FormFactor - Cascade Multi-|Z| Probe - Test Up to 16 RF Signals with One Probe
- Ideal for multiport RF/Microwave and high-speed digital signal testing
- Mix DC and RF/Microwave signals on one probe
- Long lifetime – typically over one million (1,000,000) touchdowns
- Excellent performance in temperatures ranging from 10 K to 200°C
- Probe on any pad material with no damage
The Multi |Z| Probe® is a new dimension in RF/microwave multiport and digital signal testing. It uses the same patented technology as other |Z| Probes, but can carry up to 16 RF/microwave signals on one probe. Additionally, DC and RF/microwaves signals can be mixed on the probe, allowing you to add power biasing along with RF signals.
When several individual pads must be contacted by a single probe, it is extremely important that the contact structures are perfectly aligned. Thanks to the MEMS technology used, the Multi |Z| Probe can contact up to 35 pads. Furthermore, small variances in pad height, are easily overcome by the spring-like movement of the independent contacts.
The Multi |Z| Probe can be configured to test DC signals for your DC-test applications if necessary. For single-ended applications, please see the |Z| Probe. For applications requiring just two signals, the Dual |Z| Probe is available. The Multi |Z| Probe can also be integrated into the |Z| Probe Card for high-throughput RF testing.
More Product Information
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
- High power density in 1U / 2U / 4U / 14U chassis up to 18kVA
- Intuitive touch panel control
- Innovative iX2™ current doubling technology
- Multi-language display for global operation
- Auto paralleling for higher power
- Single phase 1U models and 1 or 3 phase selectable 2U / 4U / 14U models
- Complete avionic test suites (optional)
- ATE version available in 1U, 2U and 4U models
- Standard LXI LAN, USB and RS232, optional GPIB
- Legacy CSW5550 Emulation on the AST6003A1 Model
Xena3918 provides an easy-to-use port configuration panel that lets you add and remove ports, and assign IP addresses and port roles. Ports from multiple XenaBay and XenaCompact chassis can be freely mixed.
- Makes it easy to create, edit and execute all test-types specified in RFC 3918
- Support for IPv4 and IPv6
- Multiple protocols supported per UNI (Ethernet, Customer and Service VLANs, MPLS, IPv4, IPv6, and UDP)
- Support for all IGMP/MLD versions
- Works seamlessly with multiple XenaBay and XenaCompact test chassis
- Ability to flexibly define protocol layers supported by the test incl. Ethernet VLANs, IP and UDP
- Extensive configuration options for fine-tuning tests
Superior Mechanics
- Highly stable granite base
- Independent, coarse movement of X and Y axes, combined with easy fine adjustments down to submicron ranges
- 1 µm repeatable separation stroke
- Excellent measurement accuracy and repeatability
- Fast navigation and high-precision probe positioning
See "Specifications & Details" tab for more key features
- Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
- Application flexibility, ideal for use in high frequency applications
- Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
- Suitable for integration with vibration isolating tables
For next-generation broadband and multicarrier communication system, such as 5G mobile and broadcast satellites
- Built-in 5G measurement software supports efficient development and production
- All-in-one 5G NR/V5G (sub-6 GHz/mmWave) coverage
- High EVM performance due to wide dynamic range (EVM: <1%)
- One-button dynamic-range optimization at EVM measurement
- Multicarrier batch (all-at-once) analysis
- Amplitude/phase/timing difference measurement for each carrier
- Maximum analysis bandwidth: 1 GHz
- Excellent amplitude and phase flatness performance
- Wide dynamic range measurement: >140 dB
- Long-term capture using large memory
- With PCIe/USB3.0 connector equipped
- Transfers captured data to external PC at faster speed than 1000BASE-T
- Full configuration and performance testing according to Y.1564
- Complete validation of Ethernet service-level agreements (SLAs) in a single test
- Multiple protocols supported per UNI (Ethernet, Customer and Service VLANs, MPLS, IPv4, IPv6, and UDP)
- Define Per-UNI or per-CoS bandwidth profiles, and specify CoS-to-DSCP mapping
- Support for different network topologies and traffic flow directions
Flexibility
- Different substrate carriers for wafers up to 100 mm or single dies
- Up to six positioners
- Use with liquid nitrogen or helium, depending on the target temperature
- Probing with an open chamber lid possible under atmospheric condition
- Specially designed for laboratory environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
See "Specifications & Details" tab for more key features
- The SL164 is characterized as a Compact High Intensity Spot Light with sufficient thermal management to provide 200kLux at a working distance of 4” (100mm).
- A very wide range of wavelengths are available from UV to IR.
- Multiple beam spreads are also available as is a diffuser option.
FormFactor, Inc.
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FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
