibility through a half-length design with mini Camera Link connectivity for true single-slot operation
- Improve and simplify system connectivity with Power-overCamera-Link (PoCL) support at extended cable lengths
With LUMIMAX® LED Coaxial Lights, a highly diffused light field is shown on the object field through a semi-transparent mirror vertical in the optical axis of the camera. The homogeneous and shadow-free lighting is used for surface inspections, completeness checks and printed image inspections. The Coaxial Lights also meet the requirements for standard-compliant reading and verification of two-dimensional codes.
The optical design of Coaxial Lights necessarily reduces the amount of light emitted. By using the latest generation of High Power LEDs, the new LES series can compensate for this effect and illuminate test objects with high light intensity.
High flexibility
- Re-configurable for DC, RF, mmW, FA, WLR and more
- Thermal range: -60˚C to 300˚C available
- Upgrade path to meet your future needs
- Stable and repeatable measurements over a wide thermal range
See "Specifications & Details" tab for more key features
- Part of the MicroBrite™ family of high performance, compact machine vision lights.
- Our DF196 Series delivers direct illumination at a low angle to cast shadows used to identify surface defects, embossed text, etc.
- This dark field ring light is more directional and less diffuse than the DF198.
- Available in 4 sizes with an intesity of 72kLux (working distance of 25mm with DF196-100)
FormFactor, Inc.
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FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
