FormFactor - HPD JDry-500 - Cryogen-free Dilution Refrigerator
-
Low running costs, less vibration, less noise, reduced maintenance
-
Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
-
CMN calibrated thermometry on MC plate
-
Operation via touch panel controller: Remote operation via ethernet interface
FormFactor’s JDry cryogen-free dilution refrigerators enable easy and cost-effective cooling to temperatures below 10 mK. The JDry models have been optimized for quantum computing applications and can accommodate up to 270 semirigid cables. General-purpose configurations and astronomy/detector cooling are also provided.
The JDry cryogen-free dilution refrigerator series includes multiple standard models. All are available with easy push-button cooling using the robust and fully-automated NI LabVIEW™-based “JACoB” gas-handling system (GHS).
The JDry-500 model is fitted with a cold-plate of 508 mm (20″) diameter, and provides a cooling power of more than 450 µW at 100 mK.
Document
More Product Information
-
Cryogen-free option available
-
Flexible sample space
-
Low noise, low vibration
-
Long holding time
-
Stable He-3 pot temperature
-
Low running costs, less vibration, less noise, reduced maintenance
-
Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
-
CMN calibrated thermometry on MC plate
-
Operation via touch panel controller: Remote operation via ethernet interface
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Independently cooled cold shield
-
Probe positioners placed inside vacuum chamber
-
Intuitive, manual drives
-
Front loading capability through load door
-
Independent control of linear chuck stage and positioners
-
Contact/separation stroke for chuck
See more Key Options in Specifictions & Details tab
-
Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
-
Guarantees fully-guarded measurements to fA and fF levels
-
Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
-
Allows probing of different pad materials and sizes
-
Fast replacement of worn probes without the need for tools
-
Enables wafer probing up to 100 A pulsed and 10A DC
-
Innovative multi-fingertip design provides even distribution of current
-
Supports up to 500 V
-
Replaceable Tungsten probe tips
-
Temperature range of -60°C to 300°C
-
Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
-
Prevents against thermal runaway
-
Measure devices on wafer at higher currents than ever before
-
Small scrub minimizes damage to aluminum pad
-
Small footprint – tip fits on a 1 mm pad
-
Provides an effectively noise free environment around the device under test (DUT)
-
World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
-
Up to 4x faster flicker noise thermal testing on 30 μm pads
-
Provides dark and dry environment for measuring light sensitive transistors, and devices at negative temperatures (<= -60°C) with frost free operation
-
Provides fully managed and filtered AC power to the entire system – prober and instruments
-
Filters harmful noise generated by external thermal control systems
-
Reduced “antenna effect” injection of unwanted RF noise into the measurement path
-
Provide up to 100dB attenuation (50Hz to 80Mhz) with 100mA max DC current handling
-
Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
-
Enables full access to the chuck and the auxiliary sites
-
Intuitive, and precise movement of chuck in X, Y, and Z-direction
-
User-centered design minimizes training costs and enhances efficiency
-
Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
See more Key Features on Specifications & Details tab
-
Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material
-
DC to 110 GHz models available in single and dual line versions
-
Low insertion and return loss with ultra-low-loss ( -L ) versions
-
Excellent crosstalk characteristics
-
Wide operating temperature -65 ° C to + 200 ° C
-
Wide range of pitches available, from 50 to 1250 µm
-
Individually supported contacts
-
Reduced contact (RC) probe tips for small pads
-
BeCu tip provides rugged, repeatable contact on gold pads
-
Different substrate carriers for wafers up to 100 mm or single dies
-
Up to six positioners
-
Independently cooled cold shield
-
Probe positioners placed inside vacuum chamber
-
Ergonomic and straightforward design
-
Simple microscope operation
-
Independent control of linear chuck stage and positioners
-
Contact/separation stroke for probe platen
See more Key Features on Specifications & Details tab
-
Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
-
Online design configuration tool helps you to specify your probe in minutes
-
All designs are fully quadrant compatible
-
Full solution includes probes, calibration substrates, stations, accessories and software
-
Scalable architecture for future needs
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
