• On-wafer power device characterization up to 10,000 V DC / 600 A
• Safe and convenient integration kits to support T.I.P.S. “LuPo” High Voltage / High Power Probe Cards
• Prevent thin wafers from curling and breaking
• Safety interlock system with clear enclosure for operator safety during device measurements
• Convenient connection kits for easy and safe system integration with power device analyzers from Keysight Technologies and major suppliers
• Up to 25% lower air consumption (CDA) than other systems in the market (300l/min) with no compromise in transition times
• Windows 10 compatibility enables highest performance and safe operation with state-of-the-art hardware

• Long holding time: 80 hours with 10 STP liter He-3 gas
• Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line
• Sample can be loaded or removed when the cryostat is cold
• Low noise, low vibration
• Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)

• Trigger over Ethernet
• Piecewise Linear HDR feature
• IEEE 1588 PTP
• Ultra-compact design
• Monochrome (G-030B) and color (G-030C) models
• GigE Vision interface with Power over Ethernet
• Screw mount RJ45 Ethernet connector for secure operation in industrial environments
• Supports cable lengths up to 100 meters (CAT-6 recommended)
• Comprehensive I/O functionality for simplified system integration
• Trigger over Ethernet Action Commands allow for a single cable solution to reduce system cost
• IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
• Popular C-Mount lens mount
• Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
• Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
• Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
• Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter

• Different substrate carriers for wafers up to 150 mm or single dies
• Up to six positioners
• Probe positioners placed inside vacuum chamber
• Short and stable probe arms
• Ergonomic and straightforward design
• Intuitive, manual operation
• Independent control of linear chuck stage and positioners
• Contact/separation stroke for probe platen

The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.

• Comprehensive I/O connections: Standard setup of up to 24 RF lines (up to 20 GHz) and 48 DC lines, with extensions to higher I/O connections possible.
• Non-magnetic construction: Capable of characterizing qubits below 50 mK without magnetic interference when required.
• Sample size: Proven with chips up to 10×10 mm in size.
• Pressure-based contact: Connect test and measurement I/O to DUT pads using pressure only. No permanent connection required.

• Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL
• Re-configurable and upgradable as requirements grow
• Minimizes setup times with no loss in performance or accuracy
• Seamless integration of various measurement instruments
• Solid station frame
• Built-in vibration-isolation solution for superior vibration attenuation
• Rigid microscope bridge
• Compact and rigid mechanical design
• Highly accurate measurement results
• Incorporates best-known methods
• Ergonomic and straightforward design for comfortable and easy operation
• Low-profile design
• Simple microscope operation
• Quick and ergonomic change of DUT through pull-out stage
• Minimize training efforts
• Fast time to data
• Convenient operation