Pulsed IV
Products
Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
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High power capability: +/- 200V, 17A.
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Minimum pulse width: 200ns.
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Modular design which enables multiple configurations.
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Shared library. The MPIV can be used as a standalone instrument using an ActiveX library, which easily integrates into existing test software.
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Flexible Input/Output. Choose between high power and high precision pulse modules to create a customized setup for your specific application.
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Compatible with Focus Microwaves’ device characterization software (Load Pull Explorer, LPEx)
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3 Measurement States; Quiescent (OFF-State), Non Quiescent (ON-State), and Pre-State
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The Pre State is a short high voltage state used to activate
the traps in the semiconductor.
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Adjustable delay (Δt) between the Pre state and Non Quiescent state down to 0s.
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Independently adjustable timing settings for the Three-state gate pulser and drain pulser
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Easy Integration into existing mainframes