Integrated subsystem test  SAS, BSS, Umbilical systems  AC Input isolation  Power Validation Fixtures  Redundant OV & OI

Near Linear Power Supply  Modular  ≥0.95 PFC  Digital control loop technology  High Power Density (3.5 watts/cubic inch)  “Virtual Assets” by:  Series operation  Parallel operation  Combined operation with loads  Simple integration

High Voltage (500V) Input  Digital control loop technology  Two models: 375W & 750W  Up to 750W/500V  Parallel up to 8 automatically  Modular  High Power Density  Simple integration

High Power Density (2 VA/cubic inch)  Single or multi-phase output  Parallel operation  4.8 Crest factor  Digital control loop technology  ≥0.95 PFC  Brown-out simulation  AC 875 VA  45 to 5000 Hz  Universal AC/DC input via mainframe  User configurable  Simple integration

Modular  Control up to 95 assets  Control multiple AC and DC power supplies and loads in one mainframe  Create “virtual assets”  Web browser control  User configurable  Highest Power Density  Simple integration  PFC  Universal AC/DC input  Up to 6kW in one mainframe  1kW DC modules  PFC ≥0.95  Reduced space and logistics hassles  High power density  Handles DC and AC power and load modules  User configurable  Universal AC/DC input  Ease of integration  Web browser control 

10/100 base-T Ethernet connectivity  Digital control loop technology  IVI compliant drivers  Web browser control  Controls up to 95 assets  Supports VXI II Discovery  Modular

Spin mode is a dynamic mode intended to provide a simulation of a spinning satellite.  Enhanced Eclipse mode is a dynamic mode that allows the user to easily program and initiate an eclipse event with total control over all of the V-I curve parameters and dwell times.  Operates with Sequential Shunt Regulators and Maximum Power Point Trackers  Multiple redundant OVP/OIP layers

Fluke 5075603,  FLK-II900 Sonic Industrial Imager Includes Hard Shell Carrying Case and Neck Strap

The PHD1200 and PHD2000, with advanced pulser-circuit technology, offer unmatched speed, accuracy, and resolution for precise dynamic on-resistance measurement of transistors. Paired with the AU-5 Pulsed IV/RF System, this compact solution delivers exceptional performance.

Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.

3 Measurement States; Quiescent (OFF-State), Non Quiescent (ON-State), and Pre-State The Pre State is a short high voltage state used to activate the traps in the semiconductor. Adjustable delay (Δt) between the Pre state and Non Quiescent state down to 0s. Independently adjustable timing settings for the Three-state gate pulser and drain pulser Easy Integration into existing mainframes

Unlock precise nonlinear transistor behavior representation with our Cardiff Model portfolio. Improve accuracy across a wide impedance space effortlessly.