FormFactor - Cascade Multi-|Z| Probe - Test Up to 16 RF Signals with One Probe
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Ideal for multiport RF/Microwave and high-speed digital signal testing
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Mix DC and RF/Microwave signals on one probe
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Long lifetime – typically over one million (1,000,000) touchdowns
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Excellent performance in temperatures ranging from 10 K to 200°C
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Probe on any pad material with no damage
The Multi |Z| Probe® is a new dimension in RF/microwave multiport and digital signal testing. It uses the same patented technology as other |Z| Probes, but can carry up to 16 RF/microwave signals on one probe. Additionally, DC and RF/microwaves signals can be mixed on the probe, allowing you to add power biasing along with RF signals.
When several individual pads must be contacted by a single probe, it is extremely important that the contact structures are perfectly aligned. Thanks to the MEMS technology used, the Multi |Z| Probe can contact up to 35 pads. Furthermore, small variances in pad height, are easily overcome by the spring-like movement of the independent contacts.
The Multi |Z| Probe can be configured to test DC signals for your DC-test applications if necessary. For single-ended applications, please see the |Z| Probe. For applications requiring just two signals, the Dual |Z| Probe is available. The Multi |Z| Probe can also be integrated into the |Z| Probe Card for high-throughput RF testing.
More Product Information
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Best price per contact – typically over one million (1,000,000) touchdowns
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RF/Microwave signal is shielded and completely air isolated in the probe body
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Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
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Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
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Probe on any pad material with minimal damage
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Revolutionary technology advancement for wafer and die-level photonics probing
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Highest accuracy in test results
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New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
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Minimized coupling losses with minimal trench dimensions
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Industry standard for vertical coupling to wafer-level grating couplers
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Positioning hardware is precisely calibrated to the probe station and ready to perform die-to-die optical optimizations in minutes
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Dark, shielded and frost-free
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-40°C to +125°C
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Leveraging considerable expertise through an innovative engineering team
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Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
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Exclusive FormFactor-developed automated test methodology
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Automates manual tasks by integrating probe station machine vision capability with optical positioning and test equipment
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FormFactor-developed graphical user interface to manually control the optical positioning system
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Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab
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High power capability: +/- 200V, 17A.
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Minimum pulse width: 200ns.
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Modular design which enables multiple configurations.
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Shared library. The MPIV can be used as a standalone instrument using an ActiveX library, which easily integrates into existing test software.
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Flexible Input/Output. Choose between high power and high precision pulse modules to create a customized setup for your specific application.
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Compatible with Focus Microwaves’ device characterization software (Load Pull Explorer, LPEx)
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Multi-purpose SIGMA instrument integration kit
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Shorter cabling and universal chuck connection
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Triax probe with protected guard
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Triax design for low-leakage measurements up to 3 kV
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Special chuck surface coating
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High-isolation ready
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Arcing protection
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Shield Enclosure with interlock
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Advanced grounding concept
See more Key Features on Specifications & Details tab
- 8 frequency counter channels, 16 isolated digital I/O channels, 2 isolated DAC channels in a single card
- Single frequency measurement range that works from 0.05 Hz to 1 MHz
- Very stable TCXO base clock, 50 MHz ±1 ppm
- 195 kΩ Input impedance with selectable coupling (AC/DC)
- Wide differential input voltage range (±48 V) with up to 250 V working common mode voltage
- Programmable threshold and hysteresis levels with 1 mV resolution
- Support for quadrature encoder
- Isolated DIO channels with up to 60 V compliance
- Isolated and independent 16-bit DAC channels, configurable for voltage or current output
The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.
- This DCS Series Controller provides Lighting Control Flexibility in a slim 112 mm x 124 mm x 23 mm package.
- Plug-n-Play compatibility with Ai lighting Products, featuring SignaTech™ technology.
- Seamless switching from continuous-on to gated on/off and strobe overdrive; 3 independently configurable trigger inputs.
- Din-rail mount, UL 508a Panel listed and GUI, Web Browser or command line setup and control tools, SDK.
- 1 output, 3 channels – designed to drive multi-channel RGB / segment lights, as well as single higher current draw lights.
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Digital clock automatically synchronizes with NTP servers over Ethernet Network
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0.5", 3.2" or 5" display sizes
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Remote network management
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Time Zone and Daylight Savings support
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Multiple colors
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Optional Network Time Server version with built-in GPS Receiver
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Optional built-in IRIG B time code reader
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Trigger over Ethernet
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Piecewise Linear HDR feature
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IEEE 1588 PTP
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Ultra-compact design
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Monochrome (G-030B) and color (G-030C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system cost
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IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
See the Modular Concept for lens mount and optical filter options.
See the Customization and OEM Solutions webpage for additional options.
See the Customization and OEM Solutions webpage for additional options.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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