• Revolutionary technology advancement for wafer and die-level photonics probing
• Real-time in-situ calibrations
• Highest accuracy in test results
• Lowest coupling loss
• New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
• Minimized coupling losses with minimal trench dimensions
• Industry standard for vertical coupling to wafer-level grating couplers
• Dark, shielded and frost-free
• -40°C to +125°C
• Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
• Exclusive FormFactor-developed automated test methodology
• FormFactor-developed graphical user interface to manually control the optical positioning system
• Configurable between single fibers, fiber arrays and edge coupling holders

• Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
• Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
• Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
• Durable probe structure ensures more than 250,000 contacts
• Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications

• Best price per contact – typically over one million (1,000,000) touchdowns
• RF/Microwave signal is shielded and completely air isolated in the probe body
• Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
• Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
• Probe on any pad material with minimal damage

• Cryogen-free: cooling with two-stage pulse tube refrigerator (PTR)
• Low vibration
• Mechanical heat switch
• Internal charcoal sorption pump

The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.

• Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
• Application flexibility, ideal for use in high frequency applications
• Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
• Suitable for integration with vibration isolating tables