• Reduce your time spent debugging boards due to high precision fault isolation 
• Improve your time to market and reduce project risk by early design verification 
• Reduce your test development time by reusing tests from prototype/design in manufacturing and field support 
• Ongoing time savings by test reuse across projects

• Simplify cabling between cameras and vision computer through PoE support 
• Facilitate multi-camera configurations with two or four Gigabit Ethernet ports 
• Trigger multiple cameras simultaneously and reliably using hardware-assisted trigger-over-Ethernet (ToE) 
• Synchronize to automation devices in real-time through digital I/Os with hardware-assisted management 
• Deploy pre-licensed for GigE Vision support in Aurora software, formerly Matrox Imaging Software 
• Avoid the need for a separate hardware key through a license fingerprint for additional Aurora software features 
• Certified for use with GigE Vision systems

• Intuitive, icon-based setup and control
•  Spreadsheet-style channel configuration 
• Snapshot display with data export 
• Independent sampling rates for each instrument 
• Real-time online graphical data analysis 
• Client / server architecture with multiple displays 
• Synchronization of different data sources 
• Detect/process events for close-loop control 
• Post-acquisition analysis methods and data playback 
• Easily create Virtual/Calculated channels based on physical channel data

The industrial manufacturing industry has been a sector of constant innovation for centuries, continuously leveraging the data from frequent iterations to achieve new solutions. This is no different today, driven by advancements in automation, the adoption of Industry 4.0 technologies, the integration of IoT, and the shift towards sustainable manufacturing practices. These trends require the development of new testing protocols, thorough safety standards, and sophisticated quality control measures to ensure the reliability and efficiency of increasingly complex systems. Manufacturers must also address interoperability and cybersecurity challenges posed by interconnected devices and digital supply chains. Add the push for eco-friendly, sustainable manufacturing practices in conjunction with rigorous testing for compliance with environmental regulations, and achieving balanced testing facility solutions is no easy task.

• Only BSDL files required to get the board up and running 
• Set up pin states – e.g. low, high, toggling 
• Trace shorts, opens and other signals 
• Easy low-level access to device pins/busses 
• Clear display of the pins/balls with variable zoom levels and split screen 
• View JTAG chain data as waveforms 
• Quickly find and monitor changing pins 
• Program devices with SVF and STAPL files 
• Real-time interaction 
• XJIntegration (use XJAnalyser functionality from other software)