FormFactor - Cascade Vibration Isolation Tables - Tables from simple to highly sensitive
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Designed for use with specific Probe Systems
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Tables to suit all facility requirements and applications
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Stable probing, even in submicron range
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Granite platen ensures rigidity and temperature stability
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Can be combined with the Shield Enclosures
Full range of vibration isolation tables
Working with increasingly small scales of reference means that any vibration however minimal, even from the equipment itself, will seriously degrade a probe station’s performance. Slight vibrations will cause the probes to jump and miss their contacts and the microscope image will be blurred. Our range of vibration isolation tables includes a simple table for general working conditions as well as specifically designed tables for very sensitive measurements such as in the submicron range.
More Product Information
![FormFactor - Cascade Multi-|Z| Probe - Test Up to 16 RF Signals with One Probe FormFactor - Cascade Multi-|Z| Probe - Test Up to 16 RF Signals with One Probe](/sites/default/files/styles/max_325x325/public/probe-multi-z.jpg?itok=56H7y6Y2)
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Ideal for multiport RF/Microwave and high-speed digital signal testing
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Mix DC and RF/Microwave signals on one probe
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Long lifetime – typically over one million (1,000,000) touchdowns
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Excellent performance in temperatures ranging from 10 K to 200°C
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Probe on any pad material with no damage
![Focus Microwaves - Low Frequency Tuners Focus Microwaves - Low Frequency Tuners](/sites/default/files/styles/max_325x325/public/lft-013006-2-1024x358.png?itok=I0ekWXEr)
The low frequency tuners are a unique product technology using MPT algorithms for low frequency wideband tuning. Three or more cascaded tuning sections use series transmission cables and parallel rotary capacitors.
The length of the cables and number of tuning sections are optimized for maximum tuning range over a given bandwidth. HLFT tuners use 6 tuning sections allowing second harmonic frequency tuning.
![FormFactor - HPD Model HE-3-TLSL - Wet Helium-3 Cryostat FormFactor - HPD Model HE-3-TLSL - Wet Helium-3 Cryostat](/sites/default/files/styles/max_325x325/public/he-3-tlsl-cryostat-front.jpg?itok=rm21H2QO)
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Sample can be loaded or removed when the cryostat is cold
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High cooling power with sample in (He-3) liquid (400 mK with 400 microwatt cooling power)
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Sample probe and a load-lock with gate valve
![VIAVI - Xgig 4K16 Protocol Analyzer/Jammer Platform for PCI Express 4.0 VIAVI - Xgig 4K16 Protocol Analyzer/Jammer Platform for PCI Express 4.0](/sites/default/files/styles/max_325x325/public/xgig-4k16-pci-express.png?itok=IQ6Gq0D3)
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Interposers: x8 and x16 Slot, x4 Flying Lead pod, x4 M.2, x4 U.2 (available in dual port), and x16 SFF-8644
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1U+ chassis with 128GB memory (64GB upstream and 64GB downstream)
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Host-Client connection for remote debugging using Ethernet or local debugging using USB
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SMB capture and trigger for NVMe Management Interface (NVMe-MI) observability
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Simultaneously Analyze and Jam on a single chassis using one interposer
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Decodes all PCIe and NVMe traffic at all layers of the stack including the TLP, DLLP, and PHY layer logic sub-blocks
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Trigger and Search events include training sequences, ordered sets, queue pairs, PRPs, Scatter/Gather Lists (SGL), SMB, etc.
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The Tap Upstream and Downstream ports allow AJA configuration Jamming
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Cascade up to 4 Xgig captures into a single trace view
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Full support of LTSSM for PCI Express
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Memory segmentation for capture of multiple traces
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Field replaceable modular fan and power supply assemblies
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Portable, lightweight, and stand-alone
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One-year hardware and three-year software warranties for the Xgig 4K16 PCI Express 4.0 Protocol Analyzer/Jammer
![FormFactor - Cascade IMS-K-mmW/THz - Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz FormFactor - Cascade IMS-K-mmW/THz - Integrated Measurement System with Keysight VNA for S-parameters from RF to mmW to THz](/sites/default/files/styles/max_325x325/public/ims-k-mmwthz-product-photo.jpg?itok=YZBiwztw)
![FormFactor - Cascade IMS-K-Power - Integrated system with Keysight PDA for power semiconductor device characterization FormFactor - Cascade IMS-K-Power - Integrated system with Keysight PDA for power semiconductor device characterization](/sites/default/files/styles/max_325x325/public/ims-k-power-product-photo.jpg?itok=cD9tWsfN)
![FormFactor - Cascade InfinityXT Probe - Next-generation, high-frequency performance with advanced features FormFactor - Cascade InfinityXT Probe - Next-generation, high-frequency performance with advanced features](/sites/default/files/styles/max_325x325/public/infinityxt-wafer-probe-product-alt-view.png?itok=dT78hHeA)
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Continues the Infinity family’s Industry leading electrical performance
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High temperature capability (175° C +) for automotive device characterization and other applications
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Better tip visibility for enhanced placement accuracy and repeatability
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Improved tip life/durability with solid rhodium contacts
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New tip architecture enables support for narrower pitches (e.g. 25um)
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Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness
![FormFactor - Cascade QuadCard™ - Cost-effective, versatile probe card solution FormFactor - Cascade QuadCard™ - Cost-effective, versatile probe card solution](/sites/default/files/styles/max_325x325/public/quad-card.jpg?itok=8zqrKtkm)
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Accommodates a combination of up to four Cascade Microtech probes
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Configurable for mixed-signal RF/mmW testing
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Quick and easy repairs to be performed in the field, by simply replacing individual probes
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Adaptable to new device layouts by exchanging individual probes
![FormFactor - Cascade PLC50 - 100 mm manual cryogenic probe system FormFactor - Cascade PLC50 - 100 mm manual cryogenic probe system](/sites/default/files/styles/max_325x325/public/plc50_cryogenic_probe_station.jpg?itok=FXBrgAol)
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Different substrate carriers for wafers up to 100 mm or single dies
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Up to six positioners
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Independently cooled cold shield
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Probe positioners placed inside vacuum chamber
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Ergonomic and straightforward design
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Simple microscope operation
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for probe platen
![FormFactor, Inc. FormFactor, Inc.](/sites/default/files/styles/max_650x650/public/formfactor_logo.png?itok=t8732IWX)
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
![FormFactor - Cascade Vibration Isolation Tables - Tables from simple to highly sensitive FormFactor - Cascade Vibration Isolation Tables - Tables from simple to highly sensitive](/sites/default/files/styles/max_2600x2600/public/vibration-isolation-table.jpg?itok=d_Hg9aQb)