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The AL143, 2×3 Spot Light is available in a wide range of wavelengths with multiple lens options.
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Ideal Illumination for medium working distances.
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Convenient mounting with an M4 nut channel.
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Washdown version is available
FormFactor - Cascade Multi-|Z| Probe - Test Up to 16 RF Signals with One Probe
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Ideal for multiport RF/Microwave and high-speed digital signal testing
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Mix DC and RF/Microwave signals on one probe
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Long lifetime – typically over one million (1,000,000) touchdowns
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Excellent performance in temperatures ranging from 10 K to 200°C
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Probe on any pad material with no damage
The Multi |Z| Probe® is a new dimension in RF/microwave multiport and digital signal testing. It uses the same patented technology as other |Z| Probes, but can carry up to 16 RF/microwave signals on one probe. Additionally, DC and RF/microwaves signals can be mixed on the probe, allowing you to add power biasing along with RF signals.
When several individual pads must be contacted by a single probe, it is extremely important that the contact structures are perfectly aligned. Thanks to the MEMS technology used, the Multi |Z| Probe can contact up to 35 pads. Furthermore, small variances in pad height, are easily overcome by the spring-like movement of the independent contacts.
The Multi |Z| Probe can be configured to test DC signals for your DC-test applications if necessary. For single-ended applications, please see the |Z| Probe. For applications requiring just two signals, the Dual |Z| Probe is available. The Multi |Z| Probe can also be integrated into the |Z| Probe Card for high-throughput RF testing.
More Product Information
- Reduce service stoppages with a fanless design
- Inspect multiple sites through the support for four GigE Vision and four USB3 Vision cameras
- Simplify cabling for GigE Vision installations using Powerover-Ethernet (PoE)-enabled ports
- Tackle deep learning and traditional machine vision applications with a mobile-class embedded twelfth-generation Intel Core processor
- Connect separately to the factory floor and enterprise networks via two more Gigabit Ethernet ports
- Synchronize with other equipment using the integrated real-time digital I/Os with rotary encoder support and RS-232/RS-485 ports
- Streamline application development using the Aurora Design Assistant flowchart-based IDE or the Aurora Imaging Library SDK
- Tackle machine vision applications with utmost confidence using field-proven tools for analyzing, locating, classifying, measuring, reading, and verifying
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Low running costs, less vibration, less noise, reduced maintenance
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Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
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CMN calibrated thermometry on MC plate
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Operation via touch panel controller: Remote operation via ethernet interface
An impedance tuner is an apparatus, which generates controllable reflection factor (Impedance) over a certain frequency range. Focus uses two basic technologies:
a) For frequencies from 100MHz to 110GHz (and above) we use the slide screw technique (models Multi Harmonic MPT, wideband (fundamental) CCMT, harmonic rejection PHT), in which a reflective probe (slug) is inserted into the slot of a low loss slotted transmission line (slabline or waveguide).
b) For frequencies from below 10MHz to 170MHz we use a lumped element technology (models LFT), whereby variable capacitors are connected with optimized lengths of coaxial cable.
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Verify quality of optical fiber cable assemblies, connectors and short-run networks
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Troubleshoot and distinguish between macro-bends, splices, connectors and breaks
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Locate insertion loss points – save hours of troubleshooting time
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Verify return loss of multiple points in a fiber assembly or harness simultaneously
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Verify and maintain aircraft and shipboard networks
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Customize GUI for automated pass/fail verification of your fiber assembly using software development kit
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Power bypass inductance: 8 nH
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Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
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Supports collinear and non-standard needle configurations
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Up to 16 DC for standard; maximum of 24 DC for custom
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Ideal for probing the entire circuit for functional test
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DC probes can provide power or slow logic to circuit under test
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Designed specifically for temperature compensation of os3100 strain gages relief.
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Ruggedized, weldable sensor package
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Qualified to same rigorous standards applied to electronic gages
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Spot-weld, epoxy, or screw mounted.
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Double-ended design supports multiplexing of many sensors on one fiber
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Included in ENLIGHT’s sensor templates – allows for quick and easy optical to mechanical conversions
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Up to 100 GHz Industry leading analog bandwidth
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Acquisition module configurations with up to:
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4 channels at 36 GHz
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2 channels at 65 GHz
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1 channel at 100 GHz
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Up to 240 GS/s sample rate
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Long Memory - Up to 1.5 Gpt/ch
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Modular Design - build a system with up to 20 acquisition modules, for:
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80 channels at 36 GHz
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40 channels at 65 GHz
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20 channels at 100 GHz
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ChannelSync™ Architecture for 130 fs matching between channels
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Multi-Lane eye, Jitter and Noise Analysis with SDAIII-CompleteLinQ
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Optical Modulation Analysis with Optical-LinQ
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PAM4 Eye, Jitter and Noise Measurements with PAM4 Signal Analysis
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Industry’s only true hardware 14.1 Gb/s serial trigger
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Add 12.5 GS/s mixed-signal capability at any time with the HDA125 high-speed digital analyzer
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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