Software
Products
Beginning in 2019, AR will be embedding ampwebwARe in all new amplifiers. Once an amplifier is connected to a network and an IP address is set, any other device connected to that network can access the amplifier’s embedded webpage. The features of this embedded webpage include:
- All Information Shown on One Screen
- Simple User Interface
- Allows for Remote Diagnostics
- Monitor Status from Anywhere
- Multiple Simultaneous Browser Connections
- Many Supported Web Browsers
Comprehensive EMC test software for radiated susceptibility, conducted immunity, radiated emissions, and conducted emissions, with the ability to do multi-tone testing. Windows compatible.
emcware® by AR RF/Microwave Instrumentation provides automated Electromagnetic Compatibility (EMC) testing and report generation for all types of users from corporate to professional test laboratories. Through its unique workflow and hundreds of predefined test profiles, allows EMC test engineers more test time through minimal training, and highly efficient equipment and test setup when compared to the competition.
Vimba is our future-proof platform-independent SDK for all Allied Vision cameras with GigE Vision, USB3 Vision, IEEE 1394, and Camera Link interface. With Vimba, you can acquire images and control your Allied Vision camera instantly, but also program complex vision applications or connect to third-party libraries.
Highlights
Non-linear measurement data is often used to create a behavioral model for high frequency components. Formulations of these models have been defined in terms of traveling waves, with a desire to represent nonlinear behavior of high frequency transistors through a direct extension from linear s-parameters.
The Mesuro model portfolio is comprised of two variations of a behavioral model – each targeted at a particular end use – Cardiff Model Lite (CML), where the desired output is a local model, and Cardiff Model+ (CM+), which incorporates higher order mixing terms allowing a single model to fit over a range of impedance space.
The Focus Compact Model (FCM) utility is a streamlined software package designed to be used with Focus’ AURIGA high-end Pulsed-IV system, that is used to generate Compact Models for transistors from their Pulsed-IV and wideband pulsed s-parameter data.
This is achieved by generating a network of lumped circuit elements that represent accurately the fundamental linear & non-linear behavior of the device over a broad range of bias and power range.
The result of the modeling is a netlist and compatible with- the most common CAD tools used in RF Design; such as AWR Microwave office (MWO) and Keysight PathWave Advanced Design System (ADS).
Noise measurements allow the determination of the four Noise Parameters of a device (transistor). There are four Noise Parameters which fully describe the noise behaviour of an active or passive device at a given frequency.
An impedance tuner is an apparatus, which generates controllable reflection factor (Impedance) over a certain frequency range. Focus uses two basic technologies:
a) For frequencies from 100MHz to 110GHz (and above) we use the slide screw technique (models Multi Harmonic MPT, wideband (fundamental) CCMT, harmonic rejection PHT), in which a reflective probe (slug) is inserted into the slot of a low loss slotted transmission line (slabline or waveguide).
b) For frequencies from below 10MHz to 170MHz we use a lumped element technology (models LFT), whereby variable capacitors are connected with optimized lengths of coaxial cable.
An impedance tuner is an apparatus, which generates controllable reflection factor (Impedance) over a certain frequency range. Focus uses two basic technologies:
a) For frequencies from 100MHz to 110GHz (and above) we use the slide screw technique (models Multi Harmonic MPT, wideband (fundamental) CCMT, harmonic rejection PHT), in which a reflective probe (slug) is inserted into the slot of a low loss slotted transmission line (slabline or waveguide).
b) For frequencies from below 10MHz to 170MHz we use a lumped element technology (models LFT), whereby variable capacitors are connected with optimized lengths of coaxial cable.
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Easy and fast setup of camera views
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Go to Light and Image Settings of the selected camera view with only one mouse click
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Guided workflows for wafer setups, alignment tools and Autonomous Assistants
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Workflow wizard shows task-relevant settings and options only
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Visualizes the progress of setup, alignment and measurement tasks
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Status information always at hand
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Informs the user about events, for example “Successful Alignment”
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Interacts with the user and helps with intelligent solutions
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For very complex wafer structures
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Enables automatic test of multiple devices in each die location before stepping to the next die
See more Key Features on Specifications & Details tab