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Pre-Engineered Scalability Enables Customized Emitting Lengths in 2″ Increments to 20″
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Intense, Diffuse Lighting with 226 kLux at Emitting Surface
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Multiple Available Wavelengths, Including Visible Monochromatics, Infrared, and White
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Available Washdown Option for Difficult Environments
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Can be Applied in Backlighting or Diffuse Front Lighting Geometries
FormFactor - HPD Custom He-3 Series - Helium-3 Cryostats
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Cryogen-free option available
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Flexible sample space
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Low noise, low vibration
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Long holding time
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Stable He-3 pot temperature
We have deep expertise in adapting our proven He-3 cryostat designs to meet a broad range of requirements. Contact us for a customized system to suit your specific application.
Some examples of customized solutions include:
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HE-3-BLSUHV-STM
Bottom sample loading – sample in UHV
The model HE-3-BLSUHV-STM is a bottom loading vibration isolated Helium-3 cryostat for scanning tunneling microscope (STM) applications with sample in ultra-high vacuum environment. -
HE-3-SUHV-PT
Dry or Wet options available – sample in HV or UHV – continuous flow
The model HE-3-SUHV-PT provides a high cooling power cryogen-free mK platform for versatile applications, such as transport measurement, optical access etc. This system can also be operated with pure HE-4 at a lower cost. -
HE-3 Cryostats for ARPES
Dry or Wet options available – sample in UHV – continuous flow
These systems were specifically developed for high-resolution angle-resolved photoemission spectroscopy below 1K (Sub-K ARPES). However, the design can be used for a variety of other applications with similar requirements.
More Product Information
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High power capability: +/- 200V, 17A.
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Minimum pulse width: 200ns.
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Modular design which enables multiple configurations.
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Shared library. The MPIV can be used as a standalone instrument using an ActiveX library, which easily integrates into existing test software.
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Flexible Input/Output. Choose between high power and high precision pulse modules to create a customized setup for your specific application.
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Compatible with Focus Microwaves’ device characterization software (Load Pull Explorer, LPEx)
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Intuitive, manual drives
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Front loading capability through load door
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Software control of chuck for fast step-and-repeat testing of the entire wafer
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Fast step-and-repeat testing of the whole wafer
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Trigger over Ethernet
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Piecewise Linear HDR feature
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IEEE 1588 PTP
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Ultra-compact design
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Monochrome (G-030B) and color (G-030C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system cost
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IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
See the Customization and OEM Solutions webpage for additional options.
Customized Solutions for a Variety of Challenging Applications
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Quick and easy probe tip navigation
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Z drive can work in the same range as the chuck
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Enables higher separation gap while the DUT stays in focus
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Automatically configure and optimize performance
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24/7 operating
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Increased MTBF
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Protects the measurement setup
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Prevents involuntary mechanical contact between lens and probes
- Solve machine vision applications efficiently by constructing flowcharts instead of writing program code, using field-proven tools for analyzing, classifying, locating, measuring, reading and verifying
- Use a single program for creating both application logic and operator interface
- Leverage deep learning for visual inspection through image classification and segmentation tools
- Rely on a common underlying vision library for the same results with an Iris GTX smart camera, vision systems or third-part computer
- Work with multiple cameras all within the same project or per project running concurrently and independently from one another, platform permitting
- Interface to Zebra AltiZ and third party 3D sensors to visualize, process and analyze depth maps and point clouds
- Communication options include discrete Zebra I/Os, RS-232, and Ethernet (TCP/IP, CC-Link IE Field Basic, EtherNet/IP, Modbus, OPC UA, and PROFINET, and native robot interfaces)
- Maximize productivity with instant feedback on image analysis and processing operations
- Receive immediate pertinent assistance through an integrated contextual guide
- Maintain control and independence through the ability to create custom flowchart steps
- Test communication with PLC using the built-in PLC interface emulator
- Protect against inappropriate changes with the Project Change Validator tool
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Fully isolated experiment space for true 4K temperatures during probing
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Cryogenic positioners to provide large travel ranges without warming up the device
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Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
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A soft vacuum bellows provides a compliant mounting interface for the cryocooler
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Quick release vacuum feedthroughs for easy configurability
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A large rectangular port for high signal capacity
Small form factor rugged mini PCs designed in secure, compact enclosures to enhance performance and adaptability alongside evolving workloads. ION Mini PCs are designed to enhance performance, scalability, and security for the most complex application and program demands.
- Harsh-environment Protection - All key components are stress-tested to pass stringent military standards, ensuring stability in harsh environments.
- Server-class Features - A Mini PC powerhouse with server-class specs like IPMI for remote management and virtualization for increased flexibility and scalability.
- Full Control & Customization - Our in-house software engineers can tweak BIOS source code to bolster firmware security and meet your exact needs.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000