Focus Microwaves - Noise Modules
Noise measurements allow the determination of the four Noise Parameters of a device (transistor). Focus’ Noise Modules integrate well with various third party noise receivers.
Noise Parameters: These are four numbers that fully describe the noise behaviour of an active or passive device (twoport) at a given frequency. For practical reasons we use the following quantities as Noise Parameters:
Focus’ noise parameter extraction routines leverage the PNA-X’s unique implementation
of the cold-source noise figure measurement technique. This specific technique requires a noise source to determine the kBG (gain-bandwidth constant) of the system and a passive mechanical tuner is used to characterize the noise receiver across both the impedance and frequency space. This step is imperative to obtain fully vector-source-corrected measurements.
of the cold-source noise figure measurement technique. This specific technique requires a noise source to determine the kBG (gain-bandwidth constant) of the system and a passive mechanical tuner is used to characterize the noise receiver across both the impedance and frequency space. This step is imperative to obtain fully vector-source-corrected measurements.
A RF down conversion stage might be required if the frequency of noise measured exceeds the receiver’s bandwidth. Focus offers noise modules which support down conversion for optimal speed and performance.
Hardware
Noise Measurement System
| Model | Frequency | Insertion Loss | VSWR | Min. Gain | Max. VSWR | Connector |
| NMS-2600 | up to 26.5 GHz | 0.80 dB | 1.61 | 29 for 0.8-26.5GHz | 1.8:1 | 3.5mm |
| NMS-4000 | up to 40 GHz | 0.91 dB | 1.81 | 30 for ≤26.5GHz, 29 for 26-40GHz | 2.1:1 | 2.9mm |
| NMS-5000 | up to 50 GHz | 0.99 dB | 1.8:1 |
27 for ≤26.5GHz, 27 for 26-40GHz, 28 for 40-50GHz |
2:1 | 2.4mm |
| NMS-6700 | up to 67 GHz | 1.12 dB | 1.91 |
29 for ≤26.5GHz, 28.5 for 26-40GHz, 28 for 40-50GHz, 21 for 50-65GHz |
3:1 | 1.85mm |
| NMS-6700-DC* | up to 67 GHz | 1.12 dB | 1.9:1 |
29 for ≤26.5GHz, 28.5 for 26-40GHz, 28 for 40-50GHz, 37 for 50-65GHz |
3:1 | 1.85 mm |
| NMS-75500-DC* | 50 to 75 GHz | 0.4dB | 1.2:1** | 40 for 50-75GHz | 1.6:1** | WR-15 |
| NMS-90600-DC* | 60 to 90 GHz | 0.9dB | 1.3:1** | 35 for 60-90GHz | 1.8:1** | WR-12 |
| NMS-110750-DC* | 75 to 110 GHz | 1.1dB | 1.3:1** | 36 for 75-110GHz | 1.9:1** | WR-10 |
| NMS-1701100-DC* | 110 to 170 GHz | 1.3dB | 1.4:1** | 36 for 110-170GHz | 2:1** | WR-6.5 |
* with Downconverter
** +/-10%
Graphs
Noise Parameters
Noise Circles & Stability Regions
Noise Parameters: Minimum Noise Figure / Rn / Gamma Opt / Phase of Gamma Opt
Setup
More Product Information
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (39 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
Scope of delivery
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Camera and IEEE 1394b cable (other configurations on request)
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Re-configurable for DC, RF, mmW, FA, WLR and more
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Thermal range: -60˚C to 300˚C available
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Upgrade path to meet your future needs
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Stable and repeatable measurements over a wide thermal range
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Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
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Advanced EMI-shielding with PureLine with AttoGuard technologies
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Best solution for low-noise and 1/f measurements
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Minimize AC and spectral noise
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Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range
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Locking roll-out stage
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Innovative microscope remote control
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Intuitive ergonomic stage controls
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Quick, safe, and comfortable wafer access
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Easy on-wafer navigation
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Fast setup and test data gathering
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Dedicated Velox version for manual probe stations
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AugmentedAlign tool with on screen markers for improved RF measurement accuracy
- IEC 61000-4-4 Ed.3 standard compliance.
- Pre-check function is installed. Inspection before testing is now easy.
- Normal mode test support. Taking account of field troubles is possible. (option)
- Utilize an outlet box that simplifies EUT connection. (option)
- Compared with conventional products, the size has become compact. (Approximately 67% by volume)
- Easy to understand Panel display reduces mistakes in connecting power cables.
- Software control with Windows. (option)
- Next calibration date can be notified. (Windows software only)
- Employ LCD screen with multi-language support and enhanced operability.
- Maximum output voltage of 5 kV and maximum pulse frequency of 2 MHz allow you to test above the standard test level.
- CDN capacity is increased to single phase type AC 240 V 20 A, single and three phase type to AC 600 V 63 A, supporting wider range of EUT.
- Large capacity CDN (100 A or 150 A) option available for Injection test on various EUT.
- Using coupling clamps, EMS probe kits, you can test the signal lines and evaluate the noise immunity on the PCB. (option)
- A real-time diagnostic tool supports EMC/EMI debugging.
- Fast visualize EMC/EMI problems.
- Enables easy comparison of countermeasures before and after.
- Capable of measurement from entire products to single components.
- Factor-editor function provides correction of antenna characteristics, cable loss and preamplifier.
- User friendly compact design.
- Customer supplied spectrum and probes acceptable (Please consult)
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Provides an effectively noise free environment around the device under test (DUT)
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World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
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Up to 4x faster flicker noise thermal testing on 30 μm pads
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Provides dark and dry environment for measuring light sensitive transistors, and devices at negative temperatures (<= -60°C) with frost free operation
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Provides fully managed and filtered AC power to the entire system – prober and instruments
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Filters harmful noise generated by external thermal control systems
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Reduced “antenna effect” injection of unwanted RF noise into the measurement path
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Provide up to 100dB attenuation (50Hz to 80Mhz) with 100mA max DC current handling
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Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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User-centered design minimizes training costs and enhances efficiency
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
See more Key Features on Specifications & Details tab
- High power density / low ripple and noise
- High programming resolution with Ethernet interface
- Constant voltage and current mode
- Remote sensing
- Isolated analog control and monitoring (optional)
- Up to 4 GHz Bandwidth
- ±60 V Offset Capability
- ±800 mV Dynamic Range
- 50 kΩ DC Input Impedance
- 1.2x Attenuation for low additive noise
- MCX terminated cable with wide variety of connections:
- Solder-in (4 GHz)
- Coaxial Cable to U.FL receptacle (3 GHz)
- MCX PCB Mount (4 GHz)
- Browser (500 MHz)
- ProBus Interface
Bias tees with a perfect balance of RF performance and DC power handling
Auriga’s Bias Tees balance impressive RF performance with heavy-duty power handling across multiple frequency bands ranging from 100 MHz to 67 GHz. They are designed for rigorous usage without sacrificing RF performance. Only the highest-quality materials are used to minimize signal loss and enable efficient heat removal.
- High Power Density: Up to 15 kW in 3U, 30 kW in a 6U chassis
- Wide Voltage Range: 0-10V up to 0-1000V, from 4 to 30 kW
- Fast Load Transient Response: Protection from undesired voltage excursions
- Low Ripple and Noise
- Intuitive Touch Screen Display
- Parallelable up to 150 kW
- Sequencing: Free system controller & speed up test
- Low audible noise: Temperature controlled variable speed fans
Focus Microwaves
Focus Microwaves is a pioneering engineering company, built around the innovations of its founder Dr. Christos Tsironis who developed his first manual tuner in 1973 and is the inventor of most existing electro-mechanical tuner families. The success of Focus is based on the engineering and manufacturing skills of its highly motivated and experienced team of engineers and technicians, who have been trained and encouraged to develop new technologies. In addition, listening to our customers needs and insights helps us discover and develop new and measurement methods on an ongoing basis, relentlessly pushing the limits of what is possible.
From humble beginnings in 1988, Focus has become the main supplier of advanced Load Pull and Noise Tuner Systems. Our mission is to provide effective, reliable and innovative solutions for non-50 Ohm testing (Noise and Load Pull) of RF microwave transistors, thus enabling our customers to compete in the marketplace with better designs and to advance the understanding and knowledge of the field.
Contact Details
Focus Microwaves Inc. Main Head Office
4555 Chem. du Bois-Franc, Saint-Laurent, QC H4S 1A8, Canada
Phone: +1-514-684-4554
Test & Measurement
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