FormFactor - Cascade CM300xi-SiPh - 300 mm semi-/ fully-automated probe system with Autonomous Silicon Photonics Measurement Assistant

  • Revolutionary technology advancement for wafer and die-level photonics probing
  • Real-time in-situ calibrations
  • Highest accuracy in test results
  • Lowest coupling loss
  • New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
  • Minimized coupling losses with minimal trench dimensions
  • Industry standard for vertical coupling to wafer-level grating couplers
  • Dark, shielded and frost-free
  • -40°C to +125°C
  • Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
  • Exclusive FormFactor-developed automated test methodology
  • FormFactor-developed graphical user interface to manually control the optical positioning system
  • Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab

More Product Information

slide 2 of 4