FormFactor - Cascade Multi-|Z| Probe - Test Up to 16 RF Signals with One Probe
- Ideal for multiport RF/Microwave and high-speed digital signal testing
- Mix DC and RF/Microwave signals on one probe
- Long lifetime – typically over one million (1,000,000) touchdowns
- Excellent performance in temperatures ranging from 10 K to 200°C
- Probe on any pad material with no damage
The Multi |Z| Probe® is a new dimension in RF/microwave multiport and digital signal testing. It uses the same patented technology as other |Z| Probes, but can carry up to 16 RF/microwave signals on one probe. Additionally, DC and RF/microwaves signals can be mixed on the probe, allowing you to add power biasing along with RF signals.
When several individual pads must be contacted by a single probe, it is extremely important that the contact structures are perfectly aligned. Thanks to the MEMS technology used, the Multi |Z| Probe can contact up to 35 pads. Furthermore, small variances in pad height, are easily overcome by the spring-like movement of the independent contacts.
The Multi |Z| Probe can be configured to test DC signals for your DC-test applications if necessary. For single-ended applications, please see the |Z| Probe. For applications requiring just two signals, the Dual |Z| Probe is available. The Multi |Z| Probe can also be integrated into the |Z| Probe Card for high-throughput RF testing.
More Product Information
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- O-RAN/3GPP-Compliant Vendor-Agnostic - Deploy cores and radios from multiple vendors with different capabilities and price points to maximize flexibility and scalability.
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Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements
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Ultra-compact design
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IEEE 1588 PTP
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Power over Ethernet
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Trigger over Ethernet
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Monochrome (G-223B) and color (G-223C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system cost
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IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
The SMP3xxx product family is made up of the SMP3001, SMP3001DS, SMP3002, SMP3005, SMP3620 (pictured), and SMP3625.
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
Optimized Measurement Setup
- Multi-purpose SIGMA instrument integration kit
- Shorter cabling and universal chuck connection
- Triax probe with protected guard
- Optimized signal path
- Safe probe tip exchange
- Seamless integration of various analyzers
High Power Chuck
- Triax design for low-leakage measurements up to 3 kV
- Special chuck surface coating
- High-isolation ready
- High-current measurement up to 100 A with lowest contact resistance
- Optional upgrade for 10 kV (coax) operating voltage
- Thin wafer handling capability
Safe Operation
- Arcing protection
- Shield Enclosure with interlock
- Advanced grounding concept
- Maximum protection from high-voltage shock for users and devices
- Common ground protection for all instruments
- EMI/light-tight shielded environment
- 100 MHz, 200 MHz, 350 MHz, 500 MHz and 1 GHz bandwidths
- Up to 4 GS/s sample rate
- Long Memory – up to 20 Mpts
- 10.1” capacitive touch screen display
- 16 Digital Channel MSO option
- MAUI - Most Advanced User Interface
- Designed for Touch
- Built for Simplicity
- Made to Solve
- Advanced Anomaly Detection
- Fast Waveform Update
- History Mode - Waveform Playback
- WaveScan - Search and Find
- Multi-Instrument Capabilities
- Protocol Analysis - Serial Trigger and Decode
- Waveform Generation - Built-in Function Generator
- Digital Voltmeter and Frequency Counter
- Future Proof
- Upgradeable Bandwidth
- Field Upgradable Software and Hardware Options
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Monochrome (G-419B) and color (G-419C) models
-
GigE Vision interface with Power over Ethernet
-
Screw mount RJ45 Ethernet connector for secure operation in industrial environments
-
Supports cable lengths up to 100 meters (CAT-6 recommended)
-
Comprehensive I/O functionality for simplified system integration
-
IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
-
Trigger over Ethernet Action Commands allow for a single cable solution to reduce system cost
-
Popular C-Mount lens mount
-
Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
-
Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
-
Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
-
Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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