Focus Microwaves - Noise Parameter Characterization Test Software
Noise measurements allow the determination of the four Noise Parameters of a device (transistor). There are four Noise Parameters which fully describe the noise behaviour of an active or passive device at a given frequency.
The Noise Parameters are not load depended, they are only affected by Source Impedance. There exist a simple relation between the four Noise Parameters:
NF calculation formula is the following:
- NFLinear = NFMinLinear + ((4 * Rn / Zo) * (Gs – GammaOpt).Mag2 ) / ((1 + GammaOpt).Mag2 * (1 – Gs.Mag2));
This is the equation of a set of isometric circles on the Smith Chart (Noise Circles) for which the value of the Noise Figure is the Level on each circle. This Circle Representation is only possible because the Noise behaviour of transistors is a Small Signal Phenomenon.
Where:
- NFminLinear is the minimum noise figure in linear.
- Rn is the equivalent noise resistance in Ohms
- Gs is the gamma presented to the DUT at the input (in our case by the tuner).
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GammaOpt is the optimum gamma (ie: gamma source for which the DUT produces the minimum noise figure).
- Note: Mag2 denotes the magnitude squared.
Hardware
Noise Measurement System
Model |
Frequency |
Insertion Loss |
VSWR |
Min. Gain |
Max. VSWR |
Connector |
| NMS-2600 | up to 26.5 GHz | 0.80 dB | 1.61 | 29 for 0.8-26.5GH | 1.8:1 | 3.5mm |
| NMS-4000 | up to 40 GHz | 0.91 dB | 1.81 | 30 for ≤26.5GH | 2.1:1 | 2.9mm |
| NMS-5000 | up to 50 GHz | 0.99 dB | 1.8:1 | 27 for ≤26.5G | 2:1 | 2.4mm |
| NMS-6700 | up to 67 GHz | 1.12 dB | 1.91 | 29 for ≤26.5G | 3:1 | 1.85mm |
| NMS-6700-DC* | up to 67 GHz | 1.12 dB | 1.9:1 | 29 for ≤26.5G | 3:1 | 1.85 mm |
| NMS-75500-DC* | 50 to 75 GHz | 0.4dB | 1.2:1** | 40 for 50-75GHz | 1.6:1** | WR-15 |
| NMS-90600-DC* | 60 to 90 GHz | 0.9dB | 1.3:1** | 35 for 60-90GHz | 1.8:1** | WR-12 |
| NMS-110750-DC* | 75 to 110 GHz | 1.1dB | 1.3:1** | 36 for 75-110GHz | 1.9:1** | WR-10 |
| NMS-1701100-DC | 110 to 170 GHz | 1.3dB | 1.4:1** | 36 for 110-170GHz | 2:1** | WR-6.5 |
* with Downconverter
**+/-10%
Graphs
Noise Parameters
Noise Circles & Stability Regions
Noise Parameters: Minimum Noise Figure / Rn / Gamma Opt / Phase of Gamma Opt
Typical Noise Setup
More Product Information
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High spatial resolution
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IEEE 1588 PTP
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Power over Ethernet
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Defect pixel masking
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Monochrome (GT6400) and color (GT6400C) models
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
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Comprehensive I/O functionality for simplified system integration
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Planarity adjusted (PA) EF Lens Mount (option -18) for electronic control of aperture and autofocus
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Easy camera mounting via standard M3 threads at all sides and 1/4-20 tripod mounting hole
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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SOSA Aligned
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3U VPX Form Factor
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Low SWAP applications
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Ruggedization Level 200
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Provides low noise reference using Chip Scale Atomic Clock (CSAC)
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Optional SAASM GPS available with RS232 key-fill connectivity
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11 Radial Clock Outputs
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Programmable 3GHz outputs
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OpenVPX Backplane support for 1000BASE-KX, 10GBASE-KR, or PCIe
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High spatial resolution
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IEEE 1588 PTP
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Power over Ethernet
-
Defect pixel masking
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Monochrome (GT4400) and color (GT4400C) models
-
Screw mount RJ45 Ethernet connector for secure operation in industrial environments
-
Supports cable lengths up to 100 meters (CAT-5e or CAT-6)
-
Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
-
Comprehensive I/O functionality for simplified system integration
-
Planarity adjusted (PA) EF Lens Mount (option -18) for electronic control of aperture and autofocus
-
Easy camera mounting via standard M3 threads at all sides and 1/4-20 tripod mounting hole
-
Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
-
Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Customizable sample space to fit the user’s application
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Long holding time: 100 hours for six (6) STP liter He-3 gas
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Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line; +/- 0.5 mK at base temperature
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Low noise
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Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
Focus Microwaves’ DELTA series of electro-mechanical tuners is designed specifically for high frequency on wafer measurements. The tuner’s low profile allows it to be placed within the wafer perimeter and allows for a direct connection between the probe tip and the tuner, eliminating all possible insertion loss between the DUT and the tuner. This revolutionary new tuner design enables the engineer to achieve optimum tuning range, with a tuner whose footprint and weight has been dramatically reduced.
The TEM horn antenna is an antenna used for conducting close proximity radiation immunity evaluation test (near electromagnetic field immunity test) of electromagnetic waves radiated from various wireless transmitters such as mobile devices.
In the future, close proximity radiation immunity evaluation test using the TEM horn antenna is expected to expand to various product standards such as medical equipment (IEC 60601-1-2) and multimedia equipment (CISPR 35). NoiseKen's TEM horn antenna has a wide band, low VSWR, and wide electric field uniformity offering an ideal solution for an efficient close proximity radiation immunity test.
- A TEM horn antenna compliant with IEC 61000-4-39 Ed.1.
- Test without changing the antenna in the frequency range of 380MHz to 6GHz.
- Low VSWR and high GAIN enable efficient electromagnetic wave radiation.
- Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT.
- Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.
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APS-H optical format CMOS sensor
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PoCXP
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4-DIN type connector
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79.7 fps at full resolution
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Extended near-infrared (X-2620B NIR) model
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Extended feature set with Sequencer Control and Multiple Region of Interest selection to support advanced imaging applications
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On-board Defect Pixel and 2D Fixed Pattern Noise Correction for improved image quality
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Simplified firmware update in the field via interface cables using GenICam File Access
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Robust, fan-less design for industrial imaging applications
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Heat-dissipation optimized housing to reduce image noise
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Build-in tripod adapter and multiple mounting holes for eased system integration
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DIN 1.0/2.3 CoaXPress connectors for secure operation in industrial environments
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Single cable solution using Trigger and Power over CoaXPress
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Comprehensive I/O functionality for extended control of connected system components
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Select between B 270 ASG protection glass and filter types: IRC30 IR cut filter or Schneider 486 IR cut filter
NoiseKen simulators to reproduce fast rise-up noises which are generated when switching ON / OFF electric current on the inductive load.
Since the pulse includes broadband frequency and its rise-up time is fast at 3ns or less, it can make the noise coupling dense and effective to reproduce the malfunctions of electronics equipment under the test.
It can realize performance evaluation of electronics equipment's upon reproduction of line noises which are intruded to the power supply lines or induced noises onto the telecommunication lines.
Noise measurements allow the determination of the four Noise Parameters of a device (transistor). There are four Noise Parameters which fully describe the noise behaviour of an active or passive device at a given frequency.
Focus Microwaves
Focus Microwaves is a pioneering engineering company, built around the innovations of its founder Dr. Christos Tsironis who developed his first manual tuner in 1973 and is the inventor of most existing electro-mechanical tuner families. The success of Focus is based on the engineering and manufacturing skills of its highly motivated and experienced team of engineers and technicians, who have been trained and encouraged to develop new technologies. In addition, listening to our customers needs and insights helps us discover and develop new and measurement methods on an ongoing basis, relentlessly pushing the limits of what is possible.
From humble beginnings in 1988, Focus has become the main supplier of advanced Load Pull and Noise Tuner Systems. Our mission is to provide effective, reliable and innovative solutions for non-50 Ohm testing (Noise and Load Pull) of RF microwave transistors, thus enabling our customers to compete in the marketplace with better designs and to advance the understanding and knowledge of the field.
Contact Details
Focus Microwaves Inc. Main Head Office
4555 Chem. du Bois-Franc, Saint-Laurent, QC H4S 1A8, Canada
Phone: +1-514-684-4554
Test & Measurement
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