FormFactor - Cascade Positioners - DC, RF and optical probe positioning for highest accuracy measurements
DC, RF and Optical Probe Positioning for Highest Accuracy Measurements
FormFactor offers a wide variety of manual and motorized probe positioners for any application from DC to terahertz measurements and beyond.
Engineered for high stability and accuracy, FormFactor‘s positioners enable precise, backlash-free and repeatable probe tip placements – from simple IV/CV measurements to highly challenging measurement tasks.
Enhanced with FormFactor‘s High Temperature Stability (HTS), the positioners become part of our exclusive Contact Intelligence™ Technology that enables small pad probing over a full temperature range.
Unsurpassed accuracy and highest productivity is achieved with the revolutionary Autonomous Measurement Assistants for DC, RF and Silicon Photonics testing. These wafer probing assistants utilize our programmable positioners and enable fully autonomous, hands-free measurements – minimizing training needs and accelerating time to market.
Designed and validated with proven quality standards, our positioners are always the perfect match to your FormFactor probe station.
Application Flexibility
Probe Station Compatibility
|
MPS150/ EPS150 |
Summit | BlueRay |
PM8/ EPS200 |
CM300xi |
PA300/ PM300 |
Tesla | Vac/Cryo | |
|---|---|---|---|---|---|---|---|---|
| Manual Positioners | ||||||||
| DPP105 | O | - | - | O | X | O | X | X |
| DPP2xx | O | O | O | O | O | O | O | X |
| DPP3xx | O | - | - | O | - | O | - | X |
| DPP450 | O | - | X | - | - | - | X | X |
| VCP110 | X | X | X | X | X | X | X | O |
| RPP210 | O | O | O | O | O | O | O | X |
| RPP304 | O | O | X | O | O | X | X | X |
| RPP305 | O | - | O | O | O | O | X | X |
| RPP404 | O | O | X | O | O | X | X | X |
| mmW LAP | X | O | - | O | O | - | - | X |
| Motorized Positioners | ||||||||
| RPP504 | X | O | - | O | O | X | X | X |
| PH510 | X | - | O | O | - | O | X | X |
| SiPh | X | O2 | - | - | O | X | X | X |
| Recommended (O) | Possible (not recommended) (-) | Not compatible (X) |
|
1 Summit12000 only 2SUMMIT200 only |
||
More Product Information
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Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
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Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
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Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
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Calibration Monitor and Re-calibration – System will
continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.
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Fully isolated experiment space for true 4K temperatures during probing
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Cryogenic positioners to provide large travel ranges without warming up the device
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Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
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A soft vacuum bellows provides a compliant mounting interface for the cryocooler
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Quick release vacuum feedthroughs for easy configurability
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A large rectangular port for high signal capacity
See more Key Features in Specifications & Details tab
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Functional temperature range of -263 to +150°C
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Stainless steel tip material for thermal decoupling
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Coaxial cable with TCE matched inner and outer conductors
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Consistent tip geometry even at cryogenic temperatures
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
For more information please contact your local sales representative.
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Designed for use with specific Probe Systems
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Tables to suit all facility requirements and applications
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Stable probing, even in submicron range
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Granite platen ensures rigidity and temperature stability
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Can be combined with the Shield Enclosures
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On-wafer power device characterization up to 10,000 V DC / 600 A
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Safe and convenient integration kits to support T.I.P.S. “LuPo” High Voltage / High Power Probe Cards
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Prevent thin wafers from curling and breaking
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Safety interlock system with clear enclosure for operator safety during device measurements
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Convenient connection kits for easy and safe system integration with power device analyzers from Keysight Technologies and major suppliers
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Up to 25% lower air consumption (CDA) than other systems in the market (300l/min) with no compromise in transition times
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Windows 10 compatibility enables highest performance and safe operation with state-of-the-art hardware
See more Key Features on Specifications & Details tab
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Superior field confinement reduces unwanted couplings to nearby devices and transmission modes
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Superior measurement accuracy and repeatability
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Small scrub minimizes damage to aluminum pad
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Typical contact resistance < 0. 05 Ω on Al, <0.02Ω on Au
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Save valuable wafer space and reduce pad parasitics by being able to shrink pad geometries to 25 x 35 µ m (best case)
See more Key Features on Specifications & Details tab
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High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
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RF bandwidth to 500 MHz
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Long probe life: > 250,000 contacts
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Beryllium-copper tips for gold pads or tungsten for aluminum pads
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Oscillation-free testing of wide-bandwidth analog circuits
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Use with ACP series probes to provide functional at-speed testing for known-good-die
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Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
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Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)
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Multi-purpose SIGMA instrument integration kit
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Shorter cabling and universal chuck connection
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Triax probe with protected guard
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Triax design for low-leakage measurements up to 3 kV
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Special chuck surface coating
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High-isolation ready
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Arcing protection
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Shield Enclosure with interlock
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Advanced grounding concept
See more Key Features on Specifications & Details tab
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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