FormFactor - Cascade IMS-K-SiPh - Integrated system with Keysight Photonics Application Suite hardware and software
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight Photonics Application
Industry’s Most Productive and Accurate Wafer Level Photonics Measurement System
FormFactor understands that a test engineer‘s goal is to be making measurements. With the complexity of Silicon Photonics measurements, an integrated, verified solution will prevent engineers from spending valuable time on long development projects. We have developed all the tools, fixtures and calibration techniques to enable you to be measuring your photonic devices in hours instead of months or years. FormFactor’s Autonomous Silicon Photonics Measurement Assistant and Keysight’s Instrument offer a highly flexible solution that enables quick changeover for a multitude of testing needs from single fibers to arrays and from vertical coupling to edge coupling. Our Photonics Integration Kit and the revolutionary OptoVue Calibration Kit, will get you production proven, optimized optical measurements right after installation.
Fastest, Safest, and Most Affordable Path to High Quality Measurements
Pre-validated, turn-key, comprehensive, integrated measurement systems from FormFactor deliver peace of mind and immediate, out-of-the-box productivity for important test applications.
These benefits are provided at no extra cost. IMS solutions from FormFactor include no markups over Keysight pricing or integration charges.
Only one wafer level photonics system in the world is built upon the foundations of the #1 leader in R&D instrumentation plus the #1 leader in analytical probe systems – the FormFactor IMS-K-SIPH.
Applications
- Silicon Photonics Measurements
Suite Hardware and Software
FormFactor and partner Keysight applications experts will help you configure a robust, complete solution, including:
- FormFactor probe system: CM300xi, SUMMIT200, MPS150 (others available)
- Manual, semi-automatic and fully automatic probes station options
- FormFactor analytical probes: RF and DC probes on manual or motorized positioners
- FormFactor Integrated Single, Dual or 3 sided HexNano Optical Positioning
- FormFactor photonics automation software: SiPh-Tools and Photonics Controller Interface for automated optical positioner calibrations and control
- Temperature measurements and automation from -40°C to +125°C
- Tunable lasers, power meters, and polarization synthesizer: Keysight N7776C, N7778C, N7744C, N7745C, N7786C, N7788C (others available)
- Modular lasers: Keysight 81606A, 81607A, 81608A and 81602A (others available)
- Keysight semiconductor parameter analyzer or PXIe SMUs for Optical to Electrical (O-E): B2901A, B1500A, M9601A PXI SMU (others available)
- Keysight test and automation oftware: Photonics Application Suite (PAS), PathWave Test Automation with FormFactor Wafer prober plug-in
- To complete the system: cables, adapters, mounting hardware, etc.
More Product Information
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Can help to stabilize oscillations in high-gain devices
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Impedance match to low dynamic resistance laser diodes
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Custom configured for your application
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Enables wafer probing up to 100 A pulsed and 10A DC
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Innovative multi-fingertip design provides even distribution of current
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Supports up to 500 V
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Replaceable Tungsten probe tips
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Temperature range of -60°C to 300°C
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Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
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Prevents against thermal runaway
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Measure devices on wafer at higher currents than ever before
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Small scrub minimizes damage to aluminum pad
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Small footprint – tip fits on a 1 mm pad
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Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
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Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
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LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
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Automatic load inductance compensation function ensures the most repeatable calibrations
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Easy to use Probe to ISS/CSR matching tool
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Additional remoting methods
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Interface with Velox™ over LAN
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Infinity Probe: best for Al (Si)
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ACP Probe: best for AU (III-Vs)
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|Z| Probe: robust solution (long lifetime)
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RF chuck ±3 μm surface planarity
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Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
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Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
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Automated calibration monitoring
See more Key Features on Specifications & Details tab
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Independently cooled cold shield
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Probe positioners placed inside vacuum chamber
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Intuitive, manual drives
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Front loading capability through load door
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for chuck
See more Key Options in Specifictions & Details tab
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Intuitive, manual drives
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Front loading capability through load door
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Software control of chuck for fast step-and-repeat testing of the entire wafer
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Fast step-and-repeat testing of the whole wafer
See more Key Features on Specifications & Details tab
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Revolutionary technology advancement for wafer and die-level photonics probing
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Highest accuracy in test results
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New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
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Minimized coupling losses with minimal trench dimensions
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Industry standard for vertical coupling to wafer-level grating couplers
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Positioning hardware is precisely calibrated to the probe station and ready to perform die-to-die optical optimizations in minutes
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Dark, shielded and frost-free
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-40°C to +125°C
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Leveraging considerable expertise through an innovative engineering team
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Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
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Exclusive FormFactor-developed automated test methodology
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Automates manual tasks by integrating probe station machine vision capability with optical positioning and test equipment
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FormFactor-developed graphical user interface to manually control the optical positioning system
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Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab
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Different substrate carriers for wafers up to 100 mm or single dies
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Up to six positioners
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Independently cooled cold shield
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Probe positioners placed inside vacuum chamber
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Ergonomic and straightforward design
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Simple microscope operation
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for probe platen
See more Key Features on Specifications & Details tab
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Sample can be loaded or removed when the cryostat is cold
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High cooling power with sample in (He-3) liquid (400 mK with 400 microwatt cooling power)
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Sample probe and a load-lock with gate valve
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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