FormFactor - Cascade Summit - 200 mm manual probe system
High flexibility
- Re-configurable for DC, RF, mmW, FA, WLR and more
- Thermal range: -60˚C to 300˚C available
- Upgrade path to meet your future needs
- Stable and repeatable measurements over a wide thermal range
See "Specifications & Details" tab for more key features
Precise On-Wafer Device and Process Characterization
High-precision probe system that enables testing at multiple temperatures. Excellent measurement performance is achieved for a wide range of applications in an EMI-shielded, light-tight and moisture-free test environment, at a temperature range from -60°C to 300°C.
Applications
- Failure Analysis
- IV/CV
- MEMS
- Reliability
- RF/mmW/THz
Advanced shielding solution
- Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
- Advanced EMI-shielding with PureLine with AttoGuard technologies
- Best solution for low-noise and 1/f measurements
- Minimize AC and spectral noise
- Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range
Ease of use
- Locking roll-out stage
- Innovative microscope remote control
- Intuitive ergonomic stage controls
- Quick, safe, and comfortable wafer access
- Easy on-wafer navigation
- Fast setup and test data gathering
Velox Probe Station Control Software*
- Dedicated Velox version for manual probe stations
- AugmentedAlign tool with on screen markers for improved RF measurement accuracy
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More Product Information
Test & Measurement
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