• Long holding time: 80 hours with 10 STP liter He-3 gas
• Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line
• Sample can be loaded or removed when the cryostat is cold
• Low noise, low vibration
• Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)

• Full-radius, nickel-plated tungsten needles
• Power bypass inductance: 16 nH
• Supports collinear and non-standard needle configurations
• Support up to a maximum of 12 ceramic blades DC needles / contacts
• Ideal for probing the entire circuit for functional test
• DC probes can provide power or slow logic to circuit under test

• Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided
• Temperatures range from -60°C to +300°C
• Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
• Low Thermal Resistance Technology
• MultiSense with multiple temperature sensors
• Isolated from ground
• Includes a jack for grounding and biasing
• Advanced wafer vacuum system for warped/partial thin wafers
• Provides uniform vacuum across the entire wafer surface
• Advanced shielding technology

• Ease of use –  Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
• Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
• Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
• Calibration Monitor and Re-calibration – System will
  continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.

• Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
• Even distribution of high current with innovative multi-fingertip design
• Compatible with TESLA 200/300 mm power device characterization system
• Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
• Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
• Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)

• Probe station
• Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
• Choice of probes
• Known measurement accuracy traced back to independent standards
• Uses best measurement practices for optimized measurements
• Best in class RF and Microwave performance
• Small benchtop footprint

The low frequency tuners are a unique product technology using MPT algorithms for low frequency wideband tuning. Three or more cascaded tuning sections use series transmission cables and parallel rotary capacitors.

The length of the cables and number of tuning sections are optimized for maximum tuning range over a given bandwidth. HLFT tuners use 6 tuning sections allowing second harmonic frequency tuning.