FormFactor - Cascade DCP-HTR Series Probe - High-performance DC parametric probe
-
Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
-
Guarantees fully-guarded measurements to fA and fF levels
-
Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
-
Allows probing of different pad materials and sizes
-
Fast replacement of worn probes without the need for tools
The DCP-HTR probe delivers fA-level measurement capability from -65 °C to 300 °C for advanced characterization and reliability testing. Its unique design offers superior guarding and shielding over-temperature, overcoming the high-temperature performance limitations of standard coaxial needles. When used on a probe station with a MicroChamber, the DCP-HTR allows full utilization of semiconductor parametric test instruments. The optional probe tips with small diameter are ideal for probing pads as small as 30 x 30 μm.
Document
More Product Information
-
Best price per contact – typically over one million (1,000,000) touchdowns
-
RF/Microwave signal is shielded and completely air isolated in the probe body
-
Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
-
Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
-
Probe on any pad material with minimal damage
-
Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
-
Online design configuration tool helps you to specify your probe in minutes
-
All designs are fully quadrant compatible
-
Full solution includes probes, calibration substrates, stations, accessories and software
-
Scalable architecture for future needs
-
Sample can be loaded or removed when the cryostat is cold
-
High cooling power with sample in (He-3) liquid (400 mK with 400 microwatt cooling power)
-
Sample probe and a load-lock with gate valve
-
Fully isolated experiment space for true 4K temperatures during probing
-
Cryogenic positioners to provide large travel ranges without warming up the device
-
Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
-
A soft vacuum bellows provides a compliant mounting interface for the cryocooler
-
Quick release vacuum feedthroughs for easy configurability
-
A large rectangular port for high signal capacity
See more Key Features in Specifications & Details tab
-
Designed for use with specific Probe Systems
-
Tables to suit all facility requirements and applications
-
Stable probing, even in submicron range
-
Granite platen ensures rigidity and temperature stability
-
Can be combined with the Shield Enclosures
-
Revolutionary technology advancement for wafer and die-level photonics probing
-
Real-time in-situ calibrations
-
Highest accuracy in test results
-
Lowest coupling loss
-
New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
-
Minimized coupling losses with minimal trench dimensions
-
Industry standard for vertical coupling to wafer-level grating couplers
-
Dark, shielded and frost-free
-
-40°C to +125°C
-
Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
-
Exclusive FormFactor-developed automated test methodology
-
FormFactor-developed graphical user interface to manually control the optical positioning system
-
Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab
-
Best solution for high accuracy IV/CV, low-noise and 1/f measurements with PureLine, AutoGuard and next generation MicroChamber technologies
-
Enables up to 5x faster time to accurate data
-
Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact
-
RF/microwave device characterization, 1/f, WLR, FA and design debug
-
Wide range of extremly performant, reliable thermal chuck systems from ATT
-
Easy on-screen navigation, wafer mapping, and operation of accessories and thermal systems with Velox
-
User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
-
Long holding time: 80 hours with 10 STP liter He-3 gas
-
Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line
-
Sample can be loaded or removed when the cryostat is cold
-
Low noise, low vibration
-
Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
-
Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
-
Guarantees fully-guarded measurements to fA and fF levels
-
Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
-
Allows probing of different pad materials and sizes
-
Fast replacement of worn probes without the need for tools
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
Document
