Focus Microwaves - Manual Tuners
Model |
Min Frequency |
Max Frequency |
Type |
Datasheets |
MMT304 | 0.4 GHz | 3.0 GHz | Manual | |
MMT306 | 0.6 GHz | 3.0 GHz | Manual | |
MMT308 | 0.8 GHz | 3.0 GHz | Manual | |
MMT316 | 1.6 Ghz | 3.0 GHz | Manual | |
MMT606 | 0.6 GHz | 6.0 GHz | Manual | |
MMT704 | 0.4 GHz | 7.0 GHz | Manual | |
MMT708 | 0.8 GHz | 7.0 GHz | Manual | |
MMT716 | 1.6 GHz | 7.0 GHz | Manual | |
MMT808 | 0.8 GHz | 8.0 GHz | Manual | |
MMT1804 | 0.4 GHz | 18.0 GHz | Manual | |
MMT1808 | 0.8 GHz | 18.0 GHz | Manual |
More Product Information

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Revolutionary technology advancement for wafer and die-level photonics probing
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Real-time in-situ calibrations
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Highest accuracy in test results
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Lowest coupling loss
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New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
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Minimized coupling losses with minimal trench dimensions
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Industry standard for vertical coupling to wafer-level grating couplers
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Dark, shielded and frost-free
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-40°C to +125°C
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Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
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Exclusive FormFactor-developed automated test methodology
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FormFactor-developed graphical user interface to manually control the optical positioning system
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Configurable between single fibers, fiber arrays and edge coupling holders

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Type APS-H CMOS sensor
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IEEE 1588 PTP
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Power over Ethernet
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4.59 fps at full resolution
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Extended near-infrared (GT5120NIR) model
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
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Comprehensive I/O functionality for simplified system integration
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Planarity adjusted (PA) EF Lens Mount (option -18) for electronic control of aperture and autofocus
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Easy camera mounting via standard M3 threads at all sides and 1/4-20 tripod mounting hole
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Enhanced Defect Pixel Correction feature with a new Defective Pixel List Manager tool that allows you to load different user defined defective pixel lists to match your application and optimize the life cycle of the camera


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Quick and easy probe tip navigation
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Z drive can work in the same range as the chuck
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Enables higher separation gap while the DUT stays in focus
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Automatically configure and optimize performance
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24/7 operating
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Increased MTBF
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Protects the measurement setup
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Prevents involuntary mechanical contact between lens and probes
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Auto gain (manual gain control: 0 to 32 dB)
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Auto exposure (manual exposure control: 10 µs to 26.8 s)
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Auto white balance (GT3300C only)
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Binning (horizontal and vertical)
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Color correction, hue, saturation (GT3300C only)
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Column defect masking
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Decimation X/Y
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Gamma correction
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Three look-up tables (LUTs)
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Region of interest (ROI), separate ROI for auto features
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Reverse X/Y
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P-Iris and DC-Iris lens control
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Event channel
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Image chunk data
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IEEE 1588 Precision Time Protocol (PTP)
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RS232
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Storable user sets
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StreamBytesPerSecond (bandwidth control)
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Stream hold
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Sync out modes: Trigger ready, input, exposing, readout, imaging, strobe, GPO
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Tap mode switchable in Vimba Viewer 2.0 or later (four-tap, one-tap)
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Temperature monitoring (main board and sensor board)
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Trigger over Ethernet (ToE) Action Commands

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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Joystick controller
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Manual probe positioners with rotary feed-throughs
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Software control of chuck for fast step-and-repeat testing of the entire wafer
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Fast step-and-repeat testing of the whole wafer
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User-centered design minimizes training costs and enhances efficiency

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Wafer temp verified <4.5 K (with 44 RF probes in contact)
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Magnetic field suppression to <200 nT
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Easy exchange of customizable probe cards
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Configurable for 150 mm, 200 mm and 300 mm wafers
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Options for fully automated wafer load or manual
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Complete software suite for manual, semi-auto, or fully automated probing
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25 wafer cassette capacity for fully automated testing
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~15 minute cooldown time per wafer
- Detented, 30 position potentiometer for repeatable dimming with cable inline controllers
- Built in DIN-rail or panel mounting feature
- Flip up cover for potentiometer to prevent accidental adjustments
- Spring clamp wiring terminal for vibration proof installation
- NEW M12 selector switch for use with iCS 2 (IC) and iCS 3 (I3) M12-based lights

- The fourth generation of Ai’s popular Inline Control System.
- High Output Power: Capable of delivering 2.1 amps of continuous output and up to 8 amps in overdrive strobe at 24V, outperforming all other inline controllers on the market.
- Compact & Rugged: Sleek enough to fit through wiring conduit with its compact anodized aluminum housing and sealed to IP68 standards for prolonged liquid immersion and complete dust protection.
- Plug-and-Play Functionality: Enabled with SignaTech™, allowing for simplicity when overdriving, without risk of damage to the lighthead. For more information, please refer to the Product Manual

Focus Microwaves
Focus Microwaves is a pioneering engineering company, built around the innovations of its founder Dr. Christos Tsironis who developed his first manual tuner in 1973 and is the inventor of most existing electro-mechanical tuner families. The success of Focus is based on the engineering and manufacturing skills of its highly motivated and experienced team of engineers and technicians, who have been trained and encouraged to develop new technologies. In addition, listening to our customers needs and insights helps us discover and develop new and measurement methods on an ongoing basis, relentlessly pushing the limits of what is possible.
From humble beginnings in 1988, Focus has become the main supplier of advanced Load Pull and Noise Tuner Systems. Our mission is to provide effective, reliable and innovative solutions for non-50 Ohm testing (Noise and Load Pull) of RF microwave transistors, thus enabling our customers to compete in the marketplace with better designs and to advance the understanding and knowledge of the field.
Contact Details
Focus Microwaves Inc. Main Head Office
4555 Chem. du Bois-Franc, Saint-Laurent, QC H4S 1A8, Canada
Phone: +1-514-684-4554
Test & Measurement
