Focus Microwaves - Noise Modules
Noise measurements allow the determination of the four Noise Parameters of a device (transistor). Focus’ Noise Modules integrate well with various third party noise receivers.
Noise Parameters: These are four numbers that fully describe the noise behaviour of an active or passive device (twoport) at a given frequency. For practical reasons we use the following quantities as Noise Parameters:
Focus’ noise parameter extraction routines leverage the PNA-X’s unique implementation
of the cold-source noise figure measurement technique. This specific technique requires a noise source to determine the kBG (gain-bandwidth constant) of the system and a passive mechanical tuner is used to characterize the noise receiver across both the impedance and frequency space. This step is imperative to obtain fully vector-source-corrected measurements.
of the cold-source noise figure measurement technique. This specific technique requires a noise source to determine the kBG (gain-bandwidth constant) of the system and a passive mechanical tuner is used to characterize the noise receiver across both the impedance and frequency space. This step is imperative to obtain fully vector-source-corrected measurements.
A RF down conversion stage might be required if the frequency of noise measured exceeds the receiver’s bandwidth. Focus offers noise modules which support down conversion for optimal speed and performance.
Hardware
Noise Measurement System
| Model | Frequency | Insertion Loss | VSWR | Min. Gain | Max. VSWR | Connector |
| NMS-2600 | up to 26.5 GHz | 0.80 dB | 1.61 | 29 for 0.8-26.5GHz | 1.8:1 | 3.5mm |
| NMS-4000 | up to 40 GHz | 0.91 dB | 1.81 | 30 for ≤26.5GHz, 29 for 26-40GHz | 2.1:1 | 2.9mm |
| NMS-5000 | up to 50 GHz | 0.99 dB | 1.8:1 |
27 for ≤26.5GHz, 27 for 26-40GHz, 28 for 40-50GHz |
2:1 | 2.4mm |
| NMS-6700 | up to 67 GHz | 1.12 dB | 1.91 |
29 for ≤26.5GHz, 28.5 for 26-40GHz, 28 for 40-50GHz, 21 for 50-65GHz |
3:1 | 1.85mm |
| NMS-6700-DC* | up to 67 GHz | 1.12 dB | 1.9:1 |
29 for ≤26.5GHz, 28.5 for 26-40GHz, 28 for 40-50GHz, 37 for 50-65GHz |
3:1 | 1.85 mm |
| NMS-75500-DC* | 50 to 75 GHz | 0.4dB | 1.2:1** | 40 for 50-75GHz | 1.6:1** | WR-15 |
| NMS-90600-DC* | 60 to 90 GHz | 0.9dB | 1.3:1** | 35 for 60-90GHz | 1.8:1** | WR-12 |
| NMS-110750-DC* | 75 to 110 GHz | 1.1dB | 1.3:1** | 36 for 75-110GHz | 1.9:1** | WR-10 |
| NMS-1701100-DC* | 110 to 170 GHz | 1.3dB | 1.4:1** | 36 for 110-170GHz | 2:1** | WR-6.5 |
* with Downconverter
** +/-10%
Graphs
Noise Parameters
Noise Circles & Stability Regions
Noise Parameters: Minimum Noise Figure / Rn / Gamma Opt / Phase of Gamma Opt
Setup
More Product Information
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Low running costs, less vibration, less noise, reduced maintenance
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Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
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CMN calibrated thermometry on MC plate
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Operation via touch panel controller: Remote operation via ethernet interface
Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
NoiseKen simulators to reproduce fast rise-up noises which are generated when switching ON / OFF electric current on the inductive load.
Since the pulse includes broadband frequency and its rise-up time is fast at 3ns or less, it can make the noise coupling dense and effective to reproduce the malfunctions of electronics equipment under the test.
It can realize performance evaluation of electronics equipment's upon reproduction of line noises which are intruded to the power supply lines or induced noises onto the telecommunication lines.
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Customizable sample space to fit the user’s application
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Long holding time: 100 hours for six (6) STP liter He-3 gas
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Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line; +/- 0.5 mK at base temperature
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Low noise
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Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-Noise Binning Mode
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Smear reduction
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Shading correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 32 dB)
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Auto exposure (39 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation, color correction
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Reverse X
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count)
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Storable user sets
- SOSA Aligned
- 3U VPX Form-Factor
- Reduced SWaP applications
- Ruggedization Level 200
- 11 Radial Clock Outputs OpenVPX Backplane support for 1000BASE-KX or 10GBASE-KR
- Optional Chip Scale Atomic Clock (CSAC) Holdover
- Optional Low Phase Noise (LPN) Analog output
- Optional secure GPS (M-code)
- Optional Timecode I/O
Brandywine’s RFS-700D is a miniaturized Rubidium Frequency Reference in a compact ruggedized package designed for mounting on a DIN rail system. The RFS-700D is capable of outputting 7x 10MHz frequency reference with low phase noise.
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Supports the latest 5G FR1 and IEEE 802.11ax standards
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up to 1GHz active load pull bandwidth capability
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Test the latest high bandwidth and high modulation cellular standards such as 1024QAM 802.11ax
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This system can be used in all parts of the design cycle
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Initial device characterisation
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MMIC or PA design
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Design verification testing
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Product testing in the factory
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- 5 MHz or 10 MHz Outputs Available
- Reference Frequency Input Option
- Auto Changeover with Ref. Input Option
- Low Phase Noise Outputs
- Twenty four Outputs
- Front Panel Status Indicators
- Fault Discrete Inputs
- Compact 1U, 19” rack mount
Focus Microwaves
Focus Microwaves is a pioneering engineering company, built around the innovations of its founder Dr. Christos Tsironis who developed his first manual tuner in 1973 and is the inventor of most existing electro-mechanical tuner families. The success of Focus is based on the engineering and manufacturing skills of its highly motivated and experienced team of engineers and technicians, who have been trained and encouraged to develop new technologies. In addition, listening to our customers needs and insights helps us discover and develop new and measurement methods on an ongoing basis, relentlessly pushing the limits of what is possible.
From humble beginnings in 1988, Focus has become the main supplier of advanced Load Pull and Noise Tuner Systems. Our mission is to provide effective, reliable and innovative solutions for non-50 Ohm testing (Noise and Load Pull) of RF microwave transistors, thus enabling our customers to compete in the marketplace with better designs and to advance the understanding and knowledge of the field.
Contact Details
Focus Microwaves Inc. Main Head Office
4555 Chem. du Bois-Franc, Saint-Laurent, QC H4S 1A8, Canada
Phone: +1-514-684-4554
Test & Measurement
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