FormFactor - Cascade Shield Enclosure Light-tight probing
- Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
- Application flexibility, ideal for use in high frequency applications
- Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
- Suitable for integration with vibration isolating tables
Shield Enclosures are designed for durable stability and sized to accommodate analytical probers equipped with all kinds of accessories, including thermal chucks, laser cutters, TV and emission cameras. The EMI-shielded version guarantees a light-tight and electromagnetically shielded environment for all sensitive measurements.
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The optoCAN-FD system can be used for the bidirectional optical transmission of CAN-signals with transmission rates of up to 10 Mbit/s. It consists of two identical battery supplied transceivers connected to each other with an optical fiber. With the optical transmission and the shielded case, the system is well equipped for EMI and EME tests.
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight Photonics Application
- Revolutionary technology advancement for wafer and die-level photonics probing
- Real-time in-situ calibrations
- Singulated die testing
- True die-level edge coupling
- In-situ power measurements
- Advanced calibration technologies
- Enables autonomous measurements
See "Specifications & Details" tab for more key features
- Calibration-grade metrology standards
- Used for VNA calibration and/or calibration validation
Shielded, coaxial opens are used in the calibration of vector network analyzers to provide a nominal 180° phase offset from a compatible reference short over a wide range of frequencies. At these frequencies, open circuit terminations are inherently imperfect. Shielding the open essentially eliminates radiation loss, but creates a residual frequency-sensitive capacitance. An accurate knowledge of the open’s effective capacitance is essential to an accurate calibration of the analyzer. Maury opens are characterized for effective capacitance versus frequency by means of a fourth order polynomial curve fit, and the nominal capacitance coefficients are provided with each unit.
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
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15’ Flexible Power Cord
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IEC C13 / C14 Connectors
Test Tap:
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3ft.
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(2) fork terminals (current)
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(1) fork terminals (ground)
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(2) Shielded Banana (voltage)
Cryogenic Temperatures
- Fully isolated experiment space for true 4K temperatures during probing
- Cryogenic positioners to provide large travel ranges without warming up the device
- Integrated helium pot for high temperature stability of the device under test
- Fully dry cryogen-free cooler eliminates the need for expensive helium circulation systems
- Rapid cool liquid nitrogen option for faster cool down times
See "Specifications & Details" tab for more key features
A Semi Anechoic EMC Chamber with 3-meter test range ensuring EMC compliance for Emission and Immunity testing. Ferrite and hybrid pyramidal EMC absorbers are combined in a unique pattern within a SmartShield high performance chamber. Operating at a 3m test distance, this chamber is compliant to ANSI C63.4/CISPR-16-1-4 with a Test Volume diameter of 1 to 2 meters.
FormFactor, Inc.
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FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
