FormFactor - Cascade Positioners - DC, RF and optical probe positioning for highest accuracy measurements
DC, RF and Optical Probe Positioning for Highest Accuracy Measurements
FormFactor offers a wide variety of manual and motorized probe positioners for any application from DC to terahertz measurements and beyond.
Engineered for high stability and accuracy, FormFactor‘s positioners enable precise, backlash-free and repeatable probe tip placements – from simple IV/CV measurements to highly challenging measurement tasks.
Enhanced with FormFactor‘s High Temperature Stability (HTS), the positioners become part of our exclusive Contact Intelligence™ Technology that enables small pad probing over a full temperature range.
Unsurpassed accuracy and highest productivity is achieved with the revolutionary Autonomous Measurement Assistants for DC, RF and Silicon Photonics testing. These wafer probing assistants utilize our programmable positioners and enable fully autonomous, hands-free measurements – minimizing training needs and accelerating time to market.
Designed and validated with proven quality standards, our positioners are always the perfect match to your FormFactor probe station.
Application Flexibility
Probe Station Compatibility
|
MPS150/ EPS150 |
Summit | BlueRay |
PM8/ EPS200 |
CM300xi |
PA300/ PM300 |
Tesla | Vac/Cryo | |
|---|---|---|---|---|---|---|---|---|
| Manual Positioners | ||||||||
| DPP105 | O | - | - | O | X | O | X | X |
| DPP2xx | O | O | O | O | O | O | O | X |
| DPP3xx | O | - | - | O | - | O | - | X |
| DPP450 | O | - | X | - | - | - | X | X |
| VCP110 | X | X | X | X | X | X | X | O |
| RPP210 | O | O | O | O | O | O | O | X |
| RPP304 | O | O | X | O | O | X | X | X |
| RPP305 | O | - | O | O | O | O | X | X |
| RPP404 | O | O | X | O | O | X | X | X |
| mmW LAP | X | O | - | O | O | - | - | X |
| Motorized Positioners | ||||||||
| RPP504 | X | O | - | O | O | X | X | X |
| PH510 | X | - | O | O | - | O | X | X |
| SiPh | X | O2 | - | - | O | X | X | X |
| Recommended (O) | Possible (not recommended) (-) | Not compatible (X) |
|
1 Summit12000 only 2SUMMIT200 only |
||
More Product Information
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Comprehensive I/O connections: Standard setup of up to 24 RF lines (up to 20 GHz) and 48 DC lines, with extensions to higher I/O connections possible.
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Non-magnetic construction: Capable of characterizing qubits below 50 mK without magnetic interference when required.
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Sample size: Proven with chips up to 10×10 mm in size.
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Pressure-based contact: Connect test and measurement I/O to DUT pads using pressure only. No permanent connection required.
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DC-40 GHz bandwidth
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10 ps rise time
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Low insertion and return loss
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2 mils of tip-to-tip compliance
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High probing angle and clearance
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Fully isolated experiment space for true 4K temperatures during probing
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Cryogenic positioners to provide large travel ranges without warming up the device
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Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
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A soft vacuum bellows provides a compliant mounting interface for the cryocooler
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Quick release vacuum feedthroughs for easy configurability
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A large rectangular port for high signal capacity
See more Key Features in Specifications & Details tab
Impedance Standard Substrates (ISSs) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. Our ISSs offer the proven accuracy of LRRM calibrations with automatic load inductance compensation.
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Coaxial and triaxial measurements up to 10,000 V
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High-quality construction with low-noise electrical performance
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Replaceable probe tips in a variety of tip sizes
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Temperature range of -60°C to 300°C
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Triaxial measurement ensures a much better understanding of device leakage in the off state
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Highly reliable, stable and repeatable measurements
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Integrally designed as part of a complete measurement solution
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Sample can be loaded or removed when the cryostat is cold
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High cooling power with sample in (He-3) liquid (400 mK with 400 microwatt cooling power)
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Sample probe and a load-lock with gate valve
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Joystick controller
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Manual probe positioners with rotary feed-throughs
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Software control of chuck for fast step-and-repeat testing of the entire wafer
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Fast step-and-repeat testing of the whole wafer
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User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
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Substrate material: High-resistivity silicon
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Substrate thickness: 275 µm
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Dielectric constant: 11.8
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Nominal Z0: 50 Ω
Ultra Low Temperature
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Pulse tube cryocooler for cryogen free 4K temperatures
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Two stage ADR provides solid state cooling down to 30mK
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Sample stage mounting at both 1K and 50mK
Configurability
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Multiple stage feedthroughs for thermally intercepting the signals
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Two large electrical bread boards for more configurable space
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Rapid cool options for faster cooldowns
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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