FormFactor - Cascade Shield Enclosure Light-tight probing
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Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
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Application flexibility, ideal for use in high frequency applications
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Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
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Suitable for integration with vibration isolating tables
Shield Enclosures are designed for durable stability and sized to accommodate analytical probers equipped with all kinds of accessories, including thermal chucks, laser cutters, TV and emission cameras. The EMI-shielded version guarantees a light-tight and electromagnetically shielded environment for all sensitive measurements.
More Product Information
![FormFactor - Cascade Eye-Pass Probe - Durable multi-contact wafer probe with controlled impedance power bypass technology FormFactor - Cascade Eye-Pass Probe - Durable multi-contact wafer probe with controlled impedance power bypass technology](/sites/default/files/styles/max_325x325/public/probe-eyepass.png?itok=8lQ2NdAy)
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High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
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RF bandwidth to 500 MHz
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Long probe life: > 250,000 contacts
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Beryllium-copper tips for gold pads or tungsten for aluminum pads
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Oscillation-free testing of wide-bandwidth analog circuits
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Use with ACP series probes to provide functional at-speed testing for known-good-die
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Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
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Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)
![FormFactor - Cascade MPS150 Modular Probe Station FormFactor - Cascade MPS150 Modular Probe Station](/sites/default/files/styles/max_325x325/public/mps150.png?itok=GOc4NiKL)
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Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL
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Re-configurable and upgradable as requirements grow
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Minimizes setup times with no loss in performance or accuracy
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Seamless integration of various measurement instruments
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Solid station frame
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Built-in vibration-isolation solution for superior vibration attenuation
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Rigid microscope bridge
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Compact and rigid mechanical design
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Highly accurate measurement results
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Incorporates best-known methods
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Ergonomic and straightforward design for comfortable and easy operation
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Low-profile design
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Simple microscope operation
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Quick and ergonomic change of DUT through pull-out stage
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Minimize training efforts
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Fast time to data
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Convenient operation
![FormFactor - Cascade Unity Probe - Multicontact probe for RFIC engineering test FormFactor - Cascade Unity Probe - Multicontact probe for RFIC engineering test](/sites/default/files/styles/max_325x325/public/probe-unity.jpg?itok=MC5QetoO)
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Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
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Online design configuration tool helps you to specify your probe in minutes
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All designs are fully quadrant compatible
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Full solution includes probes, calibration substrates, stations, accessories and software
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Scalable architecture for future needs
![NEO NXB - 20820 Voltage / Current Breakout Test Box NEO NXB - 20820 Voltage / Current Breakout Test Box](/sites/default/files/styles/max_325x325/public/NXB20820.png?itok=EFGTuISF)
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On-Off power switch
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20 A Circuit Breaker
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Inlet - NEMA L6-20
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Outlets – NEMA L6-20R
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3ft.
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(2) fork terminals (current)
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(1) fork terminals (ground)
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(2) Shielded Banana (voltage)
![Amplifier Research radiant_arrow_252_026](/sites/default/files/styles/max_325x325/public/2024-04/Amplifier%20Research%20radiant_arrow_252_026.jpeg?itok=d8nUglWw)
These rugged, dependable high gain log periodic antennas give you the constant high intensity fields you need for RFI and EMI testing in and out of a shielded room. They deliver frequency response and field intensity beyond the norm. AR’s log periodics are designed for high power radiated testing and can be calibrated for emissions.
Their lightweight modular design makes assembly and relocation easy. And they’re built tough, so they can withstand extreme temperatures.
![NEO NXB - 20815 Voltage / Current Breakout Test Box NEO NXB - 20815 Voltage / Current Breakout Test Box](/sites/default/files/styles/max_325x325/public/NXB20815.png?itok=MLwhEo8N)
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On-Off power switch
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15 A Circuit Breaker
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Inlet - IEC C14 for use with any cordset
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Outlets – (8) IEC C13
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3ft.
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(2) fork terminals (current)
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(1) fork terminals (ground)
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(2) Shielded Banana (voltage)
![FormFactor - Cascade PLV50 - 150 mm manual vacuum probe system FormFactor - Cascade PLV50 - 150 mm manual vacuum probe system](/sites/default/files/styles/max_325x325/public/plv50_vacuum_probe_station.jpg?itok=0HjCAIsB)
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Different substrate carriers for wafers up to 150 mm or single dies
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Up to six positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Ergonomic and straightforward design
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Intuitive, manual operation
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for probe platen
![FormFactor - HPD Model HE-3-TLSL - Wet Helium-3 Cryostat FormFactor - HPD Model HE-3-TLSL - Wet Helium-3 Cryostat](/sites/default/files/styles/max_325x325/public/he-3-tlsl-cryostat-front.jpg?itok=rm21H2QO)
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Sample can be loaded or removed when the cryostat is cold
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High cooling power with sample in (He-3) liquid (400 mK with 400 microwatt cooling power)
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Sample probe and a load-lock with gate valve
![FormFactor - Cascade SUMMIT200 - Advanced 200 mm semi-/ fully-automated probe system FormFactor - Cascade SUMMIT200 - Advanced 200 mm semi-/ fully-automated probe system](/sites/default/files/styles/max_325x325/public/summit200-animated.gif?itok=h5zjoiEY)
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Best solution for high accuracy IV/CV, low-noise and 1/f measurements with PureLine, AutoGuard and next generation MicroChamber technologies
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Enables up to 5x faster time to accurate data
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Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact
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RF/microwave device characterization, 1/f, WLR, FA and design debug
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Wide range of extremly performant, reliable thermal chuck systems from ATT
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Easy on-screen navigation, wafer mapping, and operation of accessories and thermal systems with Velox
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User-centered design minimizes training costs and enhances efficiency
![FormFactor, Inc. FormFactor, Inc.](/sites/default/files/styles/max_650x650/public/formfactor_logo.png?itok=t8732IWX)
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
![FormFactor - Cascade Shield Enclosure Light-tight probing FormFactor - Cascade Shield Enclosure Light-tight probing](/sites/default/files/styles/max_2600x2600/public/systems_acc_shield-enclosure.jpg?itok=ETRzMOXm)