FormFactor - Cascade Resistive Matching and Termination - Custom configured for your application
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Can help to stabilize oscillations in high-gain devices
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Impedance match to low dynamic resistance laser diodes
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Custom configured for your application
Resistive Impedance Matching Probes and Termination probes are available for the following probe families: Infinity; ACP; FPC, in multiple configurations. We use high performance / high quality RF resistors for these Matching or Termination probes and the resistors are placed as close as possible to the tip/DUT, to minimize the path length between the DUT and the resistor. The available Resistance values are limited and are listed in the request form. These types of Impedance Matching and Termination probes are used in various application such as with laser diodes, Transmission Line Pulse, ensure better termination of 50 ohm test equipment when mated to high impedance devices, etc.
More Product Information
![FormFactor - Cascade Shield Enclosure Light-tight probing FormFactor - Cascade Shield Enclosure Light-tight probing](/sites/default/files/styles/max_325x325/public/systems_acc_shield-enclosure.jpg?itok=6_4G8eC0)
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Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
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Application flexibility, ideal for use in high frequency applications
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Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
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Suitable for integration with vibration isolating tables
![FormFactor - Cascade ACP-Q Probe - Multiple configurations for functional circuit testing FormFactor - Cascade ACP-Q Probe - Multiple configurations for functional circuit testing](/sites/default/files/styles/max_325x325/public/probe-acp-q.png?itok=CHlZtSgT)
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Combination of DC and RF in a single probe module: One dual probe or a maximum of three RF; a maximum of 9 DC standard (other quantities upon request).
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Utilizes ACP tip design, GSG, GS or SG
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RF tips available from DC to 110 GHz
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Choice of BeCu or tungsten tips
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DC power needles come standard with 100 pF microwave capacitor
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Power bypass inductance: 8 nH
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Maximum DC voltage: 50 V without power bypassing (25 V with standard power bypassing, and component dependent with custom power bypassing)
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Ideal for probing the entire circuit for functional test
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Dual ACP configuration supports differential signaling applications
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DC probes can provide power or slow logic to circuit under test
![FormFactor - Cascade IMS-K-SiPh - Integrated system with Keysight Photonics Application Suite hardware and software FormFactor - Cascade IMS-K-SiPh - Integrated system with Keysight Photonics Application Suite hardware and software](/sites/default/files/styles/max_325x325/public/ims-k-siph-product-photo.jpg?itok=rpewtp3d)
![FormFactor - Cascade Infinity Probe – Coaxial - High-frequency performance with low, stable contact resistance on aluminum pads FormFactor - Cascade Infinity Probe – Coaxial - High-frequency performance with low, stable contact resistance on aluminum pads](/sites/default/files/styles/max_325x325/public/infinity_probe.png?itok=mPGc_RN3)
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Superior field confinement reduces unwanted couplings to nearby devices and transmission modes
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Superior measurement accuracy and repeatability
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Small scrub minimizes damage to aluminum pad
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Typical contact resistance < 0. 05 Ω on Al, <0.02Ω on Au
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Save valuable wafer space and reduce pad parasitics by being able to shrink pad geometries to 25 x 35 µ m (best case)
![FormFactor - HPD Model HE-3-TLSUHV-STM - Wet Helium-3 Cryostat FormFactor - HPD Model HE-3-TLSUHV-STM - Wet Helium-3 Cryostat](/sites/default/files/styles/max_325x325/public/he-3-tlsuhv-stm-close-up.jpg?itok=MMzYucm2)
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Long holding time: 80 hours with 10 STP liter He-3 gas
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Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line
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Sample can be loaded or removed when the cryostat is cold
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Low noise, low vibration
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Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
![FormFactor - Cascade PA200 BlueRay - 200 mm semi-/ fully-automated production probe system FormFactor - Cascade PA200 BlueRay - 200 mm semi-/ fully-automated production probe system](/sites/default/files/styles/max_325x325/public/blueray-animated.gif?itok=oHr5q04f)
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Die-to-die stepping time of under 100 ms
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Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology
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Even extreme variations in height, such as the case with warped wafers, can be compensated
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Interfaces to all major analysis instrumentation, optics software and testers
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Access to top side and bottom side of device under test (DUT)
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Highly accurate light measurement
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Test automation out-of-cassette for 24/7 operation
![FormFactor - Cascade CSR Cal Substrates - Perfectly matched to the |Z| Probe® FormFactor - Cascade CSR Cal Substrates - Perfectly matched to the |Z| Probe®](/sites/default/files/styles/max_325x325/public/calibration-csr.jpg?itok=r30zXt0L)
The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.
![FormFactor - SurfaceSens - Modular optical metrology set-up for hybrid surface process control FormFactor - SurfaceSens - Modular optical metrology set-up for hybrid surface process control](/sites/default/files/styles/max_325x325/public/frt-multi-sensor-technology_en.jpg?itok=VN8O7ud2)
![FormFactor - Cascade Vibration Isolation Tables - Tables from simple to highly sensitive FormFactor - Cascade Vibration Isolation Tables - Tables from simple to highly sensitive](/sites/default/files/styles/max_325x325/public/vibration-isolation-table.jpg?itok=xuu2eH56)
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Designed for use with specific Probe Systems
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Tables to suit all facility requirements and applications
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Stable probing, even in submicron range
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Granite platen ensures rigidity and temperature stability
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Can be combined with the Shield Enclosures
![FormFactor, Inc. FormFactor, Inc.](/sites/default/files/styles/max_650x650/public/formfactor_logo.png?itok=t8732IWX)
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
![FormFactor - Cascade Resistive Matching and Termination - Custom configured for your application FormFactor - Cascade Resistive Matching and Termination - Custom configured for your application](/sites/default/files/styles/max_2600x2600/public/probes-inf-acp-fpc-collage.png?itok=XgYk8kFu)