FormFactor - Cascade Unity Probe - Multicontact probe for RFIC engineering test
- Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
- Online design configuration tool helps you to specify your probe in minutes
- All designs are fully quadrant compatible
- Full solution includes probes, calibration substrates, stations, accessories and software
- Scalable architecture for future needs
The multi-contact Unity Probe provides highly flexible configurability, unprecedented durability and ease-of use for RFIC engineering test. Unlike “bent-to-order” needle-probe solutions, Unity probes are quickly “built-to-order” with a precision tip cluster featuring multiple independently compliant fingers to isolate chip components from probing stresses — maximizing probe life and durability. Each contact can be configured to one or several contact types and frequencies, and the Unity Probe delivers on the legendary quality you’ve come to expect from our comprehensive suite of probing solutions.
Use our online tool to capture your design requirements and receive a quote.
More Product Information
- LMR Signal Analyzers with Coverage Mapping: P25, P25 Phase 2, DMR (MotoTRBO™), TETRA, NXDN, dPMR, PTC-ITCR, PTC-ACSES, NBFM, FDD & TDD LTE
- Broadband Signal Analyzers: LTE, WiMAX
- Interference Analyzer with Interference Mapping and support for MA2700A Handheld Interference Hunter
- Auto Test and Alignment of Motorola APX P25 mobiles and portables
- Direct measurement of up to 150 watt transmitters
- Spectrum Analyzer: 9 kHz – 1.6 GHz, optional to 6 GHz
- Cable and Antenna Analyzer: 500 kHz – 1.6 GHz, optional to 6 GHz
- Return Loss, VSWR, Insertion Loss, S11 / S21, DTF
- PIM Hunting
- Internal Power Meter, optional External Power Sensor
- Handheld, battery-operated design
- Weighs less than 7.6 lb (including battery)
- Rugged, field-proven design using Anritsu's 9th generation hardware platform
- Daylight viewable color touchscreen display
- Superior Immunity to RF interference
- Remote control via Ethernet
- Standard three-year warranty (battery one-year warranty)
An EMC Chamber with 5 meter test range ensuring EMC compliance testing for Emission and Immunity testing. Ferrite and hybrid pyramidal absorbers are combined in a unique pattern within a SmartShield high performance chamber. Operating at a 5m test distance, this EMC chamber is compliant to CISPR-16-1-4 / ANSI C63.4 with a measurement zone diameter of 2 to 4 meters.
Flexibility
- Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL
- Re-configurable and upgradable as requirements grow
- Minimizes setup times with no loss in performance or accuracy
- Seamless integration of various measurement instruments
Stability
- Solid station frame
- Built-in vibration-isolation solution for superior vibration attenuation
- Rigid microscope bridge
- Compact and rigid mechanical design
- Highly accurate measurement results
- Incorporates best-known methods
Ease of Use
- Ergonomic and straightforward design for comfortable and easy operation
- Low-profile design
- Simple microscope operation
- Quick and ergonomic change of DUT through pull-out stage
- Minimize training efforts
- Fast time to data
- Convenient operation
FormFactor - Cascade Ultra High-Power (UHP) - Enabling single-contact high-current/high-voltage test
- Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
- Even distribution of high current with innovative multi-fingertip design
- Compatible with TESLA 200/300 mm power device characterization system
- Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
- Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
- Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
Gold-plated TESLA High-power MicroVac™ Chucks
- Prevent thin wafers from curling and breaking
- Advanced MicroVac chuck surface for minimum contact resistance between wafer and chuck
- Accurate Rds(on) measurement at high current
- Accurate UIS measurements at high temperature
- High-quality construction with low-noise electrical performance
- Kelvin version for convenient 4-point measurements
- Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
- SSMC 50 connectors
- Ultra-low, fA and fF measurements from -65 º C to 150 º C
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements
FormFactor, Inc.
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FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
