Arbitrary Waveform Generator
Products
- Available in 30MHz, 40MHz, 60MHz, 80MHz, 120MHz, 200MHz, 350MHz and 500MHz models.
- All models feature 2 channels.
- Max Sampling rate of 150 Msa/s (30MHz & 60 MHz) 1.2 Gsa/s (40MHz, 80MHz, 120MHz) and 2.4 Gsa/s (200MHz, 350MHz and 500MHz) models.
- Up to 16-bit vertical resolution (14-bit on 30MHz & 60MHz models).
- All models have 4.3" Touchscreens.
- Excellent analog and digital modulation types available (AM, DSB-AM, FM, PM, PSK, FSK, ASK and PWM).
- 150 MHz, 2 analog channels
- 8 synchronized digital channels (T3AWG2152-D only)
- 16-bit vertical resolution
- 128 MPts @Ch waveform memory
- Max sampling rate of 600 MS/s
An affordable yet high performance solution for all AFG and AWG functions, specializing in key applications such as Automotive Ethernet Transmitter Distortion Test and Double Pulse Testing. The 8 synchronized digital channels (T3AWG2152-D only) are ideal for digital design debugging and validation.
- Available in 250 MHz and 350 MHz models.
- 2, 4 and 8 channel modes.
- 16-bit vertical resolution.
- Max Sampling rate of 1.2 GS/s.
- Max sinewave frequency of 250 MHz and 350 MHz respectively.
The disruptive and innovative architecture enables to generate/add 8, 16 or 32 channel digital patterns (respectively on 2,4 or 8 analog channels platform) and to operate all models in true arbitrary mode or Direct Digital Synthesis (DDS) mode. Thanks to their high performance, versatile functionality and outstanding usability, the HD T3AWG3K series is the ideal AWG generator for today's and tomorrow's test challenges.
- 2, 4 and 8 channel configurations
- 16-bit vertical resolution
- Sample Rate up to 12.32 GS/s with RF mode
- 16-bit vertical resolution.
- 4 Gpts waveform memory per channel
- Up to 5 Vpp Output Voltage and ±2.5 V Baseline Offset 50 Ohm
- 4-Channel, 204.8 Ksa/s per channel, 24-Bit DACs
- -115 dB spurious free dynamic range
- Integrated 2-Channel 64-bit tachometer
- Integrated 4-Channel DIO
- Tight synchronization with DSA analyzers
- Ideal for rotational measurement, and stimulus-response applications such as vibration test
- Output modes including Sine, Burst Sine, Chirp, Burst-random and continuous random