• Dual Voltage ranges that support over voltage testing on 480V based systems 
• Instrument Setups for quickly re-establishing the known instrument state 
• 500uS time resolution for Transients 
• Virtual Panels control software included 
• Non-Linear current waveform programming during Load mode 
• Phase coordination among multiple units (LKM/LKS) 
• Powerful set of analog controls for PHIL and Modulation tests 
• Trigger In & Out to permit extensive coordination with external systems 
• Extensive Onboard diagnostics 
• Digital I/O, including RS232, USB, Ethernet (GPIB optional) 
• Intuitive 5” color display for ease of navigation 
• Auto-paralleling for maximum flexibility with multi-chassis configurations 
• Separate terminal blocks for single-phase and three-phase AC outputs

Designed with Intel‘s IPU E2000 ASIC, the Network Infrastructure Optimization Solution is a secure, configurable network infrastructure acceleration, monitoring, and management platform serve critical applications and services across data centers or at the network edge

• Software-defined, Hardware-accelerated - Accelerate critical applications and services with a single piece of hardware equipped with software that enhances functionality and programmability.
• Network Visibility and Data Analysis - Detect anomalies in network traffic with sub-10 nanosecond precision timestamping while encrypting data packets traveling between devices.
• Enable Streamlined Management - Run multiple workloads in parallel at 200Gbps line rate speeds without interference or resource contention within diverse data environments.

• Capture from legacy to the latest video sources through support for SD analog to UHD digital formats 
• Connect and switch between different video sources via Mini DisplayPort, HD-BNC, HDMI, and custom analog DVI1 connectivity 
• Handle multiple video sources with the simultaneous capture of up to eight HD or two UHD streams2 
• Optimize video transmission and storage through onboard multi-stream H.264 encoding 
• Minimize system footprint by way of a single-slot PCIe card design 
• Simplify application development using the Aurora Imaging Library, formerly Matrox Imaging Library (MIL), software development kit (SDK) 
• Deploy on a current platform of choice with support for 64-bit Windows® 7/10 and Linux

SCANBOOSTER II

• controller for Embedded Testing and Programming
• high flexibility through multifunctional I/O channels for mixed-signal tests · 
• modularity and scalability due to configurable TAP Interface Cards
• integrated compact unit controllable via USB 2.0 and GBit-LAN

PicoTAP ATE

• Controller for embedded testing and programming
• Low-cost module with high performance and multifunctional architecture
• available in a housing or as a PCBA for spacesaving installation in the test system
• integrated compact unit controllable via USB 2.0

• Solve machine vision applications efficiently by constructing flowcharts instead of writing program code, using field-proven tools for analyzing, classifying, locating, measuring, reading and verifying
• Use a single program for creating both application logic and operator interface
• Leverage deep learning for visual inspection through image classification and segmentation tools
• Rely on a common underlying vision library for the same results with an Iris GTX smart camera, vision systems or third-part computer
• Work with multiple cameras all within the same project or per project running concurrently and independently from one another, platform permitting
• Interface to Zebra AltiZ and third party 3D sensors to visualize, process and analyze depth maps and point clouds
• Communication options include discrete Zebra I/Os, RS-232, and Ethernet (TCP/IP, CC-Link IE Field Basic, EtherNet/IP, Modbus, OPC UA, and PROFINET, and native robot interfaces)
• Maximize productivity with instant feedback on image analysis and processing operations
• Receive immediate pertinent assistance through an integrated contextual guide
• Maintain control and independence through the ability to create custom flowchart steps
• Test communication with PLC using the built-in PLC interface emulator
• Protect against inappropriate changes with the Project Change Validator tool

• Long cable lengths at maximum image acquisition rates 
• Data forwarding rate for distributed image processing 
• Fully supported by Sapera Vision Software SDKs

• The Direct PC bus access data acquisition system provides the required sampling rate and resolution to meet IEC 61000-4-7 measurement requirements and supports high-speed data transfers.
• PC-based Harmonic and Flicker test software provides real-time full-color data display updates and continuous PASS/FAIL monitoring.
• Automatic calculation of the maximum permissible system impedance Zsys, using the Zref and measured Flicker parameters, as required per EN/IEC 61000-3-11.
• Intuitive operating software provides IEC test setup, data analysis, display, with test reports in and MS Word format.
• High resolution, no gap acquisition data storage to ensure that all data can be streamed to disk (in ASCII format if needed) for later review and replay of the actual test.
• Single Step and Fast playback mode of test results.

• Guaranteed performance to 43.5 GHz with Extended K™ ports
• PC control takes advantage of external computer processing power and functionality
• Compact 1U high package for efficient use of bench and rack space
• No on-board data storage eliminates the need for data purging in secure applications
• Time domain with time gating option enables easier and faster fault identification
• A common GUI interface within the ShockLine family reduces switching costs between models
• Universal Fixture Extraction (UFX) software option provides advanced de-embedding tools for test fixture extraction

PureLine 3 Technology

• Provides an effectively noise free environment around the device under test (DUT)
• First automated probe station to achieve -190dB spectral noise*
• Up to 32x lower noise (1kHz), for improved device characterization and modelling at the 7/5/2 nm technology nodes targeted for 5G and beyond applications
• Eliminates over 97% of the environmental noise experienced in previous probe systems
• Extensive collection of FormFactor patents, electrical design knowledge, and measurement system IP

Plug In and Go

• World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
• Eliminates all ground-loop induced TestCell noise
• Low field emissions
• Provides fully managed and filtered AC power to the entire system, prober and instruments

See "Specifications & Details" tab for more key features