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The RL1424 is characterized as a Small Aimed Bright Field ring light.
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Precisely aimed LEDs provide a level of lighting control not found in traditional illuminators.
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A range of standoffs and fields of view may be specified at the time of order.
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The RL1424 is available in a wide range of wavelengths from UV to IR.
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Diffuser and polarizer options are also available.
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The large inner diameter of the ring light can accommodate lenses up to 55mm in diameter.
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The light can also be ordered with a variety of mounting options.
FormFactor - Cascade T-Wave Probe - Wafer-level electrical measurement of mmW devices and materials up to 1.1 THz
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Low insertion loss
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Low contact resistance
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Lithographically defined probe tip
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Nickel contacts
See more Key Features on Specifications & Details tab
T-Wave Probes set the industry performance standard for on-wafer measurements of millimeter and submillimeter wavelength devices. T-Wave Probes include both waveguide banded probes and broadband (dual band) probes.
T-Wave Waveguide Banded Probes
- Low insertion loss
- Low contact resistance
- 140 GHz – 1.1 THz versions
- Probe pitch as narrow as 25 μm
- Lithographically-defined probe tip
- Nickel contacts
T-Wave Broadband (Dual Band) Probes
- kHz to 170 GHz and kHz to 220 GHz versions available
- Low insertion loss
- Low contact resistance
- On Probe Integrated diplexer for integrating the coax and Wave Guide bands
- Probe pitch as narrow as 50 μm
- Lithographically defined probe tip
- Nickel contacts
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Exclusively available for use with the following system setup:
- FormFactor Probe systems using RFA probe arms with 45° dual frequency extender mounts
- Keysight 5291A VNA with integral 220 GHz single sweep capability
- Plus the Keysight M4 heads pared with the VDI Mini extended range frequency extenders
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More Product Information
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Enables wafer probing up to 100 A pulsed and 10A DC
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Innovative multi-fingertip design provides even distribution of current
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Supports up to 500 V
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Replaceable Tungsten probe tips
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Temperature range of -60°C to 300°C
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Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
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Prevents against thermal runaway
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Measure devices on wafer at higher currents than ever before
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Small scrub minimizes damage to aluminum pad
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Small footprint – tip fits on a 1 mm pad
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Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
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Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
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Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
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Durable probe structure ensures more than 250,000 contacts
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Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Intuitive, manual drives
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Front loading capability through load door
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Software control of chuck for fast step-and-repeat testing of the entire wafer
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Fast step-and-repeat testing of the whole wafer
See more Key Features on Specifications & Details tab
The AR RF/Microwave Instrumentation Model FM7004A is a versatile electric and magnetic field monitoring system which performs all measurement display and control functions for field related testing. The FM7004A accepts inputs from up to 4 isotropic Field Probes which are all sold separately to match the test application.
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
For more information please contact your local sales representative.
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Pulse Amplifier
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M1–M5
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10,000 Watts
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8GHz–10GHz
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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