Focus Microwaves - Auriga AU-5 Pulsed IV/RF Characterization System
Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed
IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.
Auriga PIV System - 220 V Configuration
Model |
Description |
| AU5 | Pulsed IV/RF Characterization System |
| PHG20 | Pulser Head, ±20 V, 100 mA, 2 W |
| PHD220-10 | Pulser Head, 220 V, 10 A, 200 W |
| N5751A | Power Supply to support 200 V Pulser Heads |
| AU5-RF (Optional) | Pulsed RF Option |
Auriga PIV System - 600 V Configuration
Model |
Description |
| AU5 | Pulsed IV/RF Characterization System |
| PHG20 | Pulser Head, ±20 V, 100 mA, 2 W |
| PHG100 | Pulser Head, ±100 V, 2 A, 40 W |
| PHD600-5 | Pulser Head, 600 V, 5 A, 1000 W |
| N5752A | Power Supply to support 600 V Pulser Heads |
| AU5-RF (Optional) | Pulsed RF Option |
Auriga PIV System - 1200 V Configuration
Model |
Description |
| AU5 | Pulsed IV/RF Characterization System |
| PHG100 | Pulser Head, ±100 V, 2 A, 40 W |
| PHD1200-100 | Pulser Head, 1200 V, 100 A, 5000 W |
| PHD3000-HVK | High-Voltage filter kit for 1200 V Pulser Head series |
| AU-3R100-LCU | High Voltage Power Supply to support 1200 V Pulser Heads |
| AU5-RF (Optional) | Pulsed RF Option |
Auriga PIV System - 2000 V Configuration
Model |
Description |
| AU5 | Pulsed IV/RF Characterization System |
| PHG100 | Pulser Head, ±100 V, 2 A, 40 W |
| PHD2000-100 | Pulser Head, 2000 V, 100 A, 5000 W |
| PHD3000-HVK | High-Voltage filter kit for 2000 V Pulser Head series |
| AU-3R100-LCU | High Voltage Power Supply to support 2000 V Pulser Heads |
| AU5-RF (Optional) |
Pulsed RF Option |
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More Product Information
Non-linear measurement data is often used to create a behavioral model for high frequency components. Formulations of these models have been defined in terms of traveling waves, with a desire to represent nonlinear behavior of high frequency transistors through a direct extension from linear s-parameters.
The Mesuro model portfolio is comprised of two variations of a behavioral model – each targeted at a particular end use – Cardiff Model Lite (CML), where the desired output is a local model, and Cardiff Model+ (CM+), which incorporates higher order mixing terms allowing a single model to fit over a range of impedance space.
Noise measurements allow the determination of the four Noise Parameters of a device (transistor). Focus’ Noise Modules integrate well with various third party noise receivers.
Noise Parameters: These are four numbers that fully describe the noise behaviour of an active or passive device (twoport) at a given frequency. For practical reasons we use the following quantities as Noise Parameters:
Focus’ noise parameter extraction routines leverage the PNA-X’s unique implementation
of the cold-source noise figure measurement technique. This specific technique requires a noise source to determine the kBG (gain-bandwidth constant) of the system and a passive mechanical tuner is used to characterize the noise receiver across both the impedance and frequency space. This step is imperative to obtain fully vector-source-corrected measurements.
of the cold-source noise figure measurement technique. This specific technique requires a noise source to determine the kBG (gain-bandwidth constant) of the system and a passive mechanical tuner is used to characterize the noise receiver across both the impedance and frequency space. This step is imperative to obtain fully vector-source-corrected measurements.
A RF down conversion stage might be required if the frequency of noise measured exceeds the receiver’s bandwidth. Focus offers noise modules which support down conversion for optimal speed and performance.
Noise measurements allow the determination of the four Noise Parameters of a device (transistor). There are four Noise Parameters which fully describe the noise behaviour of an active or passive device at a given frequency.
- The LL137 Series provides a focused line of illumination in a passively cooled design.
- Provides a medium intensity level of 280kLux (working distance of 75mm)
- Pre-engineered for expandability in 6” (152mm) increments up to 96” (2.44m).
- Available intensity control provides illuminance adjustability for every 6″ increment via a 0 – 10v input
Note: If only looking for white illumination, our LL167 Series provides a 74% brighter beam in a similar package.
Focus Microwaves pushes the boundaries of tuner technology once again. While 6G frequencies and applications are still being defined, Focus took the initiative and developed a new family of waveguide tuners designed for frequencies greater than 110GHz. Leveraging the success and technology of the DELTA tuners (industry standard for direct connect on wafer applications) and combined it with the micro-metric accuracy and repeatability of the small footprint omega tuners. These new waveguide tuners will revolutionize the Sub-THz bands.
- Tiny “all-in-one” solution: no external control board needed
- Superior image quality: sub-micron lens movement with very low tilt. Now with higher dynamic stability
- Low voltage & power: 3.3 VDC input, zero power position hold
- Simple system integration: accepts high-level motion commands over standard serial interface (I2C or SPI)
- Flexible, production-ready system: compatible with M8 to M16 lenses and with typical image formats from 1/3” to 1/1.8”
- Lowest cost, fastest time to market: Fully-engineered “plug and play” solution
Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
The low frequency tuners are a unique product technology using MPT algorithms for low frequency wideband tuning. Three or more cascaded tuning sections use series transmission cables and parallel rotary capacitors.
The length of the cables and number of tuning sections are optimized for maximum tuning range over a given bandwidth. HLFT tuners use 6 tuning sections allowing second harmonic frequency tuning.
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High spatial resolution
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IEEE 1588 PTP
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Power over Ethernet
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Defect pixel masking
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Monochrome (GT4400) and color (GT4400C) models
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-5e or CAT-6)
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
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Comprehensive I/O functionality for simplified system integration
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Planarity adjusted (PA) EF Lens Mount (option -18) for electronic control of aperture and autofocus
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Easy camera mounting via standard M3 threads at all sides and 1/4-20 tripod mounting hole
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
Focus Microwaves
Focus Microwaves is a pioneering engineering company, built around the innovations of its founder Dr. Christos Tsironis who developed his first manual tuner in 1973 and is the inventor of most existing electro-mechanical tuner families. The success of Focus is based on the engineering and manufacturing skills of its highly motivated and experienced team of engineers and technicians, who have been trained and encouraged to develop new technologies. In addition, listening to our customers needs and insights helps us discover and develop new and measurement methods on an ongoing basis, relentlessly pushing the limits of what is possible.
From humble beginnings in 1988, Focus has become the main supplier of advanced Load Pull and Noise Tuner Systems. Our mission is to provide effective, reliable and innovative solutions for non-50 Ohm testing (Noise and Load Pull) of RF microwave transistors, thus enabling our customers to compete in the marketplace with better designs and to advance the understanding and knowledge of the field.
Contact Details
Focus Microwaves Inc. Main Head Office
4555 Chem. du Bois-Franc, Saint-Laurent, QC H4S 1A8, Canada
Phone: +1-514-684-4554
Test & Measurement
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