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The LL137 Series provides a focused line of illumination in a passively cooled design.
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Provides a medium intensity level of 280kLux (working distance of 75mm)
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Pre-engineered for expandability in 6” (152mm) increments up to 96” (2.44m).
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Available intensity control provides illuminance adjustability for every 6″ increment via a 0 – 10v input
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Note: If only looking for white illumination, our LL167 Series provides a 74% brighter beam in a similar package.
Focus Microwaves - Auriga AU-5 Pulsed IV/RF Characterization System
Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed
IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
Auriga MEM™, Auriga’s newest pulsed IV function, enhances current resolution to an industry-leading 0.01% of maximum current. Using Auriga’s advanced calibration algorithms and an external Keysight digital multimeter (DMM), Auriga MEM brings the DC measurement plane directly to the device under test.
Auriga PIV System - 220 V Configuration
Model |
Description |
| AU5 | Pulsed IV/RF Characterization System |
| PHG20 | Pulser Head, ±20 V, 100 mA, 2 W |
| PHD220-10 | Pulser Head, 220 V, 10 A, 200 W |
| N5751A | Power Supply to support 200 V Pulser Heads |
| AU5-RF (Optional) | Pulsed RF Option |
Auriga PIV System - 600 V Configuration
Model |
Description |
| AU5 | Pulsed IV/RF Characterization System |
| PHG20 | Pulser Head, ±20 V, 100 mA, 2 W |
| PHG100 | Pulser Head, ±100 V, 2 A, 40 W |
| PHD600-5 | Pulser Head, 600 V, 5 A, 1000 W |
| N5752A | Power Supply to support 600 V Pulser Heads |
| AU5-RF (Optional) | Pulsed RF Option |
Auriga PIV System - 1200 V Configuration
Model |
Description |
| AU5 | Pulsed IV/RF Characterization System |
| PHG100 | Pulser Head, ±100 V, 2 A, 40 W |
| PHD1200-100 | Pulser Head, 1200 V, 100 A, 5000 W |
| PHD3000-HVK | High-Voltage filter kit for 1200 V Pulser Head series |
| AU-3R100-LCU | High Voltage Power Supply to support 1200 V Pulser Heads |
| AU5-RF (Optional) | Pulsed RF Option |
Auriga PIV System - 2000 V Configuration
Model |
Description |
| AU5 | Pulsed IV/RF Characterization System |
| PHG100 | Pulser Head, ±100 V, 2 A, 40 W |
| PHD2000-100 | Pulser Head, 2000 V, 100 A, 5000 W |
| PHD3000-HVK | High-Voltage filter kit for 2000 V Pulser Head series |
| AU-3R100-LCU | High Voltage Power Supply to support 2000 V Pulser Heads |
| AU5-RF (Optional) |
Pulsed RF Option |
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More Product Information
Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
The Focus Compact Model (FCM) utility is a streamlined software package designed to be used with Focus’ AURIGA high-end Pulsed-IV system, that is used to generate Compact Models for transistors from their Pulsed-IV and wideband pulsed s-parameter data.
This is achieved by generating a network of lumped circuit elements that represent accurately the fundamental linear & non-linear behavior of the device over a broad range of bias and power range.
The result of the modeling is a netlist and compatible with- the most common CAD tools used in RF Design; such as AWR Microwave office (MWO) and Keysight PathWave Advanced Design System (ADS).
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Supports the latest 5G FR1 and IEEE 802.11ax standards
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up to 1GHz active load pull bandwidth capability
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Test the latest high bandwidth and high modulation cellular standards such as 1024QAM 802.11ax
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This system can be used in all parts of the design cycle
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Initial device characterisation
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MMIC or PA design
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Design verification testing
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Product testing in the factory
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Fiber coupled to allow movement
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Ultra-broadband measurement
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Transmitted or reflected data collection
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Mates with collinear adaptor (AXA4001)
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High signal to noise ratio
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Hot swappable
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Low noise to enable rapid data collection
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Adjustable lens tube for focusing
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Multiple lens configurations available
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Type APS-H CMOS sensor
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IEEE 1588 PTP
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Power over Ethernet
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4.59 fps at full resolution
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Monochrome (GT5120) model
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
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Comprehensive I/O functionality for simplified system integration
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Planarity adjusted (PA) EF Lens Mount (option -18) for electronic control of aperture and autofocus
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Easy camera mounting via standard M3 threads at all sides and 1/4-20 tripod mounting hole
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Enhanced Defect Pixel Correction feature with a new Defective Pixel List Manager tool that allows you to load different user defined defective pixel lists to match your application and optimize the life cycle of the camera
Focus’ modular microstrip, high power and ultra low loss coaxial RF Test Fixtures are designed mainly for load pull testing of packaged transistors. All Focus test fixtures come with TRL calibration standards and support most transistor packages sized from less than 0.1″ and up to 1″.
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3 Measurement States; Quiescent (OFF-State), Non Quiescent (ON-State), and Pre-State
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The Pre State is a short high voltage state used to activate
the traps in the semiconductor.
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Adjustable delay (Δt) between the Pre state and Non Quiescent state down to 0s.
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Independently adjustable timing settings for the Three-state gate pulser and drain pulser
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Easy Integration into existing mainframes
Focus Microwaves
Focus Microwaves is a pioneering engineering company, built around the innovations of its founder Dr. Christos Tsironis who developed his first manual tuner in 1973 and is the inventor of most existing electro-mechanical tuner families. The success of Focus is based on the engineering and manufacturing skills of its highly motivated and experienced team of engineers and technicians, who have been trained and encouraged to develop new technologies. In addition, listening to our customers needs and insights helps us discover and develop new and measurement methods on an ongoing basis, relentlessly pushing the limits of what is possible.
From humble beginnings in 1988, Focus has become the main supplier of advanced Load Pull and Noise Tuner Systems. Our mission is to provide effective, reliable and innovative solutions for non-50 Ohm testing (Noise and Load Pull) of RF microwave transistors, thus enabling our customers to compete in the marketplace with better designs and to advance the understanding and knowledge of the field.
Contact Details
Focus Microwaves Inc. Main Head Office
4555 Chem. du Bois-Franc, Saint-Laurent, QC H4S 1A8, Canada
Phone: +1-514-684-4554
Test & Measurement
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