• S-parameters DC to 40 GHz, single-ended and mixed-mode
• Impedance Profile with <1 mm resolution, differential and common-mode 
• Internal, automatic OSLT calibration
• USB-connected, small, lightweight
• Flexible display of the measurements
• Remove effects from fixtures, connectors and cables
• Emulate eye diagrams with CTLE, DFE and FFE equalization
• Advanced jitter analysis

Fully Integrated: With the ProBus™ interface, the AP033 becomes an integral part of the oscilloscope. The probe sensitivity and offset can be controlled from the oscilloscope front panel, the probe front panel, or by using remote control commands (GPIB or RS-232). Sensitivity, offset, input capacitance, and common mode voltage range are displayed on the oscilloscope screen. When used with a LeCroy digital oscilloscope, no external power supply is required.

With the ProBus interface, the ZD500, 1000, and 1500 becomes an integral part of the oscilloscope. All probe gain and offset controls are transparent to the user, making it easier to probe the circuit without concern for which gain setting to choose. When used with a LeCroy digital oscilloscope, no external power supply is required.

• Bandwidth models from 8 GHz to 30 GHz
• Low loading and high impedance for minimal signal disturbance
• Wide variety of tips:
  • Standard and high-sensitivity 30 GHz solder-in tips
  • High-temperature solder-in tip with 1-meter lead
  • QuickLink adapter for mixed-signal probing
  • Handheld browser tip
  • Tips for direct oscilloscope connection to CrossSync PHY protocol analyzer interposers
• Built-in tip identification for simple setup and precise signal reproduction
• Ideal for debug and validation of:
  • PCIe 1.0 to 6.0
  • DDR3/LPDDR3
  • DDR4/LPDDR4/LPDDR4X
  • DDR5
  • Other high-speed serial interfaces

• Available in 250 MHz and 350 MHz models.
• 2, 4 and 8 channel modes.
• 16-bit vertical resolution.
• Max Sampling rate of 1.2 GS/s.
• Max sinewave frequency of 250 MHz and 350 MHz respectively.

The disruptive and innovative architecture enables to generate/add 8, 16 or 32 channel digital patterns (respectively on 2,4 or 8 analog channels platform) and to operate all models in true arbitrary mode or Direct Digital Synthesis (DDS) mode. Thanks to their high performance, versatile functionality and outstanding usability, the HD T3AWG3K series is the ideal AWG generator for today's and tomorrow's test challenges.

• Ideal for GaN and SiC devices
• Highest system accuracy
• Fastest rise time
• High CMRR - 160 dB

• 10 GigE Ethernet port & hardware 
• Industry’s smallest 67M 10GigE Vision camera 
• Simplified set-up with field proven Sapera LT software featuring CamExpert 
• Engineered to accommodate industrial environment with a ruggedized screw mount RJ-45 connector

AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.

Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.

From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.

Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.

• 1 MHz max line rate 
• 65dB dynamic range 
• Onchip 2x binning 
• Mono/HDR/HFW 
• Multi-arrays TDI 
• Dual CLHS CX4 AOC output