FormFactor - Cascade PAV200 - 200 mm semi-automated vacuum probe system
More Product Information
-
Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
-
Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
-
Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
-
Durable probe structure ensures more than 250,000 contacts
-
Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications
The low frequency tuners are a unique product technology using MPT algorithms for low frequency wideband tuning. Three or more cascaded tuning sections use series transmission cables and parallel rotary capacitors.
The length of the cables and number of tuning sections are optimized for maximum tuning range over a given bandwidth. HLFT tuners use 6 tuning sections allowing second harmonic frequency tuning.
-
Highly stable granite base
-
Independent, coarse movement of X and Y axes, combined with easy fine adjustments down to submicron ranges
-
Re-configurable for DC, RF, mmW, FA, WLR and more
-
Multiple accessories: Thermal chucks, motorized microscopes and positioners, dark box, and more
-
Low-profile, straightforward design
-
Easy and ergonomic operation
-
Front or backside instrumentation, e.g.: Integrating Sphere, Fiber setup, Pressure Module
-
Front or backside probing capability
See more Key Features on Specifications & Details tab
-
Combined eye-pieces and CCD camera mount
-
3x zoom and quick lens exchange
-
Engraved guides on mmW platen
-
Supports broadband, load pull, coax RF and banded waveguide configuration
-
Rock-solid mechanical design
-
Submicron stage accuracy
See more Key Features on Specifications & Details tab
FormFactor's FRT Metrology engineers designed SurfaceSens technology to achieve superior information about the measured sample and greater insights about product quality. All of our FRT MicroProf® metrology tools can be configured with complementary sensor technologies. In a hybrid analysis process, otherwise inaccessible surface data of wafers or other samples are precisely measured.
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
-
Wafer temp verified <4.5 K (with 44 RF probes in contact)
-
Magnetic field suppression to <200 nT
-
Easy exchange of customizable probe cards
-
Configurable for 150 mm, 200 mm and 300 mm wafers
-
Options for fully automated wafer load or manual
-
Complete software suite for manual, semi-auto, or fully automated probing
-
25 wafer cassette capacity for fully automated testing
-
~15 minute cooldown time per wafer
See more Key Features in Specifications & Details tab
-
Full-radius, nickel-plated tungsten needles
-
Power bypass inductance: 16 nH
-
Supports collinear and non-standard needle configurations
-
Support up to a maximum of 12 ceramic blades DC needles / contacts
-
Ideal for probing the entire circuit for functional test
-
DC probes can provide power or slow logic to circuit under test
-
Best solution for high accuracy IV/CV, low-noise and 1/f measurements with PureLine, AutoGuard and next generation MicroChamber technologies
-
Enables up to 5x faster time to accurate data
-
Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact
-
RF/microwave device characterization, 1/f, WLR, FA and design debug
-
Wide range of extremly performant, reliable thermal chuck systems from ATT
-
Easy on-screen navigation, wafer mapping, and operation of accessories and thermal systems with Velox
-
User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
slide 2 of 4
