Focus Microwaves - RAPID-VT Digital Tuners
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Supports the latest 5G FR1 and IEEE 802.11ax standards
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up to 1GHz active load pull bandwidth capability
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Test the latest high bandwidth and high modulation cellular standards such as 1024QAM 802.11ax
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This system can be used in all parts of the design cycle
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Initial device characterisation
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MMIC or PA design
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Design verification testing
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Product testing in the factory
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Focus Microwaves’ RAPID digital tuner technology is now available for very wideband communication signals, supporting the latest 5G FR1 and IEEE 802.11ax standards. This new architecture leverages the raw performance of National Instruments PXIe-5841* PXI Vector
Signal Transceiver.
The Rapid VT, utilizes two PXIe-5841 VSTs to make a VNA architecture with up to 1GHz active load pull bandwidth capability. The system solution provides a flexible load pull test platform that can be used to test the latest high bandwidth and high modulation cellular
standards such as 1024QAM 802.11ax but can also be configured for fast load pull and s-parameter measurements. This opens up the possibility of using this system in all parts of the design cycle, from initial device characterisation, to MMIC or PA design, design verification testing and ultimately to product testing in the factory.
S Parameter Performance Summary
Load Pull Performance Summary
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More Product Information
- Repair-focused environment for XJDeveloper / XJRunner tests.
- Full Connection test.
- RAM, Flash and other non-JTAG device tests.
- Flash, FPGA, CPLD and EEPROM programming.
- Layout Viewer* to show the physical location of faulty nets, pins and components.
- Schematic Viewer* to show the circuit design around faults.
- Direct control of the pins/balls of JTAG devices.
- View pin states graphically in real time or capture them in the Waveform Viewer.
- Trace signals to identify shorts, opens and other faults.
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High spatial resolution
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IEEE 1588 PTP
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Power over Ethernet
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Defect pixel masking
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Monochrome (GT4400) and color (GT4400C) models
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-5e or CAT-6)
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
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Comprehensive I/O functionality for simplified system integration
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Planarity adjusted (PA) EF Lens Mount (option -18) for electronic control of aperture and autofocus
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Easy camera mounting via standard M3 threads at all sides and 1/4-20 tripod mounting hole
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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3 Measurement States; Quiescent (OFF-State), Non Quiescent (ON-State), and Pre-State
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The Pre State is a short high voltage state used to activate
the traps in the semiconductor.
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Adjustable delay (Δt) between the Pre state and Non Quiescent state down to 0s.
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Independently adjustable timing settings for the Three-state gate pulser and drain pulser
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Easy Integration into existing mainframes
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Supports the latest 5G FR1 and IEEE 802.11ax standards
-
up to 1GHz active load pull bandwidth capability
-
Test the latest high bandwidth and high modulation cellular standards such as 1024QAM 802.11ax
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This system can be used in all parts of the design cycle
-
-
Initial device characterisation
-
MMIC or PA design
-
Design verification testing
-
Product testing in the factory
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- The LL137 Series provides a focused line of illumination in a passively cooled design.
- Provides a medium intensity level of 280kLux (working distance of 75mm)
- Pre-engineered for expandability in 6” (152mm) increments up to 96” (2.44m).
- Available intensity control provides illuminance adjustability for every 6″ increment via a 0 – 10v input
Note: If only looking for white illumination, our LL167 Series provides a 74% brighter beam in a similar package.
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Load-lock chamber: Cycle devices 10X faster in a cryogenic environment
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High-density electrical interface at cryogenic temperatures: More pins on the device enables more test structures to be probed with a single cooldown
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Base temperature of < 2K or < 4K with high cooling power: Test devices at the temperatures that matter most for pre- screening and evaluating device performance
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Low vibration: Stable contact with the device under test and enables low noise measurements
Noise measurements allow the determination of the four Noise Parameters of a device (transistor). Focus’ Noise Modules integrate well with various third party noise receivers.
Noise Parameters: These are four numbers that fully describe the noise behaviour of an active or passive device (twoport) at a given frequency. For practical reasons we use the following quantities as Noise Parameters:
Focus’ noise parameter extraction routines leverage the PNA-X’s unique implementation
of the cold-source noise figure measurement technique. This specific technique requires a noise source to determine the kBG (gain-bandwidth constant) of the system and a passive mechanical tuner is used to characterize the noise receiver across both the impedance and frequency space. This step is imperative to obtain fully vector-source-corrected measurements.
of the cold-source noise figure measurement technique. This specific technique requires a noise source to determine the kBG (gain-bandwidth constant) of the system and a passive mechanical tuner is used to characterize the noise receiver across both the impedance and frequency space. This step is imperative to obtain fully vector-source-corrected measurements.
A RF down conversion stage might be required if the frequency of noise measured exceeds the receiver’s bandwidth. Focus offers noise modules which support down conversion for optimal speed and performance.
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High power capability: +/- 200V, 17A.
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Minimum pulse width: 200ns.
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Modular design which enables multiple configurations.
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Shared library. The MPIV can be used as a standalone instrument using an ActiveX library, which easily integrates into existing test software.
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Flexible Input/Output. Choose between high power and high precision pulse modules to create a customized setup for your specific application.
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Compatible with Focus Microwaves’ device characterization software (Load Pull Explorer, LPEx)
- Small
- Complete, closed-loop system with embedded controls in less than 28 x 13.2 x 7.5 mm
- Precise
- 0.5 µm resolution
- 6 mm of travel
- Simple system integration
- High-level motion commands over standard serial interface (I2C or SPI)
- Flexible system, fast to market
- Rapidly configurable for push or pull motion
- Low voltage / low power use
- 3.3 V input, <500 mW power use
- Holds position when power is off
Focus Microwaves
Focus Microwaves is a pioneering engineering company, built around the innovations of its founder Dr. Christos Tsironis who developed his first manual tuner in 1973 and is the inventor of most existing electro-mechanical tuner families. The success of Focus is based on the engineering and manufacturing skills of its highly motivated and experienced team of engineers and technicians, who have been trained and encouraged to develop new technologies. In addition, listening to our customers needs and insights helps us discover and develop new and measurement methods on an ongoing basis, relentlessly pushing the limits of what is possible.
From humble beginnings in 1988, Focus has become the main supplier of advanced Load Pull and Noise Tuner Systems. Our mission is to provide effective, reliable and innovative solutions for non-50 Ohm testing (Noise and Load Pull) of RF microwave transistors, thus enabling our customers to compete in the marketplace with better designs and to advance the understanding and knowledge of the field.
Contact Details
Focus Microwaves Inc. Main Head Office
4555 Chem. du Bois-Franc, Saint-Laurent, QC H4S 1A8, Canada
Phone: +1-514-684-4554
Test & Measurement
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