AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.

Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.

From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.

Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.

• Latest Global and Rolling Shutters sensors from Sony® - from 2 to 12 MP
• USB3 Vision interface
• Compact fully-enclosed design with features needed by modern vision systems
• Provide advanced vision performance while using less power, less space, and fitting increasingly tight industry budgets

Differential active probes are like two probes in one. Instead of measuring a test point in relation to a ground point (like single-ended active probes), differential probes measure the difference in voltage of a test point in relation to another test point

• Ideal probe for up to 48 V power conversion
  • 250, 500 MHz and 1 GHz bandwidth
  • 80 V dynamic range
  • 60 V common mode
• Highest accuracy
  • 0.5% gain accuracy
  • Precision gain calibration
  • Best LF flatness (0.1 dB)
• Lowest noise and highest rejection
• Wide variety of tips
  • High performance solder-in
  • Browser
  • Single pins and header
  • Mini and micro grabbers
  • Socketed connections
  • High temp solder-in
  • Y-banana adaptor
• ProBus active probe interface

Fully Integrated: With the ProBus™ interface, the AP033 becomes an integral part of the oscilloscope. The probe sensitivity and offset can be controlled from the oscilloscope front panel, the probe front panel, or by using remote control commands (GPIB or RS-232). Sensitivity, offset, input capacitance, and common mode voltage range are displayed on the oscilloscope screen. When used with a LeCroy digital oscilloscope, no external power supply is required.

High voltage differential probes provide high CMRR over a broad frequency range (up to 400 MHz) to simplify the measurement challenges found in noisy, high common-mode power electronics environments. The probe’s design is easy-to-use and enables safe, precise high voltage floating measurements.

WaveMaster 8000HD is the only high speed oscilloscope designed for all stages of product development, whether first-silicon characterization, link validation over channels, or debugging across the entire the protocol stack. No other high speed oscilloscope supports more engineering tasks with more unique tools.

• Exceptional signal characterization performance
• Unrivaled validation and debug capabilities
• Comprehensive serial data expertise

• High speed 120 kHz, high resolution 28 μm or 900 dpi 
• No missing or interpolated pixels 
• Exposure control 
• Mono/HDR mode 
• Precalibrated pixel size for metrology applications 
• Camera Link HS fibre interface

• 10 GigE Ethernet port & hardware 
• Industry’s smallest 67M 10GigE Vision camera 
• Simplified set-up with field proven Sapera LT software featuring CamExpert 
• Engineered to accommodate industrial environment with a ruggedized screw mount RJ-45 connector